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Euroanalysis 14: the European Conference on Analytical Chemistry”. Janssens K, van Espen P, Van 't dack L, Analytical and bioanalytical chemistry 391, 1107 (2008). http://doi.org/10.1007/S00216-008-2114-9
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Introduction and overview”. Janssens K, Van Grieken R page 1 (2004).
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Non-destructive micoranalysis of cultural heritage materials”. Janssens K, Van Grieken R page 800 p. (2004).
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Preface”. Janssens K, Van Grieken R page xxvii-xxviii (2004).
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Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens K, van Langevelde F, Adams F, Vis R, Sutton S, Rivers M, Jones K, Bowen D, (1992)
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Increased accuracy in the automated interpretation of large epma data sets by the use of an expert system”. Janssens K, Vanborm W, van Espen P, Journal of research of the National Bureau of Standards (1934) 93, 260 (1988). http://doi.org/10.6028/JRES.093.037
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Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting”. Janssens K, Vekemans B, Adams F, van Espen P, Mutsaers P, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 –, 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy 109, 179 (1996). http://doi.org/10.1016/0168-583X(95)01211-7
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A laboratory mu-XRF spectrometer employing capillary optics”. Janssens K, Vekemans B, Rindby A, Vincze L, Adams F, , 159 (1995)
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Estimation of relative Fe2+ and Fe3+ contents of original manuscript fragments by means of μ-XANES and Mössbauer spectrometry”. Janssens K, Vekemans B, Rouchon-Quillet V (2005).
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A micro XRF spectrometer based on rotating anode generator and capillary optics”. Janssens K, Vekemans B, Vincze L, Adams F, Rindby A, Spectrochimica acta: part B : atomic spectroscopy 51, 1661 (1996)
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Synchrotron radiation-induced X-ray microanalysis”. Janssens K, Vincze L, Adams F, Jones KW, Analytica chimica acta 283, 98 (1993). http://doi.org/10.1016/0003-2670(93)85213-4
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Microscopic synchroton radiation induced X-ray fluorescence analysis”. Janssens K, Vincze L, Aerts A, Vekemans B, Adams F, Jones K, Knöchel A, Mikrochimica acta: supplementum , 87 (1996)
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Microscopic X-ray fluorescence analysis”. Janssens K, Vincze L, Rubio J, Bernasconi G, Adams F, Journal of analytical atomic spectrometry 9, 151 (1994). http://doi.org/10.1039/JA9940900151
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Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers”. Janssens K, Vincze L, van Espen P, Adams F, X-ray spectrometry 22, 234 (1993). http://doi.org/10.1002/XRS.1300220412
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Evaluation and calibration of micro-XRF data”. Janssens K, Vincze L, Vekemans B page 155 (2000).
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The use of lead-glass capillaries for microfocusing of highly energetic (0-60 KeV) synchrotron radiation”. Janssens K, Vincze L, Vekemans B, Adams F, Haller M, Knöchel A, Journal of analytical atomic spectrometry 13, 339 (1998). http://doi.org/10.1039/A707700I
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Synchrotron radiation induced X-ray microfluorescence analysis”. Janssens K, Vincze L, Vekemans B, Aerts A, Adams F, Jones KW, Knöchel A, Microchimica acta T2 –, 4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Microbeam Analysis, MAY, 1995, ST MALO, FRANCE , 87 (1996)
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The non-destructive determination of REE in fossilized bone using synchrotron radiation induced K-line X-ray microfluorescence analysis”. Janssens K, Vincze L, Vekemans B, Williams CT, Radtke M, Haller M, Knöchel A, Fresenius' journal of analytical chemistry 363, 413 (1999). http://doi.org/10.1007/S002160051212
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Feasibility of (trace-level) micro-XANES at Beamline L”. Janssens K, Vincze L, Wei F, Proost K, Vekemans B, Vittiglio G, Yan Y, Falkenberg G (1999).
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Use of microscopic XRF for non-destructive analysis in art an archaeometry”. Janssens K, Vittiglio G, Deraedt I, Aerts A, Vekemans B, Vincze L, Wei F, de Ryck I, Schalm O, Adams F, Rindby A, Knöchel A, Simionovici AS, Snigirev A, X-ray spectrometry 29, 73 (2000). http://doi.org/10.1002/(SICI)1097-4539(200001/02)29:1<73::AID-XRS416>3.3.CO;2-D
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Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens KH, Adams FC, van Langevelde F, Vis RD, Jones KW, Rivers M, Sutton S, Advances in X-ray analysis 35, 1265 (1992)
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Composition of 15-17th century archaeological glass vessels excavated in Antwerp, Belgium”. Janssens KH, Deraedt I, Schalm O, Veeckman J, Mikrochimica acta: supplementum 15, 253 (1998)
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Janssens KHA, Adams FCV, Rindby A (2000) Microscopic X-ray fluorescence analysis. 419 p
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Effect of strain on the magnetoexciton ground state in InP/GaxIn1-xP quantum disks”. Janssens KL, Partoens B, Peeters FM, Physical review : B : condensed matter and materials physics 67, 235325 (2003). http://doi.org/10.1103/PhysRevB.67.235325
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Influence of strain on the magneto-exciton in single and coupled InP/GaInP quantum disks”. Janssens KL, Partoens B, Peeters FM, Physica. E: Low-dimensional systems and nanostructures 21, 349 (2004). http://doi.org/10.1016/j.physe.2003.11.269
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Magneto-exciton in single and coupled type II quantum dots”. Janssens KL, Partoens B, Peeters FM, Physica status solidi: A: applied research 190, 571 (2002). http://doi.org/10.1002/1521-396X(200204)190:2<571::AID-PSSA571>3.0.CO;2-K
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Magneto-excitons in planar type II quantum dots”. Janssens KL, Partoens B, Peeters FM, Physical review : B : condensed matter and materials physics 64 (2001). http://doi.org/10.1103/PhysRevB.64.155324
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Magnetoexciton in vertically coupled InP/GaInP quantum disks: effect of strain on the exciton ground state”. Janssens KL, Partoens B, Peeters FM, Physical review : B : condensed matter and materials physics 69, 235320 (2004). http://doi.org/10.1103/PhysRevB.69.235320
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Single and coupled type II quantum dots in magnetic and electric fields”. Janssens KL, Partoens B, Peeters FM, Physicalia magazine 24, 211 (2002)
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Single and vertically coupled type-II quantum dots in a perpendicular magnetic field: exciton ground-state properties”. Janssens KL, Partoens B, Peeters FM, Physical review : B : condensed matter and materials physics 66, 075314 (2002). http://doi.org/10.1103/PhysRevB.66.075314
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