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Author Janssens, K.; Vekemans, B.; Adams, F.; van Espen, P.; Mutsaers, P. doi  openurl
  Title Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting Type A1 Journal article
  Year (down) 1996 Publication Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 – 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy Abbreviated Journal 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY  
  Volume 109 Issue Pages 179-185  
  Keywords A1 Journal article; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract The integration of the nonlinear least squares X-ray spectrum evaluation progam AXIL. into a mu-PIXE and a mu-XRF setup is discussed. The use of the software when procesing data sets derived from biological and geological samples is described.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos A1996UV44400035 Publication Date 2002-07-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-583x ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:95887 Serial 5457  
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