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	Author	Janssens, K.H.; Adams, F.C.; van Langevelde, F.; Vis, R.D.; Jones, K.W.; Rivers, M.; Sutton, S.
	Title	Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis			Type	A3 Journal article
	Year	1992	Publication	Advances in X-ray analysis	Abbreviated Journal
	Volume	35	Issue		Pages	1265-1273
	Keywords	A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language		Wos		Publication Date
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0376-0308	ISBN		Additional Links	UA library record
	Impact Factor		Times cited		Open Access
	Notes				Approved	no
	Call Number	UA @ admin @ c:irua:2811			Serial	5530
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