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Author |
Janssens, K.; Vincze, L.; Vekemans, B.; Aerts, A.; Adams, F.; Jones, K.W.; Knöchel, A. |
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Title |
Synchrotron radiation induced X-ray microfluorescence analysis |
Type |
A1 Journal article |
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Year  |
1996 |
Publication |
Microchimica acta
T2 – 4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Microbeam Analysis, MAY, 1995, ST MALO, FRANCE |
Abbreviated Journal |
4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Micro |
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Issue |
s:[13] |
Pages |
87-115 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
mu-XRF is the microscopic equivalent of the well-established multielement analytical technique. In this paper, after comparing the interaction of X-ray photons, electrons and protons with matter and an introduction to synchrotron rings and microfocussing of X-rays, the instrumentation for mu-XRF is discussed, both for laboratory source and synchrotron based setups and the analytical characteristics of mu-XRF are contrasted to that of other microanalytical techniques, Also, this issue of quantification of mu-XRF data is addressed; the applicability of the method in archeological and geological analysis is illustrated. |
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A1996VT82300006 |
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UA library record; WoS full record; WoS citing articles |
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no |
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Call Number |
UA @ admin @ c:irua:104410 |
Serial |
5866 |
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