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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
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Jain, N.; Hao, Y.; Parekh, U.; Kaltenegger, M.; Pedrazo-Tardajos, A.; Lazzaroni, R.; Resel, R.; Geerts, Y.H.; Bals, S.; Van Aert, S. |
Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals |
2023 |
Micron |
169 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De Meyer, R.; Albrecht, W.; Bals, S. |
Effectiveness of reducing the influence of CTAB at the surface of metal nanoparticles during in situ heating studies by TEM |
2021 |
Micron |
144 |
|
UA library record; WoS full record |
|
|
|
Godet, M.; Vergès-Belmin, V.; Gauquelin, N.; Saheb, M.; Monnier, J.; Leroy, E.; Bourgon, J.; Verbeeck, J.; Andraud, C. |
Nanoscale investigation by TEM and STEM-EELS of the laser induced yellowing |
2018 |
Micron |
115 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Samaeeaghmiyoni, V.; Idrissi, H.; Groten, J.; Schwaiger, R.; Schryvers, D. |
Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach |
2017 |
Micron |
94 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. |
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope |
2016 |
Micron |
80 |
50 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Béché, A.; Winkler, R.; Plank, H.; Hofer, F.; Verbeeck, J. |
Focused electron beam induced deposition as a tool to create electron vortices |
2015 |
Micron |
80 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Dyck, D.; Lobato, I.; Chen, F.-R.; Kisielowski, C. |
Do you believe that atoms stay in place when you observe them in HREM? |
2015 |
Micron |
68 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Kirilenko, D.A.; Dideykin, A.T.; Aleksenskiy, A.E.; Sitnikova, A.A.; Konnikov, S.G.; Vul', A.Y. |
One-step synthesis of a suspended ultrathin graphene oxide film: Application in transmission electron microscopy |
2015 |
Micron |
68 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
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Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. |
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images |
2014 |
Micron |
63 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
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Xu, Q.; Zandbergen, H.W.; van Dyck, D. |
Imaging from atomic structure to electronic structure |
2012 |
Micron |
43 |
|
UA library record; WoS full record |
|
|
|
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. |
Model-based electron microscopy : from images toward precise numbers for unknown structure parameters |
2012 |
Micron |
43 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Leroux, O.; Leroux, F.; Bagniewska-Zadworna,.; Knox, J.P.; Claeys, M.; Bals, S.; Viane, R.L.L. |
Ultrastructure and composition of cell wall appositions in the roots of Asplenium (Polypodiales) |
2011 |
Micron |
42 |
20 |
UA library record; WoS full record; WoS citing articles |
|
|
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Felten, A.; Ghijsen, J.; Pireaux, J.-J.; Drube, W.; Johnson, R.L.; Liang, D.; Hecq, M.; Van Tendeloo, G.; Bittencourt, C. |
Electronic structure of Pd nanoparticles on carbon nanotubes |
2009 |
Micron |
40 |
44 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Ruelle, B.; Felten, A.; Ghijsen, J.; Drube, W.; Johnson, R.L.; Liang, D.; Erni, R.; Van Tendeloo, G.; Sophie, P.; Dubois, P.; Godfroid, T.; Hecq, M.; Bittencourt, C.; |
Functionalization of MWCNTs with atomic nitrogen |
2009 |
Micron |
40 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bertoni, G.; Calmels, L. |
First-principles calculation of the electronic structure and energy loss near edge spectra of chiral carbon nanotubes |
2006 |
Micron |
37 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Yang, Z.; Schryvers, D. |
Study of changes in composition and EELS ionization edges upon Ni4Ti3 precipitation in a NiTi alloy |
2006 |
Micron |
37 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D. |
How to optimize the experimental design of quantitative atomic resolution TEM experiments? |
2004 |
Micron |
35 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Analytical electron microscopy of silver halide photographic systems |
2000 |
Micron |
31 |
8 |
UA library record; WoS full record; WoS citing articles |
|
