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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Fatermans, J.; den Dekker, Aj.; Müller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. Atom column detection from simultaneously acquired ABF and ADF STEM images 2020 Ultramicroscopy 219 9 UA library record; WoS full record; WoS citing articles url doi
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