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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Vijayakumar, J.; Savchenko, T.M.; Bracher, D.M.; Lumbeeck, G.; Béché, A.; Verbeeck, J.; Vajda, Š.; Nolting, F.; Vaz, Ca.f.; Kleibert, A. |
Absence of a pressure gap and atomistic mechanism of the oxidation of pure Co nanoparticles |
2023 |
Nature communications |
14 |
1 |
UA library record; WoS full record; WoS citing articles |
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Poulain, R.; Lumbeeck, G.; Hunka, J.; Proost, J.; Savolainen, H.; Idrissi, H.; Schryvers, D.; Gauquelin, N.; Klein, A. |
Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism |
2022 |
ACS applied electronic materials |
4 |
|
UA library record; WoS full record; WoS citing articles |
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Lumbeeck, G.; Delvaux, A.; Idrissi, H.; Proost, J.; Schryvers, D. |
Analysis of internal stress build-up during deposition of nanocrystalline Ni thin films using transmission electron microscopy |
2020 |
Thin solid films : an international journal on the science and technology of thin and thick films |
707 |
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UA library record; WoS full record; WoS citing articles |
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Delvaux, A.; Lumbeeck, G.; Idrissi, H.; Proost, J. |
Effect of microstructure and internal stress on hydrogen absorption into Ni thin film electrodes during alkaline water electrolysis |
2020 |
Electrochimica Acta |
340 |
2 |
UA library record; WoS full record; WoS citing articles |
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Idrissi, H.; Samaee, V.; Lumbeeck, G.; Werf, T.; Pardoen, T.; Schryvers, D.; Cordier, P. |
In Situ Quantitative Tensile Testing of Antigorite in a Transmission Electron Microscope |
2020 |
Journal Of Geophysical Research-Solid Earth |
125 |
|
UA library record; WoS full record; WoS citing articles |
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Ding, L.; Raskin, J.-P.; Lumbeeck, G.; Schryvers, D.; Idrissi, H. |
TEM investigation of the role of the polycrystalline-silicon film/substrate interface in high quality radio frequency silicon substrates |
2020 |
Materials Characterization |
161 |
|
UA library record; WoS full record; WoS citing articles |
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Tran Phong Le, P.; Hofhuis, K.; Rana, A.; Huijben, M.; Hilgenkamp, H.; Rijnders, G.A.J.H.M.; ten Elshof, J.E.; Koster, G.; Gauquelin, N.; Lumbeeck, G.; Schuessler-Langeheine, C.; Popescu, H.; Fortuna, F.; Smit, S.; Verbeek, X.H.; Araizi-Kanoutas, G.; Mishra, S.; Vaskivskyi, I.; Duerr, H.A.; Golden, M.S. |
Tailoring vanadium dioxide film orientation using nanosheets : a combined microscopy, diffraction, transport, and soft X-ray in transmission study |
2020 |
Advanced Functional Materials |
30 |
1 |
UA library record; WoS full record; WoS citing articles |
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Retuerto, M.; Calle-Vallejo, F.; Pascual, L.; Lumbeeck, G.; Fernandez-Diaz, M.T.; Croft, M.; Gopalakrishnan, J.; Pena, M.A.; Hadermann, J.; Greenblatt, M.; Rojas, S. |
La1.5Sr0.5NiMn0.5Ru0.5O6 double perovskite with enhanced ORR/OER bifunctional catalytic activity |
2019 |
ACS applied materials and interfaces |
11 |
12 |
UA library record; WoS full record; WoS citing articles |
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Lumbeeck, G. |
Mechanisms of nano-plasticity in as-deposited and hydrided nanocrystalline Pd and Ni thin films |
2019 |
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UA library record |
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Idrissi, H.; Samaee, V.; Lumbeeck, G.; van der Werf, T.; Pardoen, T.; Schryvers, D.; Cordier, P. |
Supporting data for “In situ Quantitative Tensile Tests on Antigorite in a Transmission Electron Microscope” |
2019 |
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UA library record |
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Lumbeeck, G.; Idrissi, H.; Amin-Ahmadi, B.; Favache, A.; Delmelle, R.; Samaee, V.; Proost, J.; Pardoen, T.; Schryvers, D. |
Effect of hydriding induced defects on the small-scale plasticity mechanisms in nanocrystalline palladium thin films |
2018 |
Journal Of Applied Physics |
124 |
2 |
UA library record; WoS full record; WoS citing articles |
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Guzzinati, G.; Altantzis, T.; Batuk, M.; De Backer, A.; Lumbeeck, G.; Samaee, V.; Batuk, D.; Idrissi, H.; Hadermann, J.; Van Aert, S.; Schryvers, D.; Verbeeck, J.; Bals, S. |
Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp |
2018 |
Materials |
11 |
15 |
UA library record; WoS full record; WoS citing articles |
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