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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. |
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals |
2003 |
Applied surface science |
203/204 |
7 |
UA library record; WoS full record; WoS citing articles |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
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Lenaerts, J.; Verlinden, G.; Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS) |
2001 |
Fresenius' journal of analytical chemistry |
370 |
3 |
UA library record; WoS full record; WoS citing articles |
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Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I.; Callant, P. |
Exchange of fluorinated cyanine dyes between different types of silver halide microcrystals studied by imaging time-of-flight secondary ion mass spectrometry |
2001 |
Langmuir |
17 |
8 |
UA library record; WoS full record; WoS citing articles |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Photographic materials |
2001 |
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UA library record |
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Charlier, E.; van Doorselaer, M.; Gijbels, R.; de Keyzer, R.; Geuens, I. |
Unveiling the composition of sulphur sensitization specks by their interactions with TAI |
2000 |
Journal Of Imaging Science And Technology |
44 |
16 |
UA library record; WoS full record; WoS citing articles |
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Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates |
2000 |
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UA library record |
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Lenaerts, J.; Verlinden, G.; Gijbels, R.; Geuens, I.; Callant, P. |
The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS) |
2000 |
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UA library record; WoS full record; |
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Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
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UA library record; WoS full record; |
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1999 |
Journal of analytical atomic spectrometry |
14 |
10 |
UA library record; WoS full record; WoS citing articles |
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de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. |
Characterization of AgxAuy nano particles by TEM and STEM |
1999 |
Journal of analytical atomic spectrometry |
14 |
2 |
UA library record; WoS full record; WoS citing articles |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals |
1999 |
Journal of the American Society for Mass Spectrometry |
10 |
4 |
UA library record; WoS full record; WoS citing articles |
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Gregory, C.L.; Nullens, H.A.; Gijbels, R.H.; van Espen, P.J.; Geuens, I.; de Keyzer, R. |
Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions |
1998 |
Analytical chemistry |
70 |
12 |
UA library record; WoS full record; WoS citing articles |
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1998 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
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UA library record |
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de Vyt, A.; Gijbels, R.; van Roost, C.; Geuens, I. |
Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1 |
1998 |
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UA library record |
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Vanwelkenhuysen, I.; Gijbels, R.; Geuens, I. |
Influence of the temperature on the morphology of silver behenate microcrystals |
1998 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. |
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals |
1998 |
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UA library record |
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Verlinden, G.; Janssens, G.; Gijbels, R.; van Espen, P.; Geuens, I. |
Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis |
1997 |
Analytical chemistry |
69 |
6 |
UA library record; WoS full record; WoS citing articles |
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Verlinden, G.; Gijbels, R.; Brox, O.; Benninghoven, A.; Geuens, I.; de Keyzer, R. |
Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1997 |
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UA library record; WoS full record; |
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Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. |
Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy |
1997 |
Journal of microscopy |
188 |
6 |
UA library record; WoS full record; WoS citing articles |
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Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
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UA library record |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. |
A temperature study of mixed AgBr-AgBrI tabular crystals |
1995 |
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3 |
UA library record; WoS full record; WoS citing articles |
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Geuens, I.; Gijbels, R.; Dekeyzer, R.; Verbeeck, A. |
Micro and surface analysis of individual silver halide microcrystals using a scanning ion microprobe |
1994 |
Papers |
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UA library record; WoS full record; |
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
The chemical characterization of silver halide microcrystals |
1993 |
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UA library record |
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Geuens, I.; Nys, B.; Gijbels, R.; Jacob, W. |
Application of neural networks in image analysis: the classification of geometrical shapes |
1993 |
CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology |
10 |
|
UA library record |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. |
A temperature study of mixed AgBr-AgBrI tabular crystals |
1992 |
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UA library record |
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Depth profiling of silver halide microcrystals |
1992 |
|
|
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UA library record |
|
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Geuens, I.; Gijbels, R.; Jacob, W.A.; Verbeeck, A.; de Keyzer, R. |
Analysis of silver halide microcrystals using different modes of a scanning transmission electron microscope and digital image processing |
1992 |
The journal of imaging science and technology |
36 |
10 |
UA library record; WoS full record; WoS citing articles |
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