Records |
Author |
Pauwels, B.; Yandouzi, M.; Schryvers, D.; Van Tendeloo, G.; Verschoren, G.; Lievens, P.; Hou, M.; van Swygenhoven, H. |
Title |
Atomic scale characterization of supported and assembled nanoparticles |
Type |
P3 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
|
Issue |
|
Pages |
B8.3,1-6 |
Keywords |
P3 Proceeding; Electron microscopy for materials research (EMAT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
s.l. |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:48390 |
Serial |
181 |
Permanent link to this record |
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Author |
Zhurkin, E.; Hou, M.; van Swygenhoven, H.; Pauwels, B.; Yandouzi, M.; Schryvers, D.; Van Tendeloo, G.; Lievens, P.; Verschoren, G.; Kuriplach, J.; van Peteghem, S.; Segers, D.; Dauwe, C. |
Title |
Atomic scale modeling of supported and assembled nanoparticles |
Type |
P3 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
|
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
|
Issue |
|
Pages |
B8.2,1-6 |
Keywords |
P3 Proceeding; Electron microscopy for materials research (EMAT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
s.l. |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:48391 |
Serial |
186 |
Permanent link to this record |
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Author |
Biró, L.P.; Khanh, N.Q.; Horváth, Z.E.; Vértesy, Z.; Kocsonya, A.; Konya, Z.; Osváth, Z.; Koós, A.; Guylai, J.; Zhang, X.B.; Van Tendeloo, G.; Fonseca, A.; Nagy, J.B. |
Title |
Catalyst traces after chemical purification in CVD grown carbon nanotubes |
Type |
P3 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
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Issue |
|
Pages |
183-186 |
Keywords |
P3 Proceeding; Electron microscopy for materials research (EMAT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
AIP Conference Proceedings |
Place of Publication |
s.l. |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:54778 |
Serial |
288 |
Permanent link to this record |
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Author |
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K. |
Title |
Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation |
Type |
A1 Journal article |
Year |
2001 |
Publication |
Institute of physics conference series |
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
|
Issue |
169 |
Pages |
481-484 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
With further down-scaling below 0.25mum technologies, CoSi2 is replacing TiSi2 because of its superior formation chemistry on narrow lines and favourable stress behaviour. Shallow trench isolation (STI) is used as the isolation technique in these technologies. In this study, convergent beam electron diffraction (CBED) measurements and finite element modelling (FEM) are performed to evaluate the local stress components in the silicon substrate, induced in STI structures with a 45 nm or a 85 nm CoSi2 silicidation. High compressive stresses in the active area and tensile stress around the trench corners are observed. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0-7503-0818-4 |
ISBN |
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Additional Links |
UA library record; WoS full record; |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:95163 |
Serial |
311 |
Permanent link to this record |
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|
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Author |
Kato, H.; Peeters, F.M. |
Title |
Correlation between a remote electron and a two-dimensional electron gas in resonant tunneling devices |
Type |
P3 Proceeding |
Year |
2001 |
Publication |
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Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
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Issue |
|
Pages |
843-844 |
Keywords |
P3 Proceeding; Condensed Matter Theory (CMT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record; WoS full record; |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:37298 |
Serial |
521 |
Permanent link to this record |
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|
|
Author |
Partoens, B.; Peeters, F.M. |
Title |
Density functional theory approach to artificial molecules |
Type |
P1 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
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Issue |
|
Pages |
128-141 |
Keywords |
P1 Proceeding; Condensed Matter Theory (CMT) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
New York |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
|
ISBN |
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Additional Links |
UA library record; WoS full record; |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:37300 |
Serial |
636 |
Permanent link to this record |
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|
Author |
Hens, S.; Bender, H.; Donaton, R.A.; Maex, K.; Vanhaelemeersch, S.; van Landuyt, J. |
Title |
EFTEM study of plasma etched low-k Si-O-C dielectrics |
Type |
A1 Journal article |
Year |
2001 |
Publication |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND |
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
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Issue |
169 |
Pages |
415-418 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
Materials with low dielectric constant ("low-k'') in combination with Cu metallization are replacing the oxide based dielectrics with Al metallization in future generations of micro-electronic devices. In this work, a carbon doped oxide low-k dielectric material is studied after different kinds of etch/strip steps in single damascene Cu. filled line structures. Interline capacitance measurements indicate a dependence of the dielectric constant on the strip conditions. EFTEM is used to study the composition of the dielectric material and the modification of the low-k material at the sidewall of the etched structures for the various treatment conditions. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0-7503-0818-4; 0951-3248 |
ISBN |
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Additional Links |
UA library record; WoS full record; |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:103432 |
Serial |
877 |
Permanent link to this record |
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|
|
Author |
Partoens, B.; Peeters, F.M. |
Title |
Enhanced spin and isospin blockade in two vertically coupled quantum dots |
Type |
P1 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
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Issue |
|
Pages |
1035-1036 |
Keywords |
P1 Proceeding; Condensed Matter Theory (CMT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record; WoS full record; |
Impact Factor |
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Times cited |
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Open Access |
|
Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:37297 |
Serial |
1054 |
Permanent link to this record |
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|
|
Author |
Bruno-Alfonso, A.; Hai, G.-Q.; Peeters, F.M.; Yeo, T.; Ryu, S.R.; McCombe, B.D. |
Title |
High energy transitions and phonon-assisted harmonics of a shallow magneto-donor in GaAs/AlGaAs multiple quantum wells |
Type |
P1 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
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Issue |
|
Pages |
1413-1414 |
Keywords |
P1 Proceeding; Condensed Matter Theory (CMT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record; WoS full record; |
Impact Factor |
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Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:37296 |
Serial |
1425 |
Permanent link to this record |
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|
|
Author |
Nistor, L.; Bender, H.; van Landuyt, J.; Nemeth, S.; Boeve, H.; De Boeck, J.; Borghs, G. |
Title |
HREM investigation of a Fe/GaN/Fe tunnel junction |
Type |
A1 Journal article |
Year |
2001 |
Publication |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England |
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
|
Issue |
169 |
Pages |
53-56 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
The structure of Fe/GaN/Fe ferromagnetic electrodes is studied by high resolution transmission electron microscopy. The layers grow epitaxially on the GaAs substrate with the top Fe layer 90degrees rotated compared to the bottom one. The interfaces are quite rough. There is an indication of the possible occurrence of Fe3GaAs formation on the GaAs interface. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
IOP Publishing |
Place of Publication |
Bristol |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
|
ISSN |
0-7503-0818-4 |
ISBN |
|
Additional Links |
UA library record; WoS full record; |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:95715 |
Serial |
1503 |
Permanent link to this record |
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|
|
Author |
Cenian, A.; Chernukho, A.; Leys, C.; Bogaerts, A. |
Title |
Interactions between DC plasma and HF fields |
Type |
P3 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
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Issue |
|
Pages |
389-392 |
Keywords |
P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
s.l. |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
|
ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:34142 |
Serial |
1685 |
Permanent link to this record |
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Author |
Nagy, J.B.; Fonseca, A.; Pierard, N.; Willems, I.; Bister, G.; Pirlot, C.; Demortier, A.; Delhalle, J.; Mekhalif, Z.; Niesz, K.; Bossuot, C.; Pirard, J.-P.; Biró, L.P.; Konya, Z.; Colomer, J.-F.; Van Tendeloo, G.; Kiricsi, I. |
Title |
Large scale synthesis of carbon nanotubes and their composite materials |
Type |
P3 Proceeding |
Year |
2001 |
Publication |
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Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
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Issue |
|
Pages |
|
Keywords |
P3 Proceeding; Electron microscopy for materials research (EMAT) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
AIP Conference Proceedings |
Place of Publication |
s.l. |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:54839 |
Serial |
1781 |
Permanent link to this record |
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|
|
Author |
Freire, J.A.K.; Peeters, F.M.; Matulis, A.; Freire, V.N.; Farias, G.A. |
Title |
Magnetic traps for excitons in GaAs/AlxGa1-xAs quantum wells |
Type |
P1 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
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Issue |
|
Pages |
503-504 |
Keywords |
P1 Proceeding; Condensed Matter Theory (CMT) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
|
ISBN |
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Additional Links |
UA library record; WoS full record; |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:37299 |
Serial |
1890 |
Permanent link to this record |
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|
|
Author |
Verlinden, G.; Gijbels, R.; Geuens, I. |
Title |
Photographic materials |
Type |
H3 Book chapter |
Year |
2001 |
Publication |
|
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
|
Issue |
|
Pages |
727-752 |
Keywords |
H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
Surface Spectra IM |
Place of Publication |
Chichester |
Editor |
|
Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:37256 |
Serial |
2613 |
Permanent link to this record |
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|
Author |
Hens, S.; Stuer, C.; Bender, H.; Loo, R.; van Landuyt, J. |
Title |
Quantitative EFTEM study of germanium quantum dots |
Type |
P1 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
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Issue |
|
Pages |
345-346 |
Keywords |
P1 Proceeding; Electron microscopy for materials research (EMAT) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
Rinton Press |
Place of Publication |
Princeton |
Editor |
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Language |
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Wos |
|
Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1-58949-003-7 |
ISBN |
|
Additional Links |
UA library record; WoS full record; |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:95716 |
Serial |
2753 |
Permanent link to this record |
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|
|
Author |
Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P. |
Title |
Stress analysis with convergent beam electron diffraction around NMOS transistors |
Type |
P1 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
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Issue |
|
Pages |
359-360 |
Keywords |
P1 Proceeding; Electron microscopy for materials research (EMAT); Internet Data Lab (IDLab) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
Princeton University Press |
Place of Publication |
Princeton, N.J. |
Editor |
|
Language |
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Wos |
|
Publication Date |
0000-00-00 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1-58949-003-7 |
ISBN |
|
Additional Links |
UA library record; WoS full record; |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:95736 |
Serial |
3176 |
Permanent link to this record |
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|
|
Author |
Michel, K.H.; Nikolaev, A.V.; Verberck, B. |
Title |
Theory of crystal structures of polymerized C60-fullerite and fullerides AC60, A=K, Rb, Cs |
Type |
H1 Book chapter |
Year |
2001 |
Publication |
|
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
|
Issue |
|
Pages |
|
Keywords |
H1 Book chapter; Condensed Matter Theory (CMT) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
s.l. |
Editor |
|
Language |
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Wos |
|
Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
|
Abbreviated Series Title |
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Series Volume |
462-465 |
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record; WoS full record; |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:36883 |
Serial |
3614 |
Permanent link to this record |
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|
|
Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
Title |
High resolution electron microscopy from imaging towards measuring |
Type |
H2 Book chapter |
Year |
2001 |
Publication |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
Abbreviated Journal |
|
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
|
Issue |
|
Pages |
2081-2086 |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
Ieee |
Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2002-11-13 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
0-7803-6646-8 |
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:136870 |
Serial |
4501 |
Permanent link to this record |
|
|
|
Author |
Injuk, J.; Janssens, K.; van Espen, P.; Van Grieken, R. |
Title |
Novel quantitative procedures for in-situ X-ray fluorescence analysis |
Type |
P3 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
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Issue |
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Pages |
|
Keywords |
P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:36093 |
Serial |
5752 |
Permanent link to this record |
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|
|
Author |
Van Grieken, R.; Cardell, C.; Delalieux, F.; Eyckmans, K. |
Title |
Analytical methods to study atmospheric pollution and weathering of materials |
Type |
H3 Book chapter |
Year |
2001 |
Publication |
|
Abbreviated Journal |
|
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
|
Issue |
|
Pages |
163-170
T2 - Sciences and technologies of the mate |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:36382 |
Serial |
7457 |
Permanent link to this record |
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|
|
Author |
Bekshaev, A.; Kontush, S.; Popov, A.; Van Grieken, R. |
Title |
Application of light beams with non-zero angular momentum in optical study of micrometer-size aerosol particles |
Type |
P1 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
|
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
|
Issue |
|
Pages |
288-296
T2 - Second International Conference on Si |
Keywords |
P1 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000171469300037 |
Publication Date |
2003-11-19 |
Series Editor |
|
Series Title |
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Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:36386 |
Serial |
7479 |
Permanent link to this record |
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|
|
Author |
Van Grieken, R.; Eyckmans, K. |
Title |
Geen vuiltje aan de Noordzeelucht: aërosolen kennen geen grenzen |
Type |
P3 Proceeding |
Year |
2001 |
Publication |
|
Abbreviated Journal |
|
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
|
Issue |
|
Pages |
|
Keywords |
P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
|
Publication Date |
|
Series Editor |
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Series Title |
|
Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:36094 |
Serial |
7990 |
Permanent link to this record |
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|
|
Author |
Eyckmans, K.; Van Grieken, R. |
Title |
Luchtkwaliteit boven de Noordzeekust |
Type |
H3 Book chapter |
Year |
2001 |
Publication |
|
Abbreviated Journal |
|
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
|
Issue |
|
Pages |
9-14
T2 - Lucht zonder grenzen: infosessie, De Pan |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
|
Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
|
Abbreviated Series Title |
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Series Volume |
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Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:36387 |
Serial |
8190 |
Permanent link to this record |
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|
|
Author |
Injuk, J.; Van Grieken, R.E. |
Title |
X-ray fluorescence |
Type |
H3 Book chapter |
Year |
2001 |
Publication |
|
Abbreviated Journal |
|
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
|
Issue |
|
Pages |
151-178
T2 - Non-destructive elemental analysis / |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:34107 |
Serial |
8764 |
Permanent link to this record |
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|
|
Author |
Delalieux, F.; Cardell, C.; Todorov, V.; Dekov, V.; Van Grieken, R. |
Title |
Environmental conditions controlling the chemical weathering of the Madara Horseman monument, NE Bulgaria |
Type |
A1 Journal article |
Year |
2001 |
Publication |
Journal of cultural heritage |
Abbreviated Journal |
|
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
2 |
Issue |
|
Pages |
43-54 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1296-2074 |
ISBN |
|
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:32822 |
Serial |
7927 |
Permanent link to this record |
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|
|
Author |
Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S. |
Title |
Misfit accommodation of epitaxial La1-xAxMnO3 (A=Ca, Sr) thin films |
Type |
A1 Journal article |
Year |
2001 |
Publication |
International journal of inorganic materials |
Abbreviated Journal |
Int J Inorg Mater |
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
3 |
Issue |
8 |
Pages |
1331-1337 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
Language |
|
Wos |
000172877700054 |
Publication Date |
2002-07-25 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1466-6049; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
|
Times cited |
2 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:54830 |
Serial |
2087 |
Permanent link to this record |
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|
|
Author |
Chukalina, M.; Simionovici, A.S.; Snigirev, A.; Drakopoulos, M.; Snigireva, I.; Adams, F.; Janssens, K. |
Title |
X-ray fluorescence microtomography |
Type |
A3 Journal article |
Year |
2001 |
Publication |
Poverhnost |
Abbreviated Journal |
|
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
3 |
Issue |
|
Pages |
40-43 |
Keywords |
A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
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Publisher |
|
Place of Publication |
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Editor |
|
Language |
|
Wos |
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Publication Date |
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:34058 |
Serial |
5914 |
Permanent link to this record |
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|
|
Author |
Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S. |
Title |
Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy |
Type |
A1 Journal article |
Year |
2001 |
Publication |
Materials science in semiconductor processing |
Abbreviated Journal |
Mat Sci Semicon Proc |
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
4 |
Issue |
1/3 |
Pages |
109-111 |
Keywords |
A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) |
Abstract |
The use of an energy-filtering held emission gun transmission electron microscope (CM30 FEG Ultratwin) allows, apart from imaging morphologies down to nanometer scale, the fast acquisition of high-resolution element distributions. Electrons that have lost energy corresponding to characteristic inner-shell loss edges are used to form the element maps. The production of Ultra Large-Scale Integration (ULSI) devices with dimensions below 0.25 mum requires among others the formation of a multilayer metallization scheme by means of repeatedly applying the deposition and etching of dielectrics and metals. In this work the evolution of the surface chemical species on etched Al lines in a post-etch cleaning process has been investigated by energy filtering transmission electron microscopy, with the aim to understand the role of each process step on the removal of the etching residues. (C) 2001 Elsevier Science Ltd. All rights reserved. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Oxford |
Editor |
|
Language |
|
Wos |
000167727200026 |
Publication Date |
2002-10-14 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1369-8001; |
ISBN |
|
Additional Links |
UA library record; WoS full record |
Impact Factor |
2.359 |
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: 2.359; 2001 IF: 0.419 |
Call Number |
UA @ lucian @ c:irua:94967 |
Serial |
343 |
Permanent link to this record |
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|
|
Author |
Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G. |
Title |
The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures |
Type |
A1 Journal article |
Year |
2001 |
Publication |
Materials science in semiconductor processing |
Abbreviated Journal |
Mat Sci Semicon Proc |
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
4 |
Issue |
1/3 |
Pages |
117-119 |
Keywords |
A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) |
Abstract |
Shallow trench isolation (STI) is a promising technology for the isolation structures of the new generation of ULSI devices with dimensions below 0.18 mum. The various processing steps cause stress fields in STI structures, which can lead to defect formation in the silicon substrate. In their turn, stress fields affect the electrical parameters and the reliability of devices. Convergent beam electron diffraction (CBED) is used in this study to examine the influence of a wet and a dry pre-gate oxidation on the stress distribution around STI structures. The measurements are performed on STI structures with different width and spacing. CBED analysis is compared with bright-field TEM images. Defects are observed in high-strain areas of small isolated structures. (C) 2001 Elsevier Science Ltd. All rights reserved. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Oxford |
Editor |
|
Language |
|
Wos |
000167727200028 |
Publication Date |
2002-10-14 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1369-8001; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.359 |
Times cited |
6 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 2.359; 2001 IF: 0.419 |
Call Number |
UA @ lucian @ c:irua:94968 |
Serial |
3602 |
Permanent link to this record |
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|
|
Author |
Satto, C.; Ledda, A.; Potapov, P.; Janssens, J.F.; Schryvers, D. |
Title |
Phase transformations and precipitation in amorphous Ti50Ni25Cu25 ribbons |
Type |
A1 Journal article |
Year |
2001 |
Publication |
Intermetallics |
Abbreviated Journal |
Intermetallics |
Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
9 |
Issue |
|
Pages |
395-401 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Chicago, Ill. |
Editor |
|
Language |
|
Wos |
000168882500005 |
Publication Date |
2002-07-25 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0966-9795; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
3.14 |
Times cited |
16 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 3.14; 2001 IF: 1.239 |
Call Number |
UA @ lucian @ c:irua:48367 |
Serial |
2590 |
Permanent link to this record |