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  Author Title Year Publication Volume (up) Times cited Additional Links Links
Vereecke, G.; De Coster, H.; Van Alphen, S.; Carolan, P.; Bender, H.; Willems, K.; Ragnarsson, L.-A.; Van Dorpe, P.; Horiguchi, N.; Holsteyns, F. Wet etching of TiN in 1-D and 2-D confined nano-spaces of FinFET transistors 2018 Microelectronic engineering 200 UA library record; WoS full record; WoS citing articles pdf doi
Prabhakara, V.; Jannis, D.; Guzzinati, G.; Béché, A.; Bender, H.; Verbeeck, J. HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale 2020 Ultramicroscopy 219 4 UA library record; WoS full record; WoS citing articles url doi
Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. Characterization of nickel silicides using EELS-based methods 2010 Journal of microscopy 240 11 UA library record; WoS full record; WoS citing articles doi
Mehta, A.N.; Zhang, H.; Dabral, A.; Richard, O.; Favia, P.; Bender, H.; Delabie, A.; Caymax, M.; Houssa, M.; Pourtois, G.; Vandervorst, W. Structural characterization of SnS crystals formed by chemical vapour deposition 2017 Journal of microscopy T2 – 20th International Conference on Microscopy of Semiconducting Materials, (MSM), APR 09-13, 2017, Univ Oxford, Univ Oxford, Oxford, ENGLAND 268 2 UA library record; WoS full record; WoS citing articles pdf doi
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