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  Author Title Year Publication Volume Times cited Additional Links Links (down)
Bernard, P.; Eisma, D.; Van Grieken, R. Electron microprobe analysis of suspended matter in the Angola Basin 1999 Journal of sea research 41 UA library record; WoS full record; WoS citing articles doi
Dekov, V.M.; van Put, A.; Eisma, D.; Van Grieken, R. Single particle analysis of suspended matter in the Makasar Strait and Flores Sea with particular reference to tin-bearing particles 1999 Journal of sea research 41 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Gijbels, R.; Geuens, I. Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals 1999 Journal of the American Society for Mass Spectrometry 10 4 UA library record; WoS full record; WoS citing articles doi
Nistor, L.; Nistor, S.V.; Dincã, G.; van Landuyt, J.; Schoemaker, D.; Copaciu, V.; Georgeoni, P.; Arnici, N. High resolution electron microscopy and electron spin resonance studies on cubic boron nitride crystals made by high-pressure/high-temperature synthesis 1999 Diamonds an related materials 8 7 UA library record; WoS full record; WoS citing articles doi
Monot, I.; Tancret, F.; Laffez, P.; Van Tendeloo, G.; Desgardin, G. Microstructure and properties of oxygen controlled melt textured NdBaCuO superconductive ceramics 1999 Technology 65 5 UA library record; WoS full record; WoS citing articles pdf doi
Schryvers, D.; Holland-Moritz, D. Martensitic transformations and microstructures in splat-cooled Ni-Al 1999 Materials science and engineering: part A: structural materials: properties, microstructure and processing 273/275 6 UA library record; WoS full record; WoS citing articles doi
Farvacque, J.L.; Bougrioua, Z.; Moerman, I.; Van Tendeloo, G.; Lebedev, O. Role of the defect microstructure on the electrical transport properties in undoped and Si-doped GaN grown by LP-MOVPE 1999 Physica: B : condensed matter T2 – 20th International Conference on Defects in Semiconductors (ICDS-20), JUL 26-30, 1999, BERKELEY, CA 273-4 5 UA library record; WoS full record; WoS citing articles pdf doi
Helm, M.; Hilber, W.; Strasser, G.; de Meester, R.; Peeters, F.M.; Wacker, A. Simultaneous investigation of vertical transport and intersubband absorption in a superlattice: continuum Wannier-Strak ladders and next-nearest neighbor tunneling 1999 Physica: B : condensed matter 272 1 UA library record; WoS full record; WoS citing articles doi
Tsuji, K.; Takenaka, H.; Wagatsuma, K.; de Bokx, P.K.; Van Grieken, R.E. Enhancement of X-ray fluorescence intensity from an ultra-thin sandwiched layer at grazing-emission angles 1999 Spectrochimica acta: part B : atomic spectroscopy 54 UA library record; WoS full record; WoS citing articles doi
Vittiglio, G.; Janssens, K.; Adams, F.; Oost, A. Localised and non-destructive analysis of metallic artefacts from ancient Egypt by means of a compact μ-XRF instrument 1999 Spectrochimica acta: part B : atomic spectroscopy 54 UA library record; WoS full record; WoS citing articles doi
Claes, M.; van Dyck, K.; Deelstra, H.; Van Grieken, R. Determination of silicon in organic matrices with grazing-emission X-ray fluorescence spectrometry 1999 Spectrochimica acta: part B : atomic spectroscopy 54 UA library record; WoS full record; WoS citing articles doi
Vincze, L.; Janssens, K.; Vekemans, B.; Adams, F. Monte Carlo simulation of X-ray fluorescence spectra: part 4: photon scattering at high X-ray energies 1999 Spectrochimica acta: part B : atomic spectroscopy UA library record; WoS full record; WoS citing articles doi
Bogaerts, A.; Gijbels, R.; Goedheer, W. Comparison between a radio-frequency and direct current glow discharge in argon by a hybrid Monte Carlo-fluid model for electrons, argon ions and fast argon atoms 1999 Spectrochimica acta: part B : atomic spectroscopy 54 11 UA library record; WoS full record; WoS citing articles doi
Tsuji, K.; Spolnik, Z.; Wagatsuma, K.; Zhang, J.; Van Grieken, R.E. Enhancement of electron-induced X-ray intensity for single particles under grazing-exit conditions 1999 Spectrochimica acta: part B : atomic spectroscopy 54 UA library record; WoS full record; WoS citing articles doi
Spolnik, Z.M.; Claes, M.; Van Grieken, R.E.; de Bokx, P.K.; Urbach, H.P. Quantification in grazing-emission X-ray fluorescence spectrometry 1999 Spectrochimica acta: part B : atomic spectroscopy 54 UA library record; WoS full record; WoS citing articles doi
Jambers, W.; Dekov, V.; Van Grieken, R. Single particle characterisation of inorganic and organic North Sea suspension 1999 Marine chemistry 67 UA library record; WoS full record; WoS citing articles doi
Huq, M.Z.; Celis, J.P.; Meneve, J.; Stals, L.; Schryvers, D. Oscillating sliding wear of mono- and multilayer ceramic coatings in air 1999 Surface and coatings technology 113 10 UA library record; WoS full record; WoS citing articles doi
Jacobs, M.; Bodart, F.; Terwagne, G.; Schryvers, D.; Poulet, A. Nanohardness and structure of nitrogen implanted SixAly coatings post-implanted with oxygen 1999 Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 147 3 UA library record; WoS full record; WoS citing articles doi
Peeters, F.M.; Reijniers, J.; Badalian, S.M.; Vasilopoulos, P. Snake orbits in hybrid semiconductor/ferromagnetic devices 1999 Microelectronic engineering 47 6 UA library record; WoS full record; WoS citing articles doi
Peeters, F.M.; Schweigert, V.A.; Deo, P.S. Mesoscopic superconducting disks: fluxoids in a box 1999 Microelectronic engineering 47 1 UA library record; WoS full record; WoS citing articles doi
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers 1999 Microelectronic engineering 45 UA library record; WoS full record doi
Sánchez-Moral, S.; Soler, V.; Cañaveras, J.C.; Sanz-Rubio, E.; Van Grieken, R.; Gysels, K. Inorganic deterioration affecting the Altamira Cave, N Spain: quantitative approach to wall-corrosion (solutional etching) processes induced by visitors 1999 The science of the total environment 243/244 UA library record; WoS full record; WoS citing articles doi
Camuffo, D.; Brimblecombe, P.; Van Grieken, R.; Busse, H.-J.; Sturaro, G.; Valentino, A.; Bernardi, A.; Blades, N.; Shooter, D.; de Bock, L.; Gysels, K.; Wieser, M.; Kim, O. Indoor air quality at the Correr Museum, Venice, Italy 1999 The science of the total environment 236 UA library record; WoS full record; WoS citing articles doi
Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers 1999 Thin solid films : an international journal on the science and technology of thin and thick films 343/344 1 UA library record; WoS full record; WoS citing articles doi
Rembeza, E.S.; Richard, O.; van Landuyt, J. Influence of laser and isothermal treatments on microstructural properties of SnO2 films 1999 Materials research bulletin 34 17 UA library record; WoS full record; WoS citing articles doi
Pauwels, B.; Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; Joutsensaari, J.; Kauppinen, E.I. Multiply twinned C60 and C70 nanoparticles 1999 Journal of crystal growth 200 17 UA library record; WoS full record; WoS citing articles doi
Stefan, M.; Nistor, S.V.; Mateescu, D.C.; Abakumov, A.M. Growth of pure and doped Rb2ZnCl4and K2ZnCl4 single crystals by Czochralski technique 1999 Journal of crystal growth 200 13 UA library record; WoS full record; WoS citing articles pdf doi
Gysels, K.; Van Grieken, R. Field evaluation of a wind tunnel-impactor system for sampling ambient aerosols 1999 Journal of aerosol science 30 UA library record; WoS full record; WoS citing articles doi
Spolnik, Z.M.; Claes, M.; Van Grieken, R. Determination of trace elements in organic matrices by grazing-emission X-ray fluorescence spectrometry 1999 Analytica chimica acta 401 UA library record; WoS full record; WoS citing articles doi
Ro, C.-U.; Hoornaert, S.; Van Grieken, R. Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis 1999 Analytica chimica acta 389 UA library record; WoS full record; WoS citing articles doi
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