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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links  |
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den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
2005 |
Ultramicroscopy |
104 |
70 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. |
Plasmon holographic experiments: theoretical framework |
2005 |
Ultramicroscopy |
102 |
43 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Van Aert, S. |
Model based quantification of EELS spectra |
2004 |
Ultramicroscopy |
101 |
147 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. |
On the interpretation of HREM images of partially ordered alloys |
1995 |
Ultramicroscopy |
60 |
20 |
UA library record; WoS full record; WoS citing articles |
|
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De Meulenaere, P.; van Dyck, D.; Van Tendeloo, G.; van Landuyt, J. |
Dynamical electron diffraction in substitutionally disordered column structures |
1995 |
Ultramicroscopy |
60 |
14 |
UA library record; WoS full record; WoS citing articles |
|
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Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
The reciprocal space of carbon tubes: a detailed interpretation of the electron diffraction effects |
1994 |
Ultramicroscopy |
54 |
59 |
UA library record; WoS full record; WoS citing articles |
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Zhang, X.F.; Zhang, X.B.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Werner, H. |
A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60 |
1994 |
Ultramicroscopy |
55 |
2 |
UA library record; WoS full record; WoS citing articles |
|
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Luyten, W.; Krekels, T.; Amelinckx, S.; Van Tendeloo, G.; van Dyck, D.; van Landuyt, J. |
Electron diffraction effects of conical, helically wound, graphite whiskers |
1993 |
Ultramicroscopy |
49 |
14 |
UA library record; WoS full record; WoS citing articles |
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Van Tendeloo, G.; Amelinckx, S.; Muto, S.; Verheijen, M.A.; van Loosdrecht, P.H.M.; Meijer, G. |
Structures and phase transitions in C60 and C70 fullerites |
1993 |
Ultramicroscopy |
51 |
17 |
UA library record; WoS full record; WoS citing articles |
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Amelinckx, S.; Milat, O.; Van Tendeloo, G. |
Selective imaging of sublattices in complex structures |
1993 |
Ultramicroscopy |
51 |
8 |
UA library record; WoS full record; WoS citing articles |
|
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Milat, O.; Van Tendeloo, G.; Amelinckx, S. |
Selective imaging of the “substructures” in incommensurately modulated intergrowth crystal structures |
1992 |
Ultramicroscopy |
41 |
5 |
UA library record; WoS full record; WoS citing articles |
|
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Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: 1: theoretical framework |
1992 |
Ultramicroscopy |
41 |
17 |
UA library record; WoS full record; WoS citing articles |
|
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Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
In situ HREM study of electron irradiation effects in AgCl microcrystals |
1992 |
Ultramicroscopy |
40 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
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van Landuyt, J. |
The evolution of HVEM application in antwerp |
1991 |
Ultramicroscopy
T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan |
39 |
|
UA library record; WoS full record |
|
|
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Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. |
Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging |
1997 |
Ultramicroscopy |
69 |
11 |
UA library record; WoS full record; WoS citing articles |
|
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Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases |
1993 |
Ultramicroscopy |
48 |
6 |
UA library record; WoS full record; WoS citing articles |
|
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Stefan Löffler; Matthieu Bugnet; Nicolas Gauquelin; Sorin Lazar; Elias Assmann; Karsten Held; Gianluigi A. Botton; Peter Schattschneider |
Real-space mapping of electronic orbitals |
2017 |
Ultramicroscopy |
177 |
|
UA library record |
|
|
|
Lobato, I.; Van Aert, S.; Verbeeck, J. |
Progress and new advances in simulating electron microscopy datasets using MULTEM |
2016 |
Ultramicroscopy |
168 |
43 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Kirilenko, D.A.; Brunkov, P.N. |
Measuring the height-to-height correlation function of corrugation in suspended graphene |
2016 |
Ultramicroscopy |
165 |
3 |
|
|
|
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Lobato, I.; Van Dyck, D. |
MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA |
2015 |
Ultramicroscopy |
156 |
32 |
UA library record; WoS full record; WoS citing articles |
|
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Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. |
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy |
2014 |
Ultramicroscopy |
137 |
74 |
UA library record; WoS full record; WoS citing articles |
|
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Lubk, A.; Javon, E.; Cherkashin, N.; Reboh, S.; Gatel, C.; Hytch, M. |
Dynamic scattering theory for dark-field electron holography of 3D strain fields |
2014 |
Ultramicroscopy |
136 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
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den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S. |
Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits? |
2013 |
Ultramicroscopy |
134 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lichtert, S.; Verbeeck, J. |
Statistical consequences of applying a PCA noise filter on EELS spectrum images |
2013 |
Ultramicroscopy |
125 |
54 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Béché, A.; van den Broek, W. |
A holographic method to measure the source size broadening in STEM |
2012 |
Ultramicroscopy |
120 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
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van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. |
Correction of non-linear thickness effects in HAADF STEM electron tomography |
2012 |
Ultramicroscopy |
116 |
67 |
UA library record; WoS full record; WoS citing articles |
|
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Schattschneider, P.; Stöger-Pollach, M.; Löffler, S.; Steiger-Thirsfeld, A.; Hell, J.; Verbeeck, J. |
Sub-nanometer free electrons with topological charge |
2012 |
Ultramicroscopy |
115 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Tian, H.; Béché, A. |
A new way of producing electron vortex probes for STEM |
2012 |
Ultramicroscopy |
113 |
62 |
UA library record; WoS full record; WoS citing articles |
|
|
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Zanaga, D.; Altantzis, T.; Sanctorum, J.; Freitag, B.; Bals, S. |
An alternative approach for \zeta-factor measurement using pure element nanoparticles |
2016 |
Ultramicroscopy |
164 |
19 |
UA library record; WoS full record; WoS citing articles |
|
|
|
de Backer, A.; Van Aert, S.; van Dyck, D. |
High precision measurements of atom column positions using model-based exit wave reconstruction |
2011 |
Ultramicroscopy |
111 |
8 |
UA library record; WoS full record; WoS citing articles |
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