| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links  |
|
|
Roekens, E.J.; Van Grieken, R.E. |
Kinetics of iron(II) oxidation in seawater of various pH : reply |
1984 |
Marine chemistry |
15 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Roekens, E.J.; Van Grieken, R.E. |
Kinetics of iron(II) oxidation in seawater of various pH |
1983 |
Marine chemistry |
13 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. |
On the interpretation of HREM images of partially ordered alloys |
1995 |
Ultramicroscopy |
60 |
20 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De Meulenaere, P.; van Dyck, D.; Van Tendeloo, G.; van Landuyt, J. |
Dynamical electron diffraction in substitutionally disordered column structures |
1995 |
Ultramicroscopy |
60 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
The reciprocal space of carbon tubes: a detailed interpretation of the electron diffraction effects |
1994 |
Ultramicroscopy |
54 |
59 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zhang, X.F.; Zhang, X.B.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Werner, H. |
A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60 |
1994 |
Ultramicroscopy |
55 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Luyten, W.; Krekels, T.; Amelinckx, S.; Van Tendeloo, G.; van Dyck, D.; van Landuyt, J. |
Electron diffraction effects of conical, helically wound, graphite whiskers |
1993 |
Ultramicroscopy |
49 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Tendeloo, G.; Amelinckx, S.; Muto, S.; Verheijen, M.A.; van Loosdrecht, P.H.M.; Meijer, G. |
Structures and phase transitions in C60 and C70 fullerites |
1993 |
Ultramicroscopy |
51 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Amelinckx, S.; Milat, O.; Van Tendeloo, G. |
Selective imaging of sublattices in complex structures |
1993 |
Ultramicroscopy |
51 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Milat, O.; Van Tendeloo, G.; Amelinckx, S. |
Selective imaging of the “substructures” in incommensurately modulated intergrowth crystal structures |
1992 |
Ultramicroscopy |
41 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: 1: theoretical framework |
1992 |
Ultramicroscopy |
41 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
In situ HREM study of electron irradiation effects in AgCl microcrystals |
1992 |
Ultramicroscopy |
40 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Landuyt, J. |
The evolution of HVEM application in antwerp |
1991 |
Ultramicroscopy
T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan |
39 |
|
UA library record; WoS full record |
|
|
|
Slanina, Z.; Martin, J.M.L.; François, J.P.; Gijbels, R. |
On the relative stabilities of the linear and triangular forms of B3N |
1993 |
Chemical physics |
178 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verheijen, M.A.; Meekes, H.; Meijer, G.; Bennema, P.; de Boer, J.L.; van Smaalen, S.; Van Tendeloo, G.; Amelinckx, S.; Muto, S.; van Landuyt, J. |
The structure of different phases of pure C70 crystals |
1992 |
Chemical physics |
166 |
168 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Roekens, E.; Bleyen, C.; Van Grieken, R. |
Sulphite and sulphate concentrations in weathering products of sandy limestone and in deposition samples |
1989 |
Environmental pollution |
57 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Janssens, K.; Dorrine, W.; van Espen, P. |
The development process of an expert system for the automated interpretation of large epma data sets |
1988 |
Chemometrics and intelligent laboratory systems |
4 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Janssens, K.; Nobels, J.; van Espen, P. |
PC-MCA : a software package for the acquisition and processing of spectral data |
1988 |
Chemometrics and intelligent laboratory systems |
3 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
van Espen, P.; Janssens, K.; Nobels, J. |
AXIL-PC, software for the analysis of complex-x-ray spectra |
1986 |
Chemometrics and intelligent laboratory systems |
1 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Muret, P.; Nguyen, T.T.A.; Frangis, N.; Van Tendeloo, G.; van Landuyt, J. |
Photoelectric and electrical responses of several erbium silicide/silicon interfaces |
1996 |
Applied surface science
T2 – International Symposium on Si Heterostructures – From Physics to Devices, SEP 11-14, 1995, IRAKLION, GREECE |
102 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. |
Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate |
1996 |
Applied surface science |
102 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G.; Frangis, N.; van Landuyt, J. |
High crystalline quality erbium silicide films on (100) silicon grown in high vacuum |
1996 |
Applied surface science |
102 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanhellemont, J.; Maes, H.E.; Schaekers, M.; Armigliato, A.; Cerva, H.; Cullis, A.; de Sande, J.; Dinges, H.; Hallais, J.; Nayar, V.; Pickering, C.; Stehlé, J.L.; Van Landuyt, J.; Walker, C.; Werner, H.; Salieri, P.; |
Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry |
1993 |
Applied surface science
T2 – SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE |
63 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Langevelde, F.; Janssens, K.H.; Adams, F.C.; Vis, R.D. |
Prediction of the optical characteristics and analytical qualities of an X-ray fluorescence microprobe at the European Synchrotron Radiation Facility (Grenoble) |
1992 |
Nuclear instruments and methods in physics research : A: accelerators, spectrometers, detectors and associated equipment |
317 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Fedina, L.; van Landuyt, J.; Vanhellemont, J.; Aseev, A.L. |
Observation of vacancy clustering in FZ-Si crystals during in situ electron irradiation in a high voltage electron microscope |
1996 |
Nuclear instruments and methods in physics research |
B112 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Frangis, N.; Nejim, A.; Hemment, P.L.F.; Stoemenos, J.; van Landuyt, J. |
Ion beam synthesis of \beta-SiC at 950 degrees C and structural characterization |
1996 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms
T2 – Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation/Symposium C on Pushing the Limits of Ion Beam, Processing – Fr |
112 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Janssens, K.; Vekemans, B.; Adams, F.; van Espen, P.; Mutsaers, P. |
Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting |
1996 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms
T2 – 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy |
109 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Bruynseels, F.; Van Grieken, R. |
Recombination reactions and geometry effects in laser microprobe mass analysis studied with 12C/13C bilayers |
1986 |
International journal of mass spectrometry and ion processes |
74 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Vos, L.; Van Grieken, R. |
Influence of spark generator parameters in the analysis of graphite-electrodes by spark source-mass spectrometry |
1984 |
International journal of mass spectrometry and ion processes |
55 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Vos, L.; Van Grieken, R. |
Influence of ion-source geometry in spark source-mass spectrometric analysis |
1984 |
International journal of mass spectrometry and ion processes |
59 |
|
UA library record; WoS full record; WoS citing articles |
|
