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  Author Title Year Publication Volume Times cited Additional Links Links
Lobato, I.; Van Dyck, D. MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA 2015 Ultramicroscopy 156 32 UA library record; WoS full record; WoS citing articles pdf doi
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? 2017 Ultramicroscopy 181 3 UA library record; WoS full record; WoS citing articles pdf url doi
Pourbabak, S.; Wang, X.; Van Dyck, D.; Verlinden, B.; Schryvers, D. Ni cluster formation in low temperature annealed Ni50.6Ti49.4 2017 Functional materials letters 10 4 UA library record; WoS full record; WoS citing articles pdf url doi
Sentosun, K.; Lobato, I.; Bladt, E.; Zhang, Y.; Palenstijn, W.J.; Batenburg, K.J.; Van Dyck, D.; Bals, S. Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography 2017 Particle and particle systems characterization 34 2 UA library record; WoS full record; WoS citing articles pdf url doi
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution 2022 Ultramicroscopy 233 UA library record; WoS full record; WoS citing articles url doi
van Dyck, D.; Van Aert, S.; Croitoru, M.D. Obstacles on the road towards atomic resolution tomography 2005 Microscoy and microanalysis 11 UA library record
Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction 2005 Microscopy and microanalysis 11 UA library record pdf
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. Statistical experimental design for quantitative atomic resolution transmission electron microscopy 2004 13 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data 2008 UA library record doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. High resolution electron microscopy from imaging towards measuring 2001 ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 UA library record doi
Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate 2000 UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2008 UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2007 UA library record
Proost, K.; Schalm, O.; Janssens, K.; Van Dyck, D. Investigation of the chemical state and 3D distribution of Mn in corroded glass fragments 2005 UA library record
Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. Electron microscopy: principles and fundamentals 1997 UA library record
Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. Handbook of microscopy: applications in materials science, solid-state physics and chemistry 1997 UA library record
Ferroni, M.; Carotta, M.C.; Guidi, V.; Martinelli, G.; Ronconi, F.; Richard, O.; van Dyck, D.; van Landuyt, J. Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application 2000 Sensors and actuators : B : chemical 68 51 UA library record; WoS full record; WoS citing articles doi
Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration 2005 UA library record
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