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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Santamarta, R.; Schryvers, D. |
Effect of amorphous-crystalline interfaces on the martensitic transformation in Ti50Ni25Cu25 |
2004 |
Scripta materialia |
50 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
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Srivastava, A.K.; Yang, Z.; Schryvers, D.; van Hurnbeeck, J. |
Effect of annealing on cold-rolled Ni-Ti alloys |
2008 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
481 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Wang, X.; Amin-Ahmadi, B.; Schryvers, D.; Verlinden, B.; Van Humbeeck, J. |
Effect of annealing on the transformation behavior and mechanical properties of two nanostructured Ti-50.8at.%Ni thin wires produced by different methods |
2013 |
Materials science forum |
738/739 |
5 |
UA library record; WoS full record; WoS citing articles |
|
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Potapov, P.L.; Jorissen, K.; Schryvers, D.; Lamoen, D. |
Effect of charge transfer on EELS integrated cross sections in Mn and Ti oxides |
2004 |
Physical review : B : condensed matter and materials physics |
70 |
28 |
UA library record; WoS full record; WoS citing articles |
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Amin-Ahmadi, B.; Idrissi, H.; Galceran, M.; Colla, M.S.; Raskin, J.P.; Pardoen, T.; Godet, S.; Schryvers, D. |
Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films |
2013 |
Thin solid films : an international journal on the science and technology of thin and thick films |
539 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
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Chen, Z.; Tan, Z.; Ji, G.; Schryvers, D.; Ouyang, Q.; Li, Z. |
Effect of interface evolution on thermal conductivity of vacuum hot pressed SiC/Al composites |
2015 |
Advanced engineering materials |
17 |
9 |
UA library record; WoS full record; WoS citing articles |
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Wang, X.; Kustov, S.; Li, K.; Schryvers, D.; Verlinden, B.; Van Humbeeck, J. |
Effect of nanoprecipitates on the transformation behavior and functional properties of a Ti50.8 at.% Ni alloy with micron-sized grains |
2015 |
Acta materialia |
82 |
51 |
UA library record; WoS full record; WoS citing articles |
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Delmelle, R.; Amin-Ahmadi, B.; Sinnaeve, M.; Idrissi, H.; Pardoen, T.; Schryvers, D.; Proost, J. |
Effect of structural defects on the hydriding kinetics of nanocrystalline Pd thin films |
2015 |
International journal of hydrogen energy |
40 |
13 |
UA library record; WoS full record; WoS citing articles |
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|
|
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. |
Electron diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals |
1994 |
Icem |
13 |
|
UA library record; WoS full record; |
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Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. |
Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals |
1994 |
Physica status solidi: A |
143 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
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Schryvers, D.; Potapov, P. |
Electron diffraction refinement of the TiNi(Fe) R-phase structure |
2003 |
Journal de physique |
112 |
7 |
UA library record; WoS full record; WoS citing articles |
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Tirry, W.; Schryvers, D.; Jorissen, K.; Lamoen, D. |
Electron-diffraction structure refinement of Ni4Ti3 precipitates in Ni52Ti48 |
2006 |
Acta crystallographica: section B: structural science |
62 |
30 |
UA library record; WoS full record; WoS citing articles |
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Dobysheva, L.V.; Potapov, P.L.; Schryvers, D. |
Electron-energy-loss spectra of NiO |
2004 |
Physical review : B : condensed matter and materials physics |
69 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
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Yang, Z.; Tirry, W.; Lamoen, D.; Kulkova, S.; Schryvers, D. |
Electron energy-loss spectroscopy and first-principles calculation studies on a Ni-Ti shape memory alloy |
2008 |
Acta materialia |
56 |
20 |
UA library record; WoS full record; WoS citing articles |
|
|
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Yang, Z.Q.; Schryvers, D. |
Electron energy-loss spectroscopy study of NiTi shape memory alloys |
2008 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
481 |
7 |
UA library record; WoS full record; WoS citing articles |
|
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Millan, A.; de Keyzer, R. |
Electron microscopical investigation of AgBr needle crystals |
1995 |
Journal of crystal growth |
151 |
14 |
UA library record; WoS full record; WoS citing articles |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
Electron microscopical investigation of tetrahedral-shaped AgBr microcrystals |
1997 |
Journal of crystal growth |
172 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
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Schryvers, D.; de Saegher, B.; van Landuyt, J. |
Electron microscopy and diffraction study of the composition dependency of the 3R microtwinned martensite in Ni-Al |
1991 |
Materials research bulletin |
26 |
11 |
UA library record; WoS full record; WoS citing articles |
|
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Seo, J.W.; Schryvers, D.; Vermeulen, W.; Richard, O.; Potapov, P. |
Electron microscopy investigation of ternary \gamma-brass-type precipitation in a Ni39.6Mn47.5Ti12.9 alloy |
1999 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
79 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
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Schryvers, D. |
Electron microscopy studies of martensite microstructures |
1997 |
Journal de physique: 4 |
C5 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Shi, H.; Pourbabak, S.; Van Humbeeck, J.; Schryvers, D. |
Electron microscopy study of Nb-rich nanoprecipitates in NiTiNb and their influence on the martensitic transformation |
2012 |
Scripta materialia |
67 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy: 1: precipitation and growth |
1995 |
Acta metallurgica et materialia |
43 |
27 |
UA library record; WoS full record; WoS citing articles |
|
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy: 2: plate crystallography |
1995 |
Acta metallurgica et materialia |
43 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
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Hamon, A.-L.; Verbeeck, J.; Schryvers, D.; Benedikt, J.; van den Sanden, R.M.C.M. |
ELNES study of carbon K-edge spectra of plasma deposited carbon films |
2004 |
Journal of materials chemistry |
14 |
61 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Seo, J.W.; Schryvers, D.; Vermeulen, W.; Richard, O.; Potapov, P. |
EM investigation of precursors and precipitation in a Ni39.6Mn47.5Ti12.9 alloy |
1999 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
79 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C. |
EM study of sensitisation of silver halide grains |
1994 |
Icem |
13 |
|
UA library record; WoS full record; |
|
|
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Schalm, O.; van der Linden, V.; Frederickx, P.; Luyten, S.; van der Snickt, G.; Caen, J.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. |
Enamels in stained glass windows: preparation, chemical composition, microstructure and causes of deterioration |
2009 |
Spectrochimica acta: part B : atomic spectroscopy |
64 |
28 |
UA library record; WoS full record; WoS citing articles |
|
|
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Yandouzi, M.; Toth, L.; Vasudevan, V.; Cannaerts, M.; van Haesendonck, C.; Schryvers, D. |
Epitaxial Ni-Al thin films on NaCl using a Ag buffer layer |
2000 |
Philosophical magazine letters |
80 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
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Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Döcking, H. |
EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments |
2004 |
X-ray spectrometry |
33 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
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Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. |
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis |
2007 |
Microscopy research and technique |
70 |
36 |
UA library record; WoS full record; WoS citing articles |
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