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Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Johansson, T.B.; Van Grieken, R.E.; Winchester, J.W. |
Elemental abundance variation with particle-size in north florida aerosols |
1976 |
Journal of geophysical research |
81 |
|
UA library record; WoS full record; WoS citing articles |
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Mirzakhani, M.; Zarenia, M.; Vasilopoulos, P.; Peeters, F.M. |
Electrostatically confined trilayer graphene quantum dots |
2017 |
Physical review B |
95 |
6 |
UA library record; WoS full record; WoS citing articles |
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Rahemi, V. |
Electrosensing applications by using titania as a support for bio(inspired) molecules |
2018 |
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UA library record |
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Milovanović, S. |
Electronic transport properties in nano- and micro-engineered graphene structures |
2017 |
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UA library record |
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de Paula Miranda, L. |
Electronic transport in two dimensional systems with defects |
2022 |
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UA library record |
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Khazaei, M.; Wang, V.; Sevik, C.; Ranjbar, A.; Arai, M.; Yunoki, S. |
Electronic structures of iMAX phases and their two-dimensional derivatives: A family of piezoelectric materials |
2018 |
Physical review materials |
2 |
|
UA library record; WoS full record; WoS citing articles |
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Mirzakhani, M. |
Electronic properties and energy levels of graphene quantum dots |
2017 |
|
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UA library record |
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Siriwardane, E.M.D.; Karki, P.; Sevik, C.; Cakir, D. |
Electronic and mechanical properties of stiff rhenium carbide monolayers: A first-principles investigation |
2018 |
Applied surface science |
458 |
|
UA library record; WoS full record; WoS citing articles |
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Poulain, R.; Lumbeeck, G.; Hunka, J.; Proost, J.; Savolainen, H.; Idrissi, H.; Schryvers, D.; Gauquelin, N.; Klein, A. |
Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism |
2022 |
ACS applied electronic materials |
4 |
|
UA library record; WoS full record; WoS citing articles |
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Weill; Chevalier; Chambon; Tressaud; Darriet; Etourneau; Van Tendeloo, G. |
Electron-microscopy investigation of superconducting la2cu(o, f)4+y oxyfluoride |
1993 |
European journal of solid state and inorganic chemistry |
30 |
2 |
UA library record; WoS full record; WoS citing articles |
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Van Tendeloo, G.; Amelinckx, S. |
Electron-microscopy and the structural studies of superconducting materials and fullerites |
1994 |
NATO Advanced Study Institutes series: series E : applied sciences
T2 – NATO Advanced Study Institute on Materials and crystallographic Aspects, of HT(c)-Superconductivity, May 17-30, 1993, Erice, Italy |
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UA library record; WoS full record; |
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Muto, S.; Schryvers, D. |
Electron-irridation-induced martensitic transformation in a Ni63Al37 observed in-situ by HREM |
1993 |
MRS Japan: shape memory materials |
18 |
|
UA library record |
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Conti, S.; Saberi-Pouya, S.; Perali, A.; Virgilio, M.; Peeters, F.M.; Hamilton, A.R.; Scappucci, G.; Neilson, D. |
Electron-hole superfluidity in strained Si/Ge type II heterojunctions |
2021 |
npj Quantum Materials |
6 |
9 |
UA library record; WoS full record; WoS citing articles |
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Kálna, K.; Mo×ko, M.; Peeters, F.M. |
Electron-electron scattering induced capture in GaAs quantum wells |
1995 |
Lithuanian journal of physics |
35 |
|
UA library record |
|
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Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. |
Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals |
1994 |
Physica status solidi: A |
143 |
7 |
UA library record; WoS full record; WoS citing articles |
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Moors, K.; Soree, B.; Tokei, Z.; Magnus, W. |
Electron relaxation times and resistivity in metallic nanowires due to tilted grain boundary planes |
2015 |
On Ultimate Integration On Silicon (eurosoi-ulis) |
|
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UA library record; WoS full record; WoS citing articles |
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Hoornaert, S.; Treiger, B.; Valkovic, V.; Van Grieken, R. |
Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level |
1998 |
Microchimica acta |
128 |
|
UA library record; WoS full record; WoS citing articles |
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Hoornaert, S.; Treiger, B.; Van Grieken, R.; Valkovic, V. |
Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level |
1996 |
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UA library record |
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Leysen, L.A.; De Waele, J.K.; Roekens, E.J.; Van Grieken, R.E. |
Electron probe micro-analysis and laser microprobe mass analysis of material, leached from a limestone cathedral |
1987 |
Scanning microscopy |
1 |
|
UA library record |
|
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Hai, G.-Q.; Candido, L.; Brito, B.G.A.; Peeters, F.M. |
Electron pairing: from metastable electron pair to bipolaron |
2018 |
Journal of physics communications |
2 |
9 |
UA library record; WoS full record; WoS citing articles |
|
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Hai, G.Q.; Studart, N.; Peeters, F.M.; Devreese, J.T.; Koenraad, P.M.; van de Stadt, A.F.W.; Wolter, J.H. |
Electron mobility in Si delta-doped GaAs |
1994 |
Proceedings of the International Conference on the Physics of Semiconductors |
22 |
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UA library record |
|
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Schryvers, D.; van Landuyt, J.T. |
Electron microscopy study of twin sequences and branching in Ni66Al34 3r martensite |
1993 |
Proceedings Of The International Conference On Martensitic Transformations (icomat-92) |
|
1 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy: 2: plate crystallography |
1995 |
Acta metallurgica et materialia |
43 |
11 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy: 1: precipitation and growth |
1995 |
Acta metallurgica et materialia |
43 |
27 |
UA library record; WoS full record; WoS citing articles |
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Luyten, W.; Van Tendeloo, G.; Amelinckx, S.; Collins, J.L. |
Electron microscopy study of defects in synthetic diamond layers |
1992 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
66 |
36 |
UA library record; WoS full record; WoS citing articles |
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Bernaerts, D.; Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J.; Ivanov, V.; Nagy, J.B. |
Electron microscopy study of coiled carbon tubules |
1995 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
71 |
72 |
UA library record; WoS full record; WoS citing articles |
|
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Schryvers, D.; Tanner, L.E. |
Electron microscopy of stress-induced martensite and pretransition microstructures in Ni62.5Al37.5 |
1992 |
Shape memory materials and phenomena: fundamental aspects and applications |
246 |
5 |
UA library record; WoS full record; WoS citing articles |
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Van Tendeloo, G.; Goessens, C.; Schryvers, D.; van Haverbergh, J.; de Veirman, A.; van Landuyt, J. |
Electron microscopy of interfaces in new materials |
1991 |
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UA library record |
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Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. |
Electron microscopy of fullerenes and fullerene related structures |
1994 |
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UA library record |
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Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of C60 and C70 fullerites |
1993 |
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UA library record |
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