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	Author	Hoornaert, S.; Treiger, B.; Valkovic, V.; Van Grieken, R.
	Title	Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level			Type	A1 Journal article
	Year	1998	Publication	Microchimica acta	Abbreviated Journal
	Volume	128	Issue		Pages	207-213
	Keywords	A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language		Wos	000071438000010	Publication Date	2005-02-26
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0026-3672; 1436-5073	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor		Times cited		Open Access
	Notes				Approved	no
	Call Number	UA @ admin @ c:irua:20960			Serial	7873
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