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Stabilization and encapsulation of gold nanostars mediated by dithiols”. Wang Y, Belén Serrano A, Sentosun K, Bals S, Liz-Marzán LM, Small 11, 4314 (2015). http://doi.org/10.1002/smll.201500703
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Stabilization effects in binary colloidal Cu and Ag nanoparticle electrodes under electrochemical CO₂, reduction conditions”. Wu L, Kolmeijer KE, Zhang Y, An H, Arnouts S, Bals S, Altantzis T, Hofmann JP, Costa Figueiredo M, Hensen EJM, Weckhuysen BM, van der Stam W, Nanoscale 13, 4835 (2021). http://doi.org/10.1039/D0NR09040A
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Stabilization of mercury-based superconductors by foreign cations”. Raveau B, Michel C, Hervieu M, Van Tendeloo G, Maignan A, Annales de chimie (1914) T2 –, 4th North-African Materials Science Symposium (JMSM 94), NOV 23-24, 1994, CASABLANCA, MOROCCO 19, 487 (1994)
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Stabilization of the cubic phase of HfO2 by Y addition in films grown by metal organic chemical vapor deposition”. Rauwel E, Dubourdieu C, Holländer B, Rochat N, Ducroquet F, Rossell MD, Van Tendeloo G, Pelissier B, Applied physics letters 89, 012902 (2006). http://doi.org/10.1063/1.2216102
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Stabilization of the Perovskite Phase in the Y-Bi-O System By Using a BaBiO3 Buffer Layer”. Bouwmeester RL, de Hond K, Gauquelin N, Verbeeck J, Koster G, Brinkman A, Physica Status Solidi-Rapid Research Letters 13, 1970028 (2019). http://doi.org/10.1002/pssr.201970028
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Stabilization of the perovskite phase in the Y-Bi-O system by using a BaBiO₃, buffer layer”. Bouwmeester RL, de Hond K, Gauquelin N, Verbeeck J, Koster G, Brinkman A, Physica status solidi: rapid research letters 13, 1800679 (2019). http://doi.org/10.1002/PSSR.201800679
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Stabilizing perovskite Pb(Mg0.33Nb0.67)O3-PbTiO3 thin films by fast deposition and tensile mismatched growth template”. Ni S, Houwman E, Gauquelin N, Chezganov D, Van Aert S, Verbeeck J, Rijnders G, Koster G, ACS applied materials and interfaces 16, 12744 (2024). http://doi.org/10.1021/ACSAMI.3C16241
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Stable polyoxometalate insertion within the mesoporous metal organic framework MIL-100(Fe)”. Canioni R, Roch-Marchal C, Sécheresse F, Horcajada P, Serre C, Hardi-Dan M, Férey G, Grenèche J-M, Lefebvre F, Chang J-S, Hwang Y-K, Lebedev O, Turner S, Van Tendeloo G, Journal of materials chemistry 21, 1226 (2011). http://doi.org/10.1039/c0jm02381g
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Stable vortex-antivortex molecules in mesoscopic superconducting triangles”. Misko VR, Fomin VM, Devreese JT, Moshchalkov VV, Physical Review Letters 90, 147003 (2003). http://doi.org/10.1103/PhysRevLett.90.147003
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Stack gas dispersion measurements with large scale-PIV, aspiration probes and light scattering techniques and comparison with CFD”. Nakiboglu G, Gorlé, C, Horvath I, van Beeck J, Blocken B, Atmospheric environment : an international journal 43, 3396 (2009). http://doi.org/10.1016/j.atmosenv.2009.03.047
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Standard Practices of Reticular Chemistry”. Gropp C, Canossa S, Wuttke S, Gándara F, Li Q, Gagliardi L, Yaghi OM, Acs Central Science 6, 1255 (2020). http://doi.org/10.1021/acscentsci.0c00592
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State of the art and prospects for Halide Perovskite Nanocrystals”. Dey A, Ye J, De A, Debroye E, Ha SK, Bladt E, Kshirsagar AS, Wang Z, Yin J, Wang Y, Quan LN, Yan F, Gao M, Li X, Shamsi J, Debnath T, Cao M, Scheel MA, Kumar S, Steele JA, Gerhard M, Chouhan L, Xu K, Wu X-gang, Li Y, Zhang Y, Dutta A, Han C, Vincon I, Rogach AL, Nag A, Samanta A, Korgel BA, Shih C-J, Gamelin DR, Son DH, Zeng H, Zhong H, Sun H, Demir HV, Scheblykin IG, Mora-Sero I, Stolarczyk JK, Zhang JZ, Feldmann J, Hofkens J, Luther JM, Perez-Prieto J, Li L, Manna L, Bodnarchuk M I, Kovalenko M V, Roeffaers MBJ, Pradhan N, Mohammed OF, Bakr OM, Yang P, Muller-Buschbaum P, Kamat P V, Bao Q, Zhang Q, Krahne R, Galian RE, Stranks SD, Bals S, Biju V, Tisdale WA, Yan Y, Hoye RLZ, Polavarapu L, Acs Nano 15, 10775 (2021). http://doi.org/10.1021/ACSNANO.0C08903
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Statistical consequences of applying a PCA noise filter on EELS spectrum images”. Lichtert S, Verbeeck J, Ultramicroscopy 125, 35 (2013). http://doi.org/10.1016/j.ultramic.2012.10.001
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Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range”. Bals S, Van Aert S, Van Tendeloo G, Avila-Brande D, Physical review letters 96, 096106 (2006). http://doi.org/10.1103/PhysRevLett.96.096106
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Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction”. Bals S, Van Aert S, Van Tendeloo G, van Dyck D, Avila-Brande D, Microscopy and microanalysis 11, 556 (2005)
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Statistical experimental design for quantitative atomic resolution transmission electron microscopy”. Van Aert S, den Dekker AJ, van den Bos A, van Dyck D Academic Press, San Diego, Calif., page 1 (2004).
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Statistical method for thickness measurement of amorphous objects”. van Dyck D, Croitoru MD, Applied physics letters 90, 241911 (2007). http://doi.org/10.1063/1.2749184
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Statistical parameter estimation theory : a tool for quantitative electron microscopy”. Van Aert S Wiley-VCH, Weinheim, page 281 (2012).
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Statistical parameter estimation theory : principles and simulation studies”. de Backer A, Fatermans J, den Dekker AJ, Van Aert S Advances in imaging and electron physics T2 – Advances in imaging and electron physics. page 29 (2021).
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StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images”. De Backer A, van den Bos KHW, Van den Broek W, Sijbers J, Van Aert S, Ultramicroscopy 171, 104 (2016). http://doi.org/10.1016/j.ultramic.2016.08.018
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StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images”. De Backer A, van den Bos KHW, Van den Broek W, Sijbers J, Van Aert S, Journal of physics : conference series T2 –, Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK 902, 012013 (2017). http://doi.org/10.1088/1742-6596/902/1/012013
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Egoavil R (2014) STEM investigation of complex oxides at the atomic scale. Antwerpen
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Steric hindrance induces crosslike self-assembly of gold nanodumbbells”. Grzelczak M, Sánchez-Iglesias A, Heidari Mezerji H, Bals S, Pérez-Juste J, Liz-Marzán LM, Nano letters 12, 4380 (2012). http://doi.org/10.1021/nl3021957
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Strain accommodation through facet matching in La1.85Sr0.15CuO4/Nd1.85Ce0.15CuO4 ramp-edge junctions”. Hoek M, Coneri F, Poccia N, Renshaw Wang X, Ke X, Van Tendeloo G, Hilgenkamp H, APL materials 3, 086101 (2015). http://doi.org/10.1063/1.4927796
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Strain analysis from nano-beam electron diffraction : influence of specimen tilt and beam convergence”. Grieb T, Krause FF, Schowalter M, Zillmann D, Sellin R, Müller-Caspary K, Mahr C, Mehrtens T, Bimberg D, Rosenauer A, Ultramicroscopy 190, 45 (2018). http://doi.org/10.1016/J.ULTRAMIC.2018.03.013
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Strain Anisotropy and Magnetic Domains in Embedded Nanomagnets”. Nord M, Semisalova A, Kákay A, Hlawacek G, MacLaren I, Liersch V, Volkov OM, Makarov D, Paterson GW, Potzger K, Lindner J, Fassbender J, McGrouther D, Bali R, Small , 1904738 (2019). http://doi.org/10.1002/smll.201904738
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Strain mapping around dislocations in diamond and cBN”. Willems B, Nistor L, Ghica C, Van Tendeloo G, Physica status solidi: A: applied research 202, 2224 (2005). http://doi.org/10.1002/pssa.200561923
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Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy”. Cooper D, Le Royer C, Béché, A, Rouvière J-L, Applied Physics Letters 100, 233121 (2012). http://doi.org/10.1063/1.4723572
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Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope”. Cooper D, Denneulin T, Bernier N, Béché, A, Rouvière J-L, Micron 80, 145 (2016). http://doi.org/10.1016/J.MICRON.2015.09.001
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Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy”. Cooper D, Denneulin T, Barnes J-P, Hartmann J-M, Hutin L, Le Royer C, Béché, A, Rouvière J-L, Applied Physics Letters 112, 124505 (2012). http://doi.org/10.1063/1.4767925
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