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“Towards Reproducible and Transparent Science of (Big) Electron Microscopy Data Using Version Control”. Nord M, Verbeeck J, Microscopy and microanalysis
T2 –, Microscopy &, Microanalysis 2019, 4-8 August, 2019, Portland, Oregon 25, 232 (2019). http://doi.org/10.1017/S1431927619001892
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
Impact Factor: 1.891
DOI: 10.1017/S1431927619001892
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Nord M, Verbeeck J (2019) Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis. 138–139
Keywords: P3; Electron Microscopy for Materials Science (EMAT) ;
Impact Factor: 1.891
DOI: 10.1017/S1431927619001429
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“Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial”. Pennycook TJ, Martinez GT, O'Leary CM, Yang H, Nellist PD, Microscopy and microanalysis 25, 2684 (2019). http://doi.org/10.1017/S1431927619014156
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
DOI: 10.1017/S1431927619014156
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“Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale”. MacArthur KE, Yankovich AB, Béché, A, Luysberg M, Brown HG, Findlay SD, Heggen M, Allen LJ, Microscopy And Microanalysis , 1 (2021). http://doi.org/10.1017/S1431927621000246
Abstract: The invention of silicon drift detectors has resulted in an unprecedented improvement in detection efficiency for energy-dispersive X-ray (EDX) spectroscopy in the scanning transmission electron microscope. The result is numerous beautiful atomic-scale maps, which provide insights into the internal structure of a variety of materials. However, the task still remains to understand exactly where the X-ray signal comes from and how accurately it can be quantified. Unfortunately, when crystals are aligned with a low-order zone axis parallel to the incident beam direction, as is necessary for atomic-resolution imaging, the electron beam channels. When the beam becomes localized in this way, the relationship between the concentration of a particular element and its spectroscopic X-ray signal is generally nonlinear. Here, we discuss the combined effect of both spatial integration and sample tilt for ameliorating the effects of channeling and improving the accuracy of EDX quantification. Both simulations and experimental results will be presented for a perovskite-based oxide interface. We examine how the scattering and spreading of the electron beam can lead to erroneous interpretation of interface compositions, and what approaches can be made to improve our understanding of the underlying atomic structure.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.891
DOI: 10.1017/S1431927621000246
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“Fast electron low dose tomography for beam sensitive materials”. Esteban DA, Vanrompay H, Skorikov A, Béché, A, Verbeeck J, Freitag B, Bals S, Microscopy And Microanalysis 27, 2116 (2021). http://doi.org/10.1017/S1431927621007649
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.891
DOI: 10.1017/S1431927621007649
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“Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets”. Ning S, Xu W, Ma Y, Loh L, Pennycook TJ, Zhou W, Zhang F, Bosman M, Pennycook SJ, He Q, Loh ND, Microscopy and microanalysis , 1 (2022). http://doi.org/10.1017/S1431927622000320
Abstract: Accurate geometrical calibration between the scan coordinates and the camera coordinates is critical in four-dimensional scanning transmission electron microscopy (4D-STEM) for both quantitative imaging and ptychographic reconstructions. For atomic-resolved, in-focus 4D-STEM datasets, we propose a hybrid method incorporating two sub-routines, namely a J-matrix method and a Fourier method, which can calibrate the uniform affine transformation between the scan-camera coordinates using raw data, without a priori knowledge about the crystal structure of the specimen. The hybrid method is found robust against scan distortions and residual probe aberrations. It is also effective even when defects are present in the specimen, or the specimen becomes relatively thick. We will demonstrate that a successful geometrical calibration with the hybrid method will lead to a more reliable recovery of both the specimen and the electron probe in a ptychographic reconstruction. We will also show that, although the elimination of local scan position errors still requires an iterative approach, the rate of convergence can be improved, and the residual errors can be further reduced if the hybrid method can be firstly applied for initial calibration. The code is made available as a simple-to-use tool to correct affine transformations of the scan-camera coordinates in 4D-STEM experiments.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.8
DOI: 10.1017/S1431927622000320
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“Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM”. De wael A, De Backer A, Yu C-P, Sentürk DG, Lobato I, Faes C, Van Aert S, Microscopy and microanalysis , 1 (2022). http://doi.org/10.1017/S1431927622012284
Abstract: A decade ago, a statistics-based method was introduced to count the number of atoms from annular dark-field scanning transmission electron microscopy (ADF STEM) images. In the past years, this method was successfully applied to nanocrystals of arbitrary shape, size, and composition (and its high accuracy and precision has been demonstrated). However, the counting results obtained from this statistical framework are so far presented without a visualization of the actual uncertainty about this estimate. In this paper, we present three approaches that can be used to represent counting results together with their statistical error, and discuss which approach is most suited for further use based on simulations and an experimental ADF STEM image.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.8
DOI: 10.1017/S1431927622012284
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“Tomography using annular dark field imaging in TEM”. Bals S, Kisielowski C, Croitoru M, Van Tendeloo G, Microscopy and microanalysis 11, 2118 (2005)
Keywords: A3 Journal article; Condensed Matter Theory (CMT); Electron microscopy for materials research (EMAT)
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“Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM”. Jones L, Martinez GT, Béché, A, Van Aert S, Nellist PD, Microscopy and microanalysis 20, 126 (2014). http://doi.org/10.1017/S1431927614002359
Keywords: A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT)
Impact Factor: 1.891
DOI: 10.1017/S1431927614002359
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“Novel thin film lift-off process for in situ TEM tensile characterization”. Neelisetty KK, Kumar CN S, Kashiwar A, Scherer T, Chakravadhanula VSK, Kuebel C, Microscopy And Microanalysis 27, 216 (2021). http://doi.org/10.1017/S1431927621001367
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 1.891
DOI: 10.1017/S1431927621001367
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