| Author |
Title |
Year |
Publication |
Volume |
Times cited  |
Additional Links |
| Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C. |
EM study of sensitisation of silver halide grains |
1994 |
Icem |
13 |
|
UA library record; WoS full record; |
| Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
EM study of twinning in the Ni5Al3 bainitic phase |
1993 |
Twinning in advanced materials |
|
|
UA library record; WoS full record; |
| Leys, F.E.; March, N.H.; Lamoen, D.; van Doren, V.E. |
Equations of state of tantalum and plutonium in a spherical cell approximation and at extremely high pressures |
2002 |
|
22 |
|
UA library record; WoS full record; WoS citing articles |
| Mishra, R.S.K.; Pandey, D.; Lemmens, H.; Van Tendeloo, G. |
Evidence for another low-temperature phase transition in tetragonal Pb(ZrxTi1-x)O3 (x=0.515,0.520) |
2001 |
Physical review : B : condensed matter and materials physics |
64 |
|
UA library record; WoS full record; WoS citing articles |
| Cao, S.; Nishida, M.; Schryvers, D. |
FIB/SEM applied to quantitative 3D analysis of precipitates in Ni-Ti |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
|
UA library record; WoS full record |
| Van Tendeloo, G.; Richard, O.; Schuddinck, W.; Hervieu, M. |
Fine structure of CMR perovskites by HREM and CBEM |
1998 |
Electron microscopy: vol. 1 |
|
|
UA library record; WoS full record; |
| Rosenauer, A.; Schowalter, M.; Glas, F.; Lamoen, D. |
First-principles calculations of 002 structure factors for electron scattering in strained InxGa1-xAs |
2005 |
|
107 |
|
UA library record; WoS full record; |
| Lexcellent, C.; Vivet, A.; Bouvet, C.; Blanc, P.; Satto, C.; Schryvers, D. |
From the lattice measurements of the austenite and the martensite cells to the macroscopic mechanical behavior of shape memory alloys |
2001 |
Journal de physique: 4 |
11 |
|
UA library record; WoS full record; WoS citing articles |
| Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Le Tanner |
HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys (Invited) |
1994 |
|
|
|
UA library record; WoS full record; |
| Nistor, L.; Bender, H.; van Landuyt, J.; Nemeth, S.; Boeve, H.; De Boeck, J.; Borghs, G. |
HREM investigation of a Fe/GaN/Fe tunnel junction |
2001 |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England |
|
|
UA library record; WoS full record; |
| Lebedev, O.; Van Tendeloo, G.; Amelinckx, S.; Leibold, B.; Habermeier, H.U. |
HREM investigation of La(1-x)Ca(x)MnO3-delta thin films |
1998 |
|
|
|
UA library record; WoS full record; |
| Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S.; Leibold, B.; Habermeier, H.-U. |
HREM investigation of La1-xCaxMnO3- thin films |
1998 |
Electron microscopy: vol. 2 |
|
|
UA library record; WoS full record; |
| Nistor, L.C.; van Landuyt, J.; Dincã, G. |
HREM of defects in cubic boron nitride single crystals |
1998 |
|
|
|
UA library record; WoS full record; |
| Bernaerts, D.; Zhang, X.; Zhang, X.; Van Tendeloo, G.; Vanlanduyt, J.; Amelinckx, S. |
HREM study of Rb6C60 and helical shaped carbon nanotubules |
1994 |
Sciences |
|
|
UA library record; WoS full record; |
| Xu, Q.; Zandbergen, H.W.; van Dyck, D. |
Imaging from atomic structure to electronic structure |
2012 |
Micron |
43 |
|
UA library record; WoS full record |
| van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. |
The influence of crystal thickness on the image tone |
2003 |
Journal of imaging science |
47 |
|
UA library record; WoS full record; WoS citing articles |
| Croitoru, M.D.; Gladilin, V.N.; Fomin, V.M.; Devreese, J.T.; Kemerink, M.; Koenraad, P.M.; Sauthoff, K.; Wolter, J.H. |
Influence of the characteristics of the STM-tip on the electroluminescence spectra |
2005 |
Physica. E: Low-dimensional systems and nanostructures |
27 |
|
UA library record; WoS full record |
| van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Bollen, D.; de Keyzer, R.; van Roost, C. |
Influence of twinning on the morphology of AgBr and AgCl microcrystals |
2001 |
The journal of imaging science and technology |
45 |
|
UA library record; WoS full record; WoS citing articles |
| Rembeza, S.I.; Loginov, V.A.; Svistova, T.V.; Podkopaeva, O.I.; Rembeza, E.S.; van Landuyt, J. |
Laser thermotreatment of the SnO2layers |
1998 |
Eurosensors XII, vols 1 and 2 |
|
|
UA library record; WoS full record; |
| Nihoul, G.; Leroux, C.; Cesari, C.; Van Tendeloo, G. |
Layered structures accomodating stoichiometry in M2X2O7 systems, as seen by diffraction and HREM |
1998 |
Electron microscopy: vol. 2 |
|
|
UA library record; WoS full record; |
| Van Tendeloo, G.; Lebedev, O.I.; Verbist, K.; Abakumov, A.M.; Shpanchenko, R.V.; Antipov, E.V.; Blank, D.H.A. |
The local structure of YBCO based materials by TEM |
1999 |
|
|
|
UA library record; WoS full record; |
| Zhang, M.-L.; March, N.H.; Peeters, A.; van Alsenoy, C.; Howard, I.; Lamoen, D.; Leys, F. |
Loss rate of a plasticizer in a nylon matrix calculated using macroscopic reaction-diffusion kinetics |
2003 |
Journal Of Applied Physics |
93 |
|
UA library record; WoS full record; |
| Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Microscopy of Semiconducting Materials |
107 |
|
UA library record; WoS full record; |
| Hervieu, M.; Michel, C.; Martin, C.; Huvé, M.; Van Tendeloo, G.; Maignan, A.; Pelloquin, D.; Goutenoire, F.; Raveau, B. |
Mécanismes de la non-stoechiométrie dans les nouveaux supraconducteurs à haute Tc |
1994 |
Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation |
4 |
|
UA library record; WoS full record; |
| Seo, J.W.; Perret, J.; Fompeyrine, J.; Loquet, J.-P.; Van Tendeloo, G. |
Microstructural investigation of a La1.9Sr0.1CuO4 thin film grown by MBE under a large compressive strain |
1998 |
Electron microscopy: vol. 2 |
|
|
UA library record; WoS full record; |
| Seo, J.W.; Perret, J.; Fompeyrine, J.; Van Tendeloo, G.; Loquet, J.-P. |
Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE |
1998 |
|
|
|
UA library record; WoS full record; |
| Potapov, P.L.; Schryvers, D.; Strijckers, H.; van Roost, C. |
Microstructural mechanism of development in photothermographic materials |
2003 |
The journal of imaging science and technology |
47 |
|
UA library record; WoS full record; WoS citing articles |
| Nistor, L.C.; Richard, O.; Zhao, O.; Bender, H.; Stesmans, A.; Van Tendeloo, G. |
A microstructural study of the thermal stability of atomic layer deposited Al2O3 thin films |
2003 |
Institute of physics conference series
T2 – Microscopy of semiconducting materials |
|
|
UA library record; WoS full record; |
| Prouteau, C.; Verbist, K.; Hamet, J.F.; Mercey, B.; Hervieu, M.; Raveau, B.; Van Tendeloo, G. |
Microstructure of α-axis oriented YBCO films on SrTiO3 substrates using a new template layer La4BaCu5O13 |
1997 |
Physica: C : superconductivity |
288 |
|
UA library record; WoS full record; |
| Verbist, K.; Tafuri, F.; Granozio, F.M.; Di Chiara, S.; Van Tendeloo, G. |
Microstructure of artificial [100] 45 degrees twist grain boundaries in YBa2Cu3O7-delta |
1998 |
Electron Microscopy 1998, Vol 2: Materials Science 1 |
|
|
UA library record; WoS full record; |
