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  Author Title Year Publication Volume Times cited (down) Additional Links Links
Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. Imaging TOF-SIMS for the surface analysis of silver halide microcrystals 2003 Applied surface science 203/204 7 UA library record; WoS full record; WoS citing articles doi
Wu, S.; van Daele, A.; Jacob, W.; Gijbels, R.; Verbeeck, A.; de Keyzer, R. Microanalysis of individual silver halide microcrystals 1993 Scanning microscopy 7 7 UA library record; WoS full record; WoS citing articles
Berezhnoi, S.; Kaganovich, I.; Misina, M.; Bogaerts, A.; Gijbels, R. Semianalytical description of nonlocal secondary electrons in a radio-frequency capacitively coupled plasma at intermediate pressures 1999 IEEE transactions plasma science 27 7 UA library record; WoS full record; WoS citing articles doi
Veldeman, E.; Van 't dack, L.; Gijbels, R.; Pentcheva, E. Sulfur species and associated trace elements in south-west Bulgarian thermal waters 1991 Applied geochemistry 6 7 UA library record; WoS full record; WoS citing articles
Held, A.; Taylor, P.; Ingelbrecht, C.; de Bièvre, P.; Broekaert, J.; van Straaten, M.; Gijbels, R. Determination of scandium in high-purity titanium using inductively coupled plasma mass spectrometry and glow discharge mass spectrometry as part of its certification as a reference material 1995 Journal of analytical atomic spectrometry 10 6 UA library record; WoS full record; WoS citing articles doi
Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy 1997 Journal of microscopy 188 6 UA library record; WoS full record; WoS citing articles
van Vaeck, L.; Poels, K.; de Nollin, S.; Hachimi, A.; Gijbels, R. Laser microprobe mass spectrometry: principle and applications in biology and medicine 1997 Cell biology international 21 6 UA library record; WoS full record; WoS citing articles doi
van Cleempoel, A.; Gijbels, R.; Zhu, D.; Claeys, M.; Richter, H.; Fonseca, A. Quantitative determination of C60 and C70 in soot extracts by high performance liquid chromatography and mass spectrometric characterization 1996 Fullerene science and technology 4 6 UA library record; WoS full record; WoS citing articles doi
Hellmuth, K.H.; Siitari-Kaupi, M.; Rauhala, E.; Johansson, B.; Zilliacus, R.; Gijbels, R.; Adriaens, A. Reactions of high FeO-olivine rock with groundwater and redox-sensitive elements studied by surface-analytical methods and autoradiography 1994 Materials Research Society symposium proceedings 333 6 UA library record; WoS full record; WoS citing articles
Martin, J.M.L.; François, J.P.; Gijbels, R. The rotational partition function of the symmetric top and the effect of K doubling thereon 1991 Chemical physics letters 187 6 UA library record; WoS full record; WoS citing articles
Verlinden, G.; Janssens, G.; Gijbels, R.; van Espen, P.; Geuens, I. Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis 1997 Analytical chemistry 69 6 UA library record; WoS full record; WoS citing articles doi
Lenaerts, J.; van Vaeck, L.; Gijbels, R.; Van Luppen, J. Comparison of mono- and polyatomic primary ions for the characterization of organic dye overlayers with static secondary ion mass spectrometry 2004 Rapid communications in mass spectrometry 18 5 UA library record; WoS full record; WoS citing articles doi
van Roy, W.; Struyf, H.; van Vaeck, L.; Gijbels, R.; Caravatti, P. Desorption-ionization of organic compounds studied by Fourier transform laser microprobe mass spectrometry 1994 Rapid communications in mass spectrometry 8 5 UA library record; WoS full record; WoS citing articles doi
Ignatova, V.A.; Lebedev, O.I.; Watjen, U.; van Vaeck, L.; van Landuyt, J.; Gijbels, R.; Adams, F. Metal and composite nanocluster precipitate formation in silicon dioxide implanted with Sb+ ions 2002 Journal of applied physics 92 5 UA library record; WoS full record; WoS citing articles pdf doi
Oleshko, V.P.; Brichkin, S.B.; Gijbels, R.; Jacob, W.A.; Razumov, V.F. Observation of exciton states in silver halide nanoparticles by cryo-electron spectroscopic imaging and electron energy-loss spectroscopy 1997 Mendeleev communications 7 5 UA library record; WoS full record; WoS citing articles
Gijbels, R.; Bogaerts, A. Recent trends in solids mass spectrometry: GDMS and other methods 1997 Fresenius' journal of analytical chemistry 359 5 UA library record; WoS full record; WoS citing articles doi
Oleshko, V.P.; van Daele, A.; Gijbels, R.H.; Jacob, W.A. Structural and analytical characterization of Ag(Br,I) nanocrystals by cryo-AEM techniques 1998 Journal of nanostructured materials 10 5 UA library record; WoS full record; WoS citing articles doi
Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Adams, F. Capabilities and limitations of Fourier transform laser microprobe mass spectrometry for molecular analysis of solids 2002 Vacuum 69 4 UA library record; WoS full record; WoS citing articles pdf doi
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas 1997 Journal of crystal growth 173 4 UA library record; WoS full record; WoS citing articles
Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A.; Xu, Y.-E.; Wang, S.-E.; Park, I.-Y.; Kang, T.-S. Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques 1998 Microscopy research and technique 42 4 UA library record; WoS full record; WoS citing articles doi
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. Comparative study of organic dyes with time-of-flight static secondary ion mass spectrometry and related techniques 2005 Journal of mass spectrometry 40 4 UA library record; WoS full record; WoS citing articles doi
Ignatova, V.A.; Conard, T.; Möller, W.; Vandervorst, W.; Gijbels, R. Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study 2004 Applied surface science 231/232 4 UA library record; WoS full record; WoS citing articles doi
Adriaens, A.; Goossens, D.; Pijpers, A.; Van Tendeloo, G.; Gijbels, R. Dissolution study of potassium feldspars using hydrothermally treated sanidine as an example 1999 Surface and interface analysis 27 4 UA library record; WoS full record; WoS citing articles doi
Ignatova, V.A.; Möller, W.; Conard, T.; Vandervorst, W.; Gijbels, R. Interpretation of TOF-SIMS depth profiles from ultrashallow high-k dielectric stacks assisted by hybrid collisional computer simulation 2005 Applied physics A : materials science & processing 81 4 UA library record; WoS full record; WoS citing articles doi
Yan, M.; Bogaerts, A.; Gijbels, R. Kinetic modeling of relaxation phenomena after photodetachment in a rf electronegative SiH4 discharge 2001 Physical review : E : statistical physics, plasmas, fluids, and related interdisciplinary topics 63 4 UA library record; WoS full record; WoS citing articles url doi
Verlinden, G.; Gijbels, R.; Geuens, I. Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals 1999 Journal of the American Society for Mass Spectrometry 10 4 UA library record; WoS full record; WoS citing articles doi
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. SIMS analysis of oxynitrides: evidence for nitrogen diffusion induced by oxygen flooding 2000 Surface and interface analysis 29 4 UA library record; WoS full record; WoS citing articles doi
Vandelannoote, R.; Blommaert, W.; Sadurski, A.; Van 'T Dack, L.; Gijbels, R.; Van Grieken, R.; Bosch, B.; Leleu, M.; Rochon, J.; Sarcia, C.; Sureau, J.F.; Trace-elemental anomalies in surface water near a small lead-zinc mineralization at Menez-Albot (Brittany, France) 1984 Journal of geochemical exploration 20 4 UA library record; WoS full record; WoS citing articles pdf doi
van Cleempoel, A.; Joutsensaari, J.; Kauppinen, E.; Gijbels, R.; Claeys, M. Aerosol synthesis and characterization of ultrafine fullerene particles 1998 Fullerene science and technology 6 3 UA library record; WoS full record; WoS citing articles doi
Luyten, W.; Volkov, V.V.; van Landuyt, J.; Amelinckx, S.; Férauge, C.; Gijbels, R.; Vasilev, M.G.; Shelyakin, A.A.; Lazarev, V.B. Electron microscopy and mass-spectrometry study of In0.72Ga0.28As0.62P0.38 lasers grown by liquid phase epitaxy 1993 Physica status solidi: A: applied research 140 3 UA library record; WoS full record; WoS citing articles doi
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