Author |
Title |
Year |
Publication |
Volume |
Times cited ![sorted by Times cited field, descending order (down)](img/sort_desc.gif) |
Additional Links |
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M. |
Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays |
1999 |
Applied physics letters |
75 |
481 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. |
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy |
2009 |
Ultramicroscopy |
109 |
166 |
UA library record; WoS full record; WoS citing articles |
Van Tendeloo, G.; Bals, S.; Van Aert, S.; Verbeeck, J.; van Dyck, D. |
Advanced electron microscopy for advanced materials |
2012 |
Advanced materials |
24 |
107 |
UA library record; WoS full record; WoS citing articles |
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
2005 |
Ultramicroscopy |
104 |
70 |
UA library record; WoS full record; WoS citing articles |
van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. |
Correction of non-linear thickness effects in HAADF STEM electron tomography |
2012 |
Ultramicroscopy |
116 |
67 |
UA library record; WoS full record; WoS citing articles |
Ferroni, M.; Carotta, M.C.; Guidi, V.; Martinelli, G.; Ronconi, F.; Richard, O.; van Dyck, D.; van Landuyt, J. |
Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application |
2000 |
Sensors and actuators : B : chemical |
68 |
51 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative |
2006 |
Optics express |
14 |
45 |
UA library record; WoS full record; WoS citing articles |
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. |
Plasmon holographic experiments: theoretical framework |
2005 |
Ultramicroscopy |
102 |
43 |
UA library record; WoS full record; WoS citing articles |
Verbeeck, J.; van Dyck, D.; Van Tendeloo, G. |
Energy-filtered transmission electron microscopy: an overview |
2004 |
Spectrochimica acta: part B : atomic spectroscopy |
59 |
37 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
2005 |
Ultramicroscopy |
104 |
37 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
Optimal experimental design of STEM measurement of atom column positions |
2002 |
Ultramicroscopy |
90 |
35 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
High-resolution electron microscopy and electron tomography: resolution versus precision |
2002 |
Journal of structural biology |
138 |
33 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. |
Electron channelling based crystallography |
2007 |
Ultramicroscopy |
107 |
32 |
UA library record; WoS full record; WoS citing articles |
Lobato, I.; Van Dyck, D. |
MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA |
2015 |
Ultramicroscopy |
156 |
32 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. |
Advanced electron crystallography through model-based imaging |
2016 |
IUCrJ |
3 |
30 |
UA library record; WoS full record; WoS citing articles |
Schalm, O.; van der Linden, V.; Frederickx, P.; Luyten, S.; van der Snickt, G.; Caen, J.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. |
Enamels in stained glass windows: preparation, chemical composition, microstructure and causes of deterioration |
2009 |
Spectrochimica acta: part B : atomic spectroscopy |
64 |
28 |
UA library record; WoS full record; WoS citing articles |
Potapov, P.; Lichte, H.; Verbeeck, J.; van Dyck, D. |
Experiments on inelastic electron holography |
2006 |
Ultramicroscopy |
106 |
28 |
UA library record; WoS full record; WoS citing articles |
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. |
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? |
2003 |
Ultramicroscopy |
98 |
26 |
UA library record; WoS full record; WoS citing articles |
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
Direct structure inversion from exit waves: part 1: theory and simulations |
2010 |
Ultramicroscopy |
110 |
25 |
UA library record; WoS full record; WoS citing articles |
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. |
Does a monochromator improve the precision in quantitative HRTEM? |
2001 |
Ultramicroscopy |
89 |
22 |
UA library record; WoS full record; WoS citing articles |
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. |
On the interpretation of HREM images of partially ordered alloys |
1995 |
Ultramicroscopy |
60 |
20 |
UA library record; WoS full record; WoS citing articles |
Lobato Hoyos, I.P.; van Dyck, D. |
An accurate parameterization for scattering factors, electron densities and electrostatic potentials for neutral atoms that obey all physical constraints |
2014 |
Acta crystallographica: section A: foundations of crystallography |
70 |
19 |
UA library record; WoS full record; WoS citing articles |
Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. |
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images |
2006 |
Ultramicroscopy |
106 |
18 |
UA library record; WoS full record; WoS citing articles |
Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: 1: theoretical framework |
1992 |
Ultramicroscopy |
41 |
17 |
UA library record; WoS full record; WoS citing articles |
van den Broek, W.; Van Aert, S.; van Dyck, D. |
A model based atomic resolution tomographic algorithm |
2009 |
Ultramicroscopy |
109 |
17 |
UA library record; WoS full record; WoS citing articles |
van den Broek, W.; Van Aert, S.; van Dyck, D. |
A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
16 |
UA library record; WoS full record; WoS citing articles |
van den Broek, W.; Van Aert, S.; van Dyck, D. |
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency |
2012 |
Microscopy and microanalysis |
18 |
15 |
UA library record; WoS full record; WoS citing articles |
De Meulenaere, P.; van Dyck, D.; Van Tendeloo, G.; van Landuyt, J. |
Dynamical electron diffraction in substitutionally disordered column structures |
1995 |
Ultramicroscopy |
60 |
14 |
UA library record; WoS full record; WoS citing articles |
Luyten, W.; Krekels, T.; Amelinckx, S.; Van Tendeloo, G.; van Dyck, D.; van Landuyt, J. |
Electron diffraction effects of conical, helically wound, graphite whiskers |
1993 |
Ultramicroscopy |
49 |
14 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; den Dekker, A.J.; van Dyck, D. |
How to optimize the experimental design of quantitative atomic resolution TEM experiments? |
2004 |
Micron |
35 |
14 |
UA library record; WoS full record; WoS citing articles |