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Tailoring microstructure and superconducting properties in thick BaHfO3 and Ba2YNb/Ta)O-6 doped YBCO films on technical templates”. Sieger M, Pahlke P, Lao M, Eisterer M, Meledin A, Van Tendeloo G, Ottolinger R, Haenisch J, Holzapfel B, Usoskin A, Kursumovic A, MacManus-Driscoll JL, Stafford BH, Bauer M, Nielsch K, Schultz L, Huehne R, IEEE transactions on applied superconductivity 27, 6601407 (2017). http://doi.org/10.1109/TASC.2016.2644858
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Tilted BaHfO3 nanorod artificial pinning centres in REBCO films on inclined substrate deposited-MgO coated conductor templates”. Stafford BH, Sieger M, Ottolinger R, Meledin A, Strickland NM, Wimbush SC, Van Tendeloo G, Huehne R, Schultz L, Superconductor science and technology 30, 055002 (2017). http://doi.org/10.1088/1361-6668/AA621D
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Time evolution studies of dithieno[3,2-b:2 ',3 '-d] pyrrole-based A-D-A oligothiophene bulk heterojunctions during solvent vapor annealing towards optimization of photocurrent generation”. Ben Dkhil S, Pfannmöller M, Ata I, Duche D, Gaceur M, Koganezawa T, Yoshimoto N, Simon J-J, Escoubas L, Videlot-Ackermann C, Margeat O, Bals S, Bauerle P, Ackermann J, Journal of materials chemistry A : materials for energy and sustainability 5, 1005 (2017). http://doi.org/10.1039/C6TA08175D
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Toward an understanding of the electric field-induced electrostatic doping in van der Waals heterostructures : a first-principles study”. Lu AKA, Houssa M, Radu IP, Pourtois G, ACS applied materials and interfaces 9, 7725 (2017). http://doi.org/10.1021/ACSAMI.6B14722
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Toward high-temperature stability of PTB7-based bulk heterojunction solar cells : impact of fullerene size and solvent additive”. Ben Dkhil S, Pfannmöller M, Saba MI, Gaceur M, Heidari H, Videlot-Ackermann C, Margeat O, Guerrero A, Bisquert J, Garcia-Belmonte G, Mattoni A, Bals S, Ackermann J, Laser physics review 7, 1601486 (2017). http://doi.org/10.1002/AENM.201601486
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Huygh S (2017) Towards a fundamental understanding of plasma : TiO2 catalyst interaction for greenhouse gas conversion. Universiteit Antwerpen, Antwerpen
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Unusual lattice vibration characteristics in whiskers of the pseudo-one-dimensional titanium trisulfide TiS3”. Wu K, Torun E, Sahin H, Chen B, Fan X, Pant A, Wright DP, Aoki T, Peeters FM, Soignard E, Tongay S, Nature communications 7, 12952 (2016). http://doi.org/10.1038/NCOMMS12952
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Velocimetry of superconducting vortices based on stroboscopic resonances”. Jelić, ZL, Milošević, MV, Silhanek AV, Scientific reports 6, 35687 (2016). http://doi.org/10.1038/SREP35687
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Wall ablation of heated compound-materials into non-equilibrium discharge plasmas”. Wang W, Kong L, Geng J, Wei F, Xia G, Journal of physics: D: applied physics 50, 074005 (2017). http://doi.org/10.1088/1361-6463/AA5606
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Paria Sena R (2017) Structure characterization of triple perovskites and related systems by transmission electron microscopy. Antwerpen
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Thickness-dependent transport properties of Sr4Fe6O13 epitaxial thin films”. Pardo JA, Santiso J, Solis C, Garcia G, Figueras A, Rossell MD, Solid state ionics 177, 423 (2006). http://doi.org/10.1016/J.SSI.2005.11.024
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Towards rapid nanoscale measurement of strain in III-nitride heterostructures”. Jones E, Cooper D, Rouvière J-L, Béché, A, Azize M, Palacios T, Gradecak S, Applied Physics Letters 103, 231904 (2013). http://doi.org/10.1063/1.4838617
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Interplay of strain and indium incorporation in InGaN/GaN dot-in-a-wire nanostructures by scanning transmission electron microscopy”. Woo SY, Gauquelin N, Nguyen HPT, Mi Z, Botton GA, Nanotechnology 26, 344002 (2015). http://doi.org/10.1088/0957-4484/26/34/344002
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Meledin A (2017) Nanostructure of superconducting tapes : a study by electron microscopy. Antwerp
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Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits?”.de Backer A, De wael A, Gonnissen J, Martinez GT, Béché, A, MacArthur KE, Jones L, Nellist PD, Van Aert S, Journal of physics : conference series 644, 012034 (2015). http://doi.org/10.1088/1742-6596/644/012034
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Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography”. Cooper D, Rouvière J-L, Béché, A, Kadkhodazadeh S, Semenova ES, Dunin-Borkowsk R, Applied physics letters 99, 261911 (2011). http://doi.org/10.1063/1.3672194
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The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography”. Denneulin T, Rouvière JL, Béché, A, Py M, Barnes JP, Rochat N, Hartmann JM, Cooper D, Semiconductor science and technology 26, 1 (2011). http://doi.org/10.1088/0268-1242/26/12/125010
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Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy”. Cooper D, Le Royer C, Béché, A, Rouvière J-L, Applied Physics Letters 100, 233121 (2012). http://doi.org/10.1063/1.4723572
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Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy”. Cooper D, Denneulin T, Barnes J-P, Hartmann J-M, Hutin L, Le Royer C, Béché, A, Rouvière J-L, Applied Physics Letters 112, 124505 (2012). http://doi.org/10.1063/1.4767925
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Effect of straining graphene on nanopore creation using Si cluster bombardment: A reactive atomistic investigation”. Berdiyorov GR, Mortazavi B, Ahzi S, Peeters FM, Khraisheh MK, Journal of applied physics 120, 225108 (2016). http://doi.org/10.1063/1.4971767
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1D-2D-3D Transformation Synthesis of Hierarchical Metal-Organic Framework Adsorbent for Multicomponent Alkane Separation”. Wee LH, Meledina M, Turner S, Van Tendeloo G, Zhang K, Marleny Rodriguez-Albelo L, Masala A, Bordiga S, Jiang J, Navarro JAR, Kirschhock CEA, Martens JA, Journal of the American Chemical Society 139, 819 (2017). http://doi.org/10.1021/JACS.6B10768
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The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data”. Van Aert S, Bals S, Chang LY, den Dekker AJ, Kirkland AI, Van Dyck D, Van Tendeloo G Springer, Berlin, page 97 (2008).
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Ciliary white light generated during femtosecond laser ablation on transparent dielectrics”. Liu Y, Brelet Y, He Z, Yu L, Mitryukovskiy S, Houard A, Forestier B, Couairon A, Mysyrowicz A, 2013 Conference On And International Quantum Electronics Conference Lasers And Electro-optics Europe (cleo Europe/iqec) (2013)
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An interactive curvature based rigid-body image registartion technique: an application of EFTEM”. Leemans A, Sijbers J, van den Broek W, Yang Z, (2004)
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Improved strain precision with high spatial resolution using nanobeam precession electron diffraction”. Rouvière J-L, Béché, A, Martin Y, Denneulin T, Cooper D, Applied physics letters 103, 241913 (2013). http://doi.org/10.1063/1.4829154
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Advanced turbulence models and boundary conditions for flows around different configurations of ground-mounted buildings”. Longo R, Ferrarotti M, Garcia Sánchez C, Derudi M, Parente A, Journal of wind engineering and industrial aerodynamics 167, 160 (2017). http://doi.org/10.1016/J.JWEIA.2017.04.015
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Cobalt location in p-CoOxIn-SnO2 nanocomposites : correlation with gas sensor performances”. Vladimirova SA, Rumyantseva MN, Filatova DG, Chizhov AS, Khmelevsky NO, Konstantinova EA, Kozlovsky VF, Marchevsky AV, Karakulina OM, Hadermann J, Gaskov AM, Journal of alloys and compounds 721, 249 (2017). http://doi.org/10.1016/JJALLCOM.2017.05.332
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Density functional theory study of interface interactions in hydroxyapatite/rutile composites for biomedical applications”. Grubova IY, Surmeneva MA, Huygh S, Surmenev RA, Neyts EC, The journal of physical chemistry: C : nanomaterials and interfaces 121, 15687 (2017). http://doi.org/10.1021/ACS.JPCC.7B02926
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Excitons and trions in monolayer transition metal dichalcogenides : a comparative study between the multiband model and the quadratic single-band model”. Van der Donck M, Zarenia M, Peeters FM, Physical review B 96, 035131 (2017). http://doi.org/10.1103/PHYSREVB.96.035131
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Gate induced monolayer behavior in twisted bilayer black phosphorus”. Sevik C, Wallbank JR, Gulseren O, Peeters FM, Çakir D, 2D materials 4, 035025 (2017). http://doi.org/10.1088/2053-1583/AA80C4
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