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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Hervieu, M.; Michel, C.; Martin, C.; Huvé, M.; Van Tendeloo, G.; Maignan, A.; Pelloquin, D.; Goutenoire, F.; Raveau, B. |
Mécanismes de la non-stoechiométrie dans les nouveaux supraconducteurs à haute Tc |
1994 |
Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation |
4 |
|
UA library record; WoS full record; |
|
|
Guzzinati, G.; Clark, L.; Béché, A.; Verbeeck, J. |
Measuring the orbital angular momentum of electron beams |
2014 |
Physical review : A : atomic, molecular and optical physics |
89 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
Kirilenko, D.A.; Dideykin, A.T.; Van Tendeloo, G. |
Measuring the corrugation amplitude of suspended and supported graphene |
2011 |
Physical review : B : condensed matter and materials physics |
84 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
Potapov, P.L.; Schryvers, D. |
Measuring the absolute position of EELS ionisation edges in a TEM |
2004 |
Ultramicroscopy |
99 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
Schryvers, D.; Tirry, W.; Yang, Z.Q.; |
Measuring strain fields and concentration gradients around Ni4Ti3 precipitates |
2006 |
Materials science and engineering A: structural materials properties microstructure and processing |
438 |
35 |
UA library record; WoS full record; WoS citing articles |
|
|
van der Burgt, M.; Peeters, F.M.; Singleton, J.; Nicholas, R.J.; Herlach, F.; Harris, J.J.; Foxon, C.T. |
Measuring quantum Hall resistors in pulsed magnetic fields |
1995 |
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|
|
UA library record |
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Biermans, E.; Molina, L.; Batenburg, K.J.; Bals, S.; Van Tendeloo, G. |
Measuring porosity at the nanoscale by quantitative electron tomography |
2010 |
Nano letters |
10 |
79 |
UA library record; WoS full record; WoS citing articles |
|
|
Felten, A.; Gillon, X.; Gulas, M.; Pireaux, J.-J.; Ke, X.; Van Tendeloo, G.; Bittencourt, C.; Najafi, E.; Hitchcock, A.P. |
Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy |
2010 |
ACS nano |
4 |
26 |
UA library record; WoS full record; WoS citing articles |
|
|
Goris, B.; de Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, K.J.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Aert, S.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
Measuring lattice strain in three dimensions through electron microscopy |
2015 |
Nano letters |
15 |
87 |
UA library record; WoS full record; WoS citing articles |
|
|
Hendrich, C.; Favre, L.; Ievlev, D.N.; Dobrynin, A.N.; Bras, W.; Hörmann, U.; Piscopiello, E.; Van Tendeloo, G.; Lievens, P.; Temst, K. |
Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering |
2007 |
Applied physics A : materials science & processing |
86 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R.; Waag, A. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Applied Physics Letters |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Microscopy of Semiconducting Materials |
107 |
|
UA library record; WoS full record; |
|
|
Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. |
Measurement of specimen thickness by phase change determination in TEM |
2008 |
Ultramicroscopy |
108 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
2005 |
Ultramicroscopy |
104 |
37 |
UA library record; WoS full record; WoS citing articles |
|
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den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
2005 |
Ultramicroscopy |
104 |
70 |
UA library record; WoS full record; WoS citing articles |
|
|
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films |
2005 |
Rapid communications in mass spectrometry |
19 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; van Straaten, M.; Gijbels, R. |
Mathematical modelling of an analytical glow discharge |
1995 |
|
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UA library record |
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Bogaerts, A. |
Mathematical modeling of a direct current glow discharge in argon |
1996 |
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UA library record |
|
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Bogaerts, A.; Gijbels, R. |
Mathematical description of a direct current glow discharge in argon |
1996 |
Fresenius' journal of analytical chemistry |
355 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
Adams, F.; Gijbels, R.; Jambers, W.; van Grieken, R. |
Mass spectrometry, inorganic |
1998 |
|
|
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UA library record |
|
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Adriaens, A.; Van 't dack, L.; Adams, F.; Gijbels, R. |
A mass spectrometric study of the dissolution behavior of sanidine |
1995 |
Microchimica acta |
120 |
1 |
UA library record; WoS full record; WoS citing articles |
|
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Gijbels, R.; van Straaten, M.; Bogaerts, A. |
Mass spectrometric analysis of inorganic solids: GDMS and other methods |
1995 |
Advances in mass spectrometry |
13 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
Vodolazov, D.Y.; Peeters, F.M.; Morelle, M.; Moshchalkov, V.V. |
Masking effect of heat dissipation on the current-voltage characteristics of a mesoscopic superconducting sample with leads |
2005 |
Physical review : B : condensed matter and materials physics |
71 |
43 |
UA library record; WoS full record; WoS citing articles |
|
|
Schryvers, D.; Boullay, P.; Potapov, P.; Satto, C. |
Martensitic transformations studied on nano- and microscopic length scales |
2000 |
Festkörperprobleme |
40 |
|
UA library record |
|
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Schryvers, D.; Holland-Moritz, D. |
Martensitic transformations and microstructures in splat-cooled Ni-Al |
1999 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
273/275 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
Zhang, H.; Salje, E.K.H.; Schryvers, D.; Bartova, B. |
The martensitic phase transition in Ni-Al: experimental observation of excess entropy and heterogeneous spontaneous strain |
2008 |
Journal of physics : condensed matter |
20 |
7 |
UA library record; WoS full record; WoS citing articles |
|
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Schryvers, D. |
Martensitic and related transformations in Ni-Al alloys |
1995 |
Journal de physique: 4
T2 – IIIrd European Symposium on Martensitic Transformations (ESOMAT 94), SEP 14-16, 1994, BARCELONA, SPAIN |
5 |
21 |
UA library record; WoS full record; WoS citing articles |
|
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Schryvers, D. |
Martensitic and bainitic transformations in Ni-Al alloys |
1994 |
Journal de physique: 4 |
C2 |
|
UA library record |
|
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Schattschneider, P.; Schaffer, B.; Ennen, I.; Verbeeck, J. |
Mapping spin-polarized transitions with atomic resolution |
2012 |
Physical review : B : condensed matter and materials physics |
85 |
41 |
UA library record; WoS full record; WoS citing articles |
|
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Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. |
Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures |
2013 |
Physical review : B : condensed matter and materials physics |
88 |
15 |
UA library record; WoS full record; WoS citing articles |
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