Records |
Author |
Somogyi, A.; Drakopoulos, M.; Vincze, L.; Vekemans, B.; Camerani, C.; Janssens, K.; Snigirev, A.; Adams, F. |
Title |
ID18F: a new micro-X-ray fluorescence end-station at the European Synchrotron Radiation Facility (ESRF): preliminary results |
Type |
A1 Journal article |
Year |
2001 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
30 |
Issue |
|
Pages |
242-252 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000170089700006 |
Publication Date |
2002-09-11 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
76 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 2001 IF: 1.414 |
Call Number |
UA @ admin @ c:irua:34062 |
Serial |
5647 |
Permanent link to this record |
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Author |
Storms, H.M.; Janssens, K.H.; Török, S.B.; Van Grieken, R.E. |
Title |
Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles |
Type |
A1 Journal article |
Year |
1989 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
18 |
Issue |
2 |
Pages |
45-52 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
The ArmstrongBuseck correction for absorption effects in electron probe x-ray microanalysis of particles considers seven specific particle shapes, and for these geometries exact correction equations are used. This procedure implies that the analyst has to associate the particle to be analysed with a certain particle type; an arbitrary relative thickness is sometimes assumed. A theoretical study was made of this absorption correction as a function of the particle composition, type and thickness for micrometre-sized particles. It appears that a correct choice of the particle type is critical. However, when the analytical results are normalized to 100%, the differences between the models are much less pronounced, and it is justified to assume a spherical model in all cases. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
A1989U261400001 |
Publication Date |
2005-05-28 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:116489 |
Serial |
5616 |
Permanent link to this record |
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Author |
Bichlmeier, S.; Janssens, K.; Heckel, J.; Gibson, D.; Hoffmann, P.; Ortner, H.M. |
Title |
Component selection for a compact micro-XRF spectrometer |
Type |
A1 Journal article |
Year |
2001 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
30 |
Issue |
|
Pages |
8-14 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000166923700003 |
Publication Date |
2002-08-25 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
33 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 2001 IF: 1.414 |
Call Number |
UA @ admin @ c:irua:36126 |
Serial |
5534 |
Permanent link to this record |
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Author |
Bichlmeier, S.; Janssens, K.; Heckel, J.; Hoffmann, P.; Ortner, H.M. |
Title |
Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer |
Type |
A1 Journal article |
Year |
2002 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
31 |
Issue |
1 |
Pages |
87-91 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000173653400016 |
Publication Date |
2002-10-06 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
12 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 2002 IF: 1.574 |
Call Number |
UA @ admin @ c:irua:36670 |
Serial |
5529 |
Permanent link to this record |
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Author |
van der Linden, V.; Schalm, O.; Houbraken, J.; Thomas, M.; Meesdom, E.; Devos, A.; van Dooren, R.; Nieuwdorp, H.; Janssen, E.; Janssens, K. |
Title |
Chemical analysis of 16th to 19th century Limoges School painted enamel objects in three museums of the Low Countries |
Type |
A1 Journal article |
Year |
2010 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
39 |
Issue |
2 |
Pages |
112-121 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
In this study, the results of analysing of a series of 16th-19th century painted enamel objects of the Limoges School currently in collections in three Dutch and Flemish museums by means of portable and micro x-ray fluorescence analysis (PXRF and µ-XRF) and electron probe micro analysis (EPMA) are presented. The aim of the investigation was the authentication of specific pieces. Therefore, the glass compositions as well as the (glass) colouring agents used by the Limoges' artists were studied as a function of the age of the objects. Due to the evolution of these properties, it is possible to approximately date these objects based on their chemical composition. The complete émail peint collection of the Museum Boijmans-Van Beuningen (Rotterdam, The Netherlands), consisting of 20 émail peint plaques, was analysed with µ-XRF. Quantitative information was obtained by EPMA analysis of 15 enamel fragments of objects from museum and private collections in the Low Countries. PXRF analyses were performed on the painted enamel collection of the Antwerp Vleeshuis Museum (13 objects) and the Mayer van den Bergh Museum (4 objects) and on a set of 18 plaques that were donated to the Boijmans-Van Beuningen Museum by a private collector. The results obtained by means of EPMA, µ-XRF and PXRF proved to be useful in the discrimination of 16th century painted enamel objects from those of the19th century. From a total of 70 objects examined, 2 objects (OM964A and OM993) featured a chemical signature that deviated from the published literature composition and pigment use consistent with its presumed period of manufacture. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000275959400007 |
Publication Date |
2009-08-11 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
8 |
Open Access |
|
Notes |
; ; |
Approved |
Most recent IF: 1.298; 2010 IF: 1.661 |
Call Number |
UA @ admin @ c:irua:82325 |
Serial |
5509 |
Permanent link to this record |
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Author |
Proost, K.; Vincze, L.; Janssens, K.; Gao, N.; Bulska, E.; Schreiner, M.; Falkenberg, G. |
Title |
Characterization of a polycapillary lens for use in micro-XANES experiments |
Type |
A1 Journal article |
Year |
2003 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
32 |
Issue |
3 |
Pages |
215-222 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000183630400007 |
Publication Date |
2003-06-12 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
50 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 2003 IF: 1.227 |
Call Number |
UA @ admin @ c:irua:41804 |
Serial |
5502 |
Permanent link to this record |
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Author |
Vekemans, B.; Janssens, K.; Vincze, L.; Aerts, A.; Adams, F.; Hertogen, J. |
Title |
Automated segmentation of μ-XRF image sets |
Type |
A1 Journal article |
Year |
1997 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
26 |
Issue |
|
Pages |
333-346 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
A1997YG79300005 |
Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 1997 IF: 1.307 |
Call Number |
UA @ admin @ c:irua:18319 |
Serial |
5486 |
Permanent link to this record |
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Author |
Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; van Espen, P. |
Title |
Analysis of X-ray spectra by iterative least squares (AXIL): new developments |
Type |
A1 Journal article |
Year |
1994 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
23 |
Issue |
|
Pages |
278-285 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
A1994QF68500008 |
Publication Date |
2005-05-28 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:8933 |
Serial |
5471 |
Permanent link to this record |
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Author |
Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Döcking, H. |
Title |
EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments |
Type |
A1 Journal article |
Year |
2004 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
33 |
Issue |
5 |
Pages |
326-333 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
London |
Editor |
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Language |
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Wos |
000223880800002 |
Publication Date |
2004-04-01 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246;1097-4539; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
13 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 2004 IF: 1.391 |
Call Number |
UA @ lucian @ c:irua:48786 |
Serial |
1076 |
Permanent link to this record |