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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Şentürk, D.G.; De Backer, A.; Van Aert, S. |
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination |
2024 |
Ultramicroscopy |
259 |
|
UA library record; WoS full record |
|
|
|
Gholam, S.; Hadermann, J. |
The effect of the acceleration voltage on the quality of structure determination by 3D-electron diffraction |
2024 |
Ultramicroscopy |
266 |
|
UA library record; WoS full record |
|
|
|
Poppe, R.; Hadermann, J. |
Optimization of three-dimensional electron diffuse scattering data acquisition |
2024 |
Ultramicroscopy |
265 |
|
UA library record; WoS full record |
|
|
|
van Landuyt, J. |
The evolution of HVEM application in antwerp |
1991 |
Ultramicroscopy
T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan |
39 |
|
UA library record; WoS full record |
|
|
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Dunin-Borkowski, R.E.; Lichte, H.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G. |
Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays |
2013 |
Ultramicroscopy |
134 |
1 |
UA library record; WoS full record; WoS citing articles |
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