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Magnetotransport in a pseudomorhic GaAs/Ga0.8In0.2As/Ga0.75Al0.25As heterostructure with a Si δ-doping layer”. van der Burgt M, Karavolas VC, Peeters FM, Singleton J, Nicholas RJ, Herlach F, Harris JJ, van Hove M, Borghs G, Physical review : B : condensed matter and materials physics 52, 12218 (1995)
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Magnetotransport in a pseudomorphic GaAs/Ga0.8In0.2As/Ga0.75Al0.25As heterostructure with a Si \delta-doping layer”. van der Burgt M, Karavolas VC, Peeters FM, Singleton J, Nicholas RJ, Herlach F, Harris JJ, Van Hove M, Borghs G, Physical review : B : condensed matter and materials physics 52, 12218 (1995). http://doi.org/10.1103/PhysRevB.52.12218
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Magnetotransport in periodically modulated bilayer graphene”. Zarenia M, Vasilopoulos P, Peeters FM, Physical review : B : condensed matter and materials physics 85, 245426 (2012). http://doi.org/10.1103/PhysRevB.85.245426
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Magnetotransport measurements on thin Ga1-xErxAs epitaxial films in pulsed magnetic fields”. Bogaerts R, van Bockstal L, Herlach F, Peeters FM, DeRosa F, Palmstrøm CJ, Allen SJ, Physica: B : condensed matter 177, 425 (1992). http://doi.org/10.1016/0921-4526(92)90142-F
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Magnetotransport properties of Si-δ-doped InSb layers grown on GaAs”. de Keyser A, Bogaerts R, van Bockstal L, Hoeks W, Herlach F, Karavolas VC, Peeters FM, van de Graaf W, Borghs G, Physica: B : condensed matter 211, 455 (1995). http://doi.org/10.1016/0921-4526(94)01092-F
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Magnetotunneling of holes through single and double barriers using a multiband treatment”. Krstajić, P, Peeters FM, Physical review : B : condensed matter and materials physics 71, 115321 (2005). http://doi.org/10.1103/PhysRevB.71.115321
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Majorana fermion states and fractional flux periodicity in mesoscopic d-wave superconducting loops with spin-orbit interaction”. Zha G-Q, Covaci L, Peeters FM, Zhou S-P, Physical review : B : condensed matter and materials physics 90, 014522 (2014). http://doi.org/10.1103/PhysRevB.90.014522
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Manipulation of two-electron states by the electric field in stacked self-assembled dots”. Nowak MP, Szafran B, Peeters FM, Journal of physics : condensed matter 20, 395225 (2008). http://doi.org/10.1088/0953-8984/20/39/395225
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Many-body effects in the cyclotron resonance of a magnetic dot”. Nguten NTT, Peeters FM, Physical review : B : solid state 80, 115335 (2009). http://doi.org/10.1103/PhysRevB.80.115335
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Many electron- and hole terms of molecular ions C60n\pm”. Nikolaev AV, Michel KH, Coupling In Chemistry And Physics 44, 305 (2003). http://doi.org/10.1016/S0065-3276(03)44019-7
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Martensitic and bainitic transformations in Ni-Al alloys”. Schryvers D, Journal de physique: 4 C2, 225 (1994)
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Martensitic and related transformations in Ni-Al alloys”. Schryvers D, Journal de physique: 4 T2 –, IIIrd European Symposium on Martensitic Transformations (ESOMAT 94), SEP 14-16, 1994, BARCELONA, SPAIN 5, 225 (1995). http://doi.org/10.1051/jp4:1995235
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The martensitic phase transition in Ni-Al: experimental observation of excess entropy and heterogeneous spontaneous strain”. Zhang H, Salje EKH, Schryvers D, Bartova B, Journal of physics : condensed matter 20, 055220 (2008). http://doi.org/10.1088/0953-8984/20/5/055220
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Martensitic transformations and microstructures in splat-cooled Ni-Al”. Schryvers D, Holland-Moritz D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 273/275, 697 (1999). http://doi.org/10.1016/S0921-5093(99)00399-8
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Martensitic transformations studied on nano- and microscopic length scales”. Schryvers D, Boullay P, Potapov P, Satto C, Festkörperprobleme 40, 375 (2000)
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Masking effect of heat dissipation on the current-voltage characteristics of a mesoscopic superconducting sample with leads”. Vodolazov DY, Peeters FM, Morelle M, Moshchalkov VV, Physical review : B : condensed matter and materials physics 71, 184502 (2005). http://doi.org/10.1103/PhysRevB.71.184502
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Mass spectrometric analysis of inorganic solids: GDMS and other methods”. Gijbels R, van Straaten M, Bogaerts A, Advances in mass spectrometry 13, 241 (1995)
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A mass spectrometric study of the dissolution behavior of sanidine”. Adriaens A, Van 't dack L, Adams F, Gijbels R, Microchimica acta 120, 139 (1995). http://doi.org/10.1007/BF01244427
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Mathematical description of a direct current glow discharge in argon”. Bogaerts A, Gijbels R, Fresenius' journal of analytical chemistry 355, 853 (1996)
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Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films”. Adriaensen L, Vangaever F, Lenaerts J, Gijbels R, Rapid communications in mass spectrometry 19, 1017 (2005). http://doi.org/10.1002/rcm.1881
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Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework”. den Dekker AJ, Van Aert S, van den Bos A, van Dyck D, Ultramicroscopy 104, 83 (2005). http://doi.org/10.1016/j.ultramic.2005.03.001
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Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example”. Van Aert S, den Dekker AJ, van den Bos A, van Dyck D, Chen JH, Ultramicroscopy 104, 107 (2005). http://doi.org/10.1016/j.ultramic.2005.03.002
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Measurement of specimen thickness by phase change determination in TEM”. Croitoru MD, van Dyck D, Liu YZ, Zhang Z, Ultramicroscopy 108, 1616 (2008). http://doi.org/10.1016/j.ultramic.2008.06.002
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Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering”. Hendrich C, Favre L, Ievlev DN, Dobrynin AN, Bras W, Hörmann U, Piscopiello E, Van Tendeloo G, Lievens P, Temst K, Applied physics A : materials science &, processing 86, 533 (2007). http://doi.org/10.1007/s00339-006-3808-5
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Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy”. Felten A, Gillon X, Gulas M, Pireaux J-J, Ke X, Van Tendeloo G, Bittencourt C, Najafi E, Hitchcock AP, ACS nano 4, 4431 (2010). http://doi.org/10.1021/nn1002248
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Measuring porosity at the nanoscale by quantitative electron tomography”. Biermans E, Molina L, Batenburg KJ, Bals S, Van Tendeloo G, Nano letters 10, 5014 (2010). http://doi.org/10.1021/nl103172r
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Measuring strain fields and concentration gradients around Ni4Ti3 precipitates”. Schryvers D, Tirry W, Yang ZQ;, Materials science and engineering A: structural materials properties microstructure and processing 438, 485 (2006). http://doi.org/10.1016/j.msea.2006.02.166
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Measuring the absolute position of EELS ionisation edges in a TEM”. Potapov PL, Schryvers D, Ultramicroscopy 99, 73 (2004). http://doi.org/10.1016/S0304-3991(03)00185-2
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Measuring the corrugation amplitude of suspended and supported graphene”. Kirilenko DA, Dideykin AT, Van Tendeloo G, Physical review : B : condensed matter and materials physics 84, 235417 (2011). http://doi.org/10.1103/PhysRevB.84.235417
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Mécanismes de la non-stoechiométrie dans les nouveaux supraconducteurs à, haute Tc”. Hervieu M, Michel C, Martin C, Huvé, M, Van Tendeloo G, Maignan A, Pelloquin D, Goutenoire F, Raveau B, Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation 4, 2057 (1994)
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