|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Bogaerts, A.; Gijbels, R. |
Effects of adding hydrogen to an argon glow discharge: overview of relevant processes and some qualitative explanations |
2000 |
Journal of analytical atomic spectrometry |
15 |
58 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Hybrid Monte Carlo-fluid model for a microsecond pulsed glow discharge |
2000 |
Journal of analytical atomic spectrometry |
15 |
23 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R.; Goedheer, W. |
Improved hybrid Monte Carlo-fluid model for the electrical characteristics in an analytical radiofrequency glow discharge in argon |
2001 |
Journal of analytical atomic spectrometry |
16 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Modeling of a microsecond pulsed glow discharge: behavior of the argon excited levels and of the sputtered copper atoms and ions |
2001 |
Journal of analytical atomic spectrometry |
16 |
36 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R.; Jackson, G.P. |
Modeling of a millisecond pulsed glow discharge: investigation of the afterpeak |
2003 |
Journal of analytical atomic spectrometry |
18 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Modeling of argon direct current glow discharges and comparison with experiment: how good is the agreement? |
1998 |
Journal of analytical atomic spectrometry |
13 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Relative sensitivity factors in glow discharge mass spectrometry: the role of charge transfer ionization |
1996 |
Journal of analytical atomic spectrometry |
11 |
38 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Similarities and differences between direct current and radio-frequency glow discharges: a mathematical simulation |
2000 |
Journal of analytical atomic spectrometry |
15 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1999 |
Journal of analytical atomic spectrometry |
14 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R.; Goedheer, W. |
Hybrid modeling of a capacitively coupled radio frequency glow discharge in argon: combined Monte Carlo and fluid model |
1999 |
Japanese journal of applied physics |
38 |
45 |
UA library record; WoS full record; WoS citing articles |
|
|
Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Adams, F. |
Molecular speciation of inorganic mixtures by Fourier transform laser microprobe mass sepctrometry |
2003 |
International journal of mass spectrometry |
225 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
Berezhnoi, S.; Kaganovich, I.; Misina, M.; Bogaerts, A.; Gijbels, R. |
Semianalytical description of nonlocal secondary electrons in a radio-frequency capacitively coupled plasma at intermediate pressures |
1999 |
IEEE transactions plasma science |
27 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
Yan, M.; Bogaerts, A.; Gijbels, R. |
Evolution of charged particle densities after laser-induced photodetachment in a strongly electronegative RF discharge |
2002 |
IEEE transactions on plasma science |
30 |
|
UA library record; WoS full record |
|
|
de Bleecker, K.; Bogaerts, A.; Goedheer, W.; Gijbels, R. |
Investigation of growth mechanisms of clusters in a silane discharge with the use of a fluid model |
2004 |
IEEE transactions on plasma science |
32 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Monte Carlo model for the argon ions and fast argon atoms in a radio-frequency discharge |
1999 |
IEEE transactions on plasma science |
27 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
Herrebout, D.; Bogaerts, A.; Gijbels, R.; Goedheer, W.J.; Vanhulsel, A. |
A one-dimensional fluid model for an acetylene rf discharge: a study of the plasma chemistry |
2003 |
IEEE transactions on plasma science |
31 |
26 |
UA library record; WoS full record; WoS citing articles |
|
|
Gijbels, R. |
Development of a Fourier transform laser microprobe mass spectrometer with external ion source |
1993 |
ICR/Ion trap newsletter |
30 |
|
UA library record |
|
|
van Cleempoel, A.; Joutsensaari, J.; Kauppinen, E.; Gijbels, R.; Claeys, M. |
Aerosol synthesis and characterization of ultrafine fullerene particles |
1998 |
Fullerene science and technology |
6 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
van Cleempoel, A.; Gijbels, R.; Zhu, D.; Claeys, M.; Richter, H.; Fonseca, A. |
Quantitative determination of C60 and C70 in soot extracts by high performance liquid chromatography and mass spectrometric characterization |
1996 |
Fullerene science and technology |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
Vandelannoote, R.; Blommaert, W.; Gijbels, R.; van Grieken, R. |
Analysis of geothermal waters by spark source mass spectrometry |
1981 |
Fresenius' Zeitschrift für analytische Chemie |
309 |
8 |
UA library record |
|
|
Robben, J.; Dufour, D.; Gijbels, R. |
Design and development of a new program for data processing of mass spectra acquired by means of a high-resolution double-focusing glow-discharge mass spectrometer |
2001 |
Fresenius' journal of analytical chemistry |
370 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Mathematical description of a direct current glow discharge in argon |
1996 |
Fresenius' journal of analytical chemistry |
355 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
Lenaerts, J.; Verlinden, G.; Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS) |
2001 |
Fresenius' journal of analytical chemistry |
370 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
New developments and applications in GDMS |
1999 |
Fresenius' journal of analytical chemistry |
364 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
Gijbels, R.; Bogaerts, A. |
Recent trends in solids mass spectrometry: GDMS and other methods |
1997 |
Fresenius' journal of analytical chemistry |
359 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Three-dimensional modeling of a direct current glow discharge in argon: is it better than one-dimensional modeling? |
1997 |
Fresenius' journal of analytical chemistry |
359 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
Jenett, H.; Grallath, E.; Riedel, R.; Strecker, K.; Gijbels, R.; Kennis, P. |
Comparative bulk, surface and depth profile analyses on AIN and SiC-coated B4C powders |
1991 |
Fres J. Anal. Chem. |
341 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
van Vaeck, L.; van Espen, P.; Gijbels, R.; Baykut, G.; Laukien, F.H. |
A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source |
2000 |
European mass spectrometry |
6 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
Vandelannoote, R.; Blommaert, W.; Van 't dack, L.; Gijbels, R.; van Grieken, R. |
Statistical grouping and controlling factors of dissolved trace elements in a surface water system |
1983 |
Environmental technology letters |
4 |
1 |
UA library record |
|
|
Shimizu, K.; Habazaki, H.; Bender, H.; Gijbels, R. |
The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES |
2004 |
Engineering materials |
52 |
|
UA library record |
|