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Characterization of epicuticular wax structures on leaves of urban plant species and its association with leaf wettability”. Muhammad S, Wuyts K, Nuyts G, De Wael K, Samson R, Urban Forestry &, Urban Greening 47, 126557 (2020). http://doi.org/10.1016/J.UFUG.2019.126557
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Urban heat stress mitigation potential of green walls: A review”. Koch K, Ysebaert T, Denys S, Samson R, Urban Forestry &, Urban Greening 55, 126843 (2020). http://doi.org/10.1016/J.UFUG.2020.126843
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Green walls for mitigating urban particulate matter pollution : a review”. Ysebaert T, Koch K, Samson R, Denys S, Urban Forestry &, Urban Greening 59, 127014 (2021). http://doi.org/10.1016/J.UFUG.2021.127014
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Van Oijstaeijen W, Finizola e Silva M, Back P, Collins A, Verheyen K, De Beelde R, Cools J, Van Passel S (2023) The Nature Smart Cities business model : a rapid decision-support and scenario analysis tool to reveal the multi-benefits of green infrastructure investments. 127923–14
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Black titania by sonochemistry : a critical evaluation of existing methods”. Raes A, Ninakanti R, Van den Bergh L, Borah R, Van Doorslaer S, Verbruggen SW, Ultrasonics sonochemistry 100, 106601 (2023). http://doi.org/10.1016/J.ULTSONCH.2023.106601
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3D imaging of nanomaterials by discrete tomography”. Batenburg KJ, Bals S, Sijbers J, Kübel C, Midgley PA, Hernandez JC, Kaiser U, Encina ER, Coronado EA, Van Tendeloo G, Ultramicroscopy 109, 730 (2009). http://doi.org/10.1016/j.ultramic.2009.01.009
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Accuracy and precision in model based EELS quantification”. Bertoni G, Verbeeck J, Ultramicroscopy 108, 782 (2008). http://doi.org/10.1016/j.ultramic.2008.01.004
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Accurate segmentation of dense nanoparticles by partially discrete electron tomography”. Roelandts T, Batenburg KJ, Biermans E, Kübel C, Bals S, Sijbers J, Ultramicroscopy 114, 96 (2012). http://doi.org/10.1016/j.ultramic.2011.12.003
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Acquisition of the EELS data cube by tomographic reconstruction”. van den Broek W, Verbeeck J, de Backer S, Scheunders P, Schryvers D, Ultramicroscopy 106, 269 (2006). http://doi.org/10.1016/j.ultramic.2005.09.001
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Advanced reconstruction algorithms for electron tomography : from comparison to combination”. Goris B, Roelandts T, Batenburg KJ, Heidari Mezerji H, Bals S, Ultramicroscopy 127, 40 (2013). http://doi.org/10.1016/j.ultramic.2012.07.003
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An alternative approach to determine attainable resolution directly from HREM images”. Wang A, Turner S, Van Aert S, van Dyck D, Ultramicroscopy 133, 50 (2013). http://doi.org/10.1016/j.ultramic.2013.05.008
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Applying an information transmission approach to extract valence electron information from reconstructed exit waves”. Xu Q, Zandbergen HW, van Dyck D, Ultramicroscopy 111, 912 (2011). http://doi.org/10.1016/j.ultramic.2011.01.032
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Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations”. de Backer A, Martinez GT, Rosenauer A, Van Aert S, Ultramicroscopy 134, 23 (2013). http://doi.org/10.1016/j.ultramic.2013.05.003
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Atomic resolution mapping of phonon excitations in STEM-EELS experiments”. Egoavil R, Gauquelin N, Martinez GT, Van Aert S, Van Tendeloo G, Verbeeck J, Ultramicroscopy 147, 1 (2014). http://doi.org/10.1016/j.ultramic.2014.04.011
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Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging”. Chen JH, van Dyck D, op de Beeck M, van Landuyt J, Ultramicroscopy 69, 219 (1997)
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Correction of non-linear thickness effects in HAADF STEM electron tomography”. van den Broek W, Rosenauer A, Goris B, Martinez GT, Bals S, Van Aert S, van Dyck D, Ultramicroscopy 116, 8 (2012). http://doi.org/10.1016/j.ultramic.2012.03.005
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Creating arrays of electron vortices”. Niermann T, Verbeeck J, Lehmann M, Ultramicroscopy 136, 165 (2014). http://doi.org/10.1016/j.ultramic.2013.10.002
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Deconvolution of core electron energy loss spectra”. Verbeeck J, Bertoni G, Ultramicroscopy 109, 1343 (2009). http://doi.org/10.1016/j.ultramic.2009.06.010
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Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography”. Kruse P, Schowalter M, Lamoen D, Rosenauer A, Gerthsen D, Ultramicroscopy 106, 105 (2006). http://doi.org/10.1016/j.ultramic.2005.06.057
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Direct space structure solution from precession electron diffraction data: resolving heavy and light scatterers in Pb13Mn9O25”. Hadermann J, Abakumov AM, Tsirlin AA, Filonenko VP, Gonnissen J, Tan H, Verbeeck J, Gemmi M, Antipov EV, Rosner H, Ultramicroscopy 110, 881 (2010). http://doi.org/10.1016/j.ultramic.2010.03.012
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Direct structure inversion from exit waves: part 1: theory and simulations”. Wang A, Chen FR, Van Aert S, van Dyck D, Ultramicroscopy 110, 527 (2010). http://doi.org/10.1016/j.ultramic.2009.11.024
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Direct structure inversion from exit waves : part 2 : a practical example”. Wang A, Chen FR, Van Aert S, van Dyck D, Ultramicroscopy 116, 77 (2012). http://doi.org/10.1016/j.ultramic.2012.03.011
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Does a monochromator improve the precision in quantitative HRTEM?”.den Dekker AJ, Van Aert S, van Dyck D, van den Bos A, Geuens P, Ultramicroscopy 89, 275 (2001). http://doi.org/10.1016/S0304-3991(01)00089-4
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Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting”. de Backer A, Martinez GT, MacArthur KE, Jones L, Béché, A, Nellist PD, Van Aert S, Ultramicroscopy 151, 56 (2015). http://doi.org/10.1016/j.ultramic.2014.11.028
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Dynamic scattering theory for dark-field electron holography of 3D strain fields”. Lubk A, Javon E, Cherkashin N, Reboh S, Gatel C, Hytch M, Ultramicroscopy 136, 42 (2014). http://doi.org/10.1016/j.ultramic.2013.07.007
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Dynamical effects in strain measurements by dark-field electron holography”. Javon E, Lubk, Cours R, Reboh S, Cherkashin N, Houdellier F, Gatel C, Hytch MJ, Ultramicroscopy 147, 70 (2014). http://doi.org/10.1016/j.ultramic.2014.06.005
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Dynamical electron diffraction in substitutionally disordered column structures”. De Meulenaere P, van Dyck D, Van Tendeloo G, van Landuyt J, Ultramicroscopy 60, 171 (1995). http://doi.org/10.1016/0304-3991(95)00040-8
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Effect of amorphous layers on the interpretation of restored exit waves”. Van Aert S, Chang LY, Bals S, Kirkland AI, Van Tendeloo G, Ultramicroscopy 109, 237 (2009). http://doi.org/10.1016/j.ultramic.2008.10.024
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An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images”. Croitoru MD, van Dyck D, Van Aert S, Bals S, Verbeeck J, Ultramicroscopy 106, 933 (2006). http://doi.org/10.1016/j.ultramic.2006.04.006
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Electron channelling based crystallography”. Van Aert S, Geuens P, van Dyck D, Kisielowski C, Jinschek JR, Ultramicroscopy 107, 551 (2007). http://doi.org/10.1016/j.ultramic.2006.04.031
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