Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Varambhia, A.M.; Jones, L.; De Backer, A.; Fauske, V.T.; Van Aert, S.; Ozkaya, D.; Nellist, P.D. |
Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM |
2016 |
Particle and particle systems characterization |
33 |
4 |
UA library record; WoS full record; WoS citing articles |
Lobato, I.; Van Aert, S.; Verbeeck, J. |
Progress and new advances in simulating electron microscopy datasets using MULTEM |
2016 |
Ultramicroscopy |
168 |
43 |
UA library record; WoS full record; WoS citing articles |
Liao, Z; , Green, R.J; Gauquelin, N; Macke, S.; Li, L.; Gonnissen, J; Sutarto, R.; Houwman, E.P.; Zhong, Z.; Van Aert, S.; Verbeeck, J.; Sawatzky, G.A.; Huijben, M.; Koster, G.; Rijnders, G. |
Long-Range Domain Structure and Symmetry Engineering by Interfacial Oxygen Octahedral Coupling at Heterostructure Interface |
2016 |
Advanced functional materials |
26 |
23 |
UA library record; WoS full record; WoS citing articles |
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design |
2016 |
Ultramicroscopy |
170 |
6 |
UA library record; WoS full record; WoS citing articles |
Gonnissen, J.; Batuk, D.; Nataf, G.F.; Jones, L.; Abakumov, A.M.; Van Aert, S.; Schryvers, D.; Salje, E.K.H. |
Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges |
2016 |
Advanced functional materials |
26 |
23 |
UA library record; WoS full record; WoS citing articles |
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. |
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images |
2016 |
Ultramicroscopy |
171 |
43 |
UA library record; WoS full record; WoS citing articles |
Martinez, G.T.; van den Bos, K.H.W.; Alania, M.; Nellist, P.D.; Van Aert, S. |
Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy |
2018 |
Ultramicroscopy |
187 |
4 |
UA library record; WoS full record; WoS citing articles |
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. |
Locating light and heavy atomic column positions with picometer precision using ISTEM |
2016 |
Ultramicroscopy |
172 |
8 |
UA library record; WoS full record; WoS citing articles |
Geuchies, J.J.; van Overbeek, C.; Evers, W.H.; Goris, B.; de Backer, A.; Gantapara, A.P.; Rabouw, F.T.; Hilhorst, J.; Peters, J.L.; Konovalov, O.; Petukhov, A.V.; Dijkstra, M.; Siebbeles, L.D.A.; van Aert, S.; Bals, S.; Vanmaekelbergh, D. |
In situ study of the formation mechanism of two-dimensional superlattices from PbSe nanocrystals |
2016 |
Nature materials |
15 |
182 |
UA library record; WoS full record; WoS citing articles |
Jany, B.R.; Gauquelin, N.; Willhammar, T.; Nikiel, M.; van den Bos, K.H.W.; Janas, A.; Szajna, K.; Verbeeck, J.; Van Aert, S.; Van Tendeloo, G.; Krok, F. |
Controlled growth of hexagonal gold nanostructures during thermally induced self-assembling on Ge(001) surface |
2017 |
Scientific reports |
7 |
25 |
UA library record; WoS full record; WoS citing articles |
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question |
2016 |
Ultramicroscopy |
174 |
2 |
UA library record; WoS full record; WoS citing articles |
Alania, M.; Altantzis, T.; De Backer, A.; Lobato, I.; Bals, S.; Van Aert, S. |
Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure |
2016 |
Ultramicroscopy |
177 |
13 |
UA library record; WoS full record; WoS citing articles |
van der Stam, W.; Geuchies, J.J.; Altantzis, T.; van den Bos, K.H.W.; Meeldijk, J.D.; Van Aert, S.; Bals, S.; Vanmaekelbergh, D.; de Mello Donega, C. |
Highly Emissive Divalent-Ion-Doped Colloidal CsPb1–xMxBr3Perovskite Nanocrystals through Cation Exchange |
2017 |
Journal of the American Chemical Society |
139 |
535 |
UA library record; WoS full record; WoS citing articles |
Peters, J.L.; van den Bos, K.H.W.; Van Aert, S.; Goris, B.; Bals, S.; Vanmaekelbergh, D. |
Ligand-Induced Shape Transformation of PbSe Nanocrystals |
2017 |
Chemistry of materials |
29 |
45 |
UA library record; WoS full record; WoS citing articles |
De Backer, A.; Jones, L.; Lobato, I.; Altantzis, T.; Goris, B.; Nellist, P.D.; Bals, S.; Van Aert, S. |
Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities |
2017 |
Nanoscale |
9 |
33 |
UA library record; WoS full record; WoS citing articles |
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. |
How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? |
2017 |
Ultramicroscopy |
181 |
3 |
UA library record; WoS full record; WoS citing articles |
Gauquelin, N.; van den Bos, K.H.W.; Béché, A.; Krause, F.F.; Lobato, I.; Lazar, S.; Rosenauer, A.; Van Aert, S.; Verbeeck, J. |
Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques |
2017 |
Ultramicroscopy |
181 |
34 |
UA library record; WoS full record; WoS citing articles |
Pullini, D.; Sgroi, M.; Mahmoud, A.; Gauquelin, N.; Maschio, L.; Lorenzo-Ferrari, A.M.; Groenen, R.; Damen, C.; Rijnders, G.; van den Bos, K.H.W.; Van Aert, S.; Verbeeck, J. |
One step toward a new generation of C-MOS compatible oxide p-n junctions: Structure of the LSMO/ZnO interface elucidated by an experimental and theoretical synergic work |
2017 |
ACS applied materials and interfaces |
9 |
4 |
UA library record; WoS full record; WoS citing articles |
De wael, A.; De Backer, A.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Hybrid statistics-simulations based method for atom-counting from ADF STEM images |
2017 |
Ultramicroscopy |
177 |
8 |
UA library record; WoS full record; WoS citing articles |
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. |
StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images |
2017 |
Journal of physics : conference series
T2 – Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK |
902 |
1 |
UA library record; WoS full record; WoS citing articles |
Schryvers, D.; Salje, E.K.H.; Nishida, M.; De Backer, A.; Idrissi, H.; Van Aert, S. |
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations |
2017 |
Ultramicroscopy |
176 |
1 |
UA library record; WoS full record; WoS citing articles |
Fatermans, J.; den Dekker, A. J.; Müller-Caspary, K.; Lobato, I.; O’Leary, C. M.; Nellist, P. D.; Van Aert, S. |
Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images |
2018 |
Physical review letters |
121 |
6 |
UA library record; WoS full record; WoS citing articles |
van den Bos, K.H.W.; Altantzis, T.; De Backer, A.; Van Aert, S.; Bals, S. |
Recent breakthroughs in scanning transmission electron microscopy of small species |
2018 |
Advances in Physics: X |
3 |
8 |
UA library record; WoS full record; WoS citing articles |
Amini, M.N.; Altantzis, T.; Lobato, I.; Grzelczak, M.; Sánchez-Iglesias, A.; Van Aert, S.; Liz-Marzán, L.M.; Partoens, B.; Bals, S.; Neyts, E.C. |
Understanding the Effect of Iodide Ions on the Morphology of Gold Nanorods |
2018 |
Particle and particle systems characterization |
35 |
6 |
UA library record; WoS full record; WoS citing articles |
Altantzis, T.; Lobato, I.; De Backer, A.; Béché, A.; Zhang, Y.; Basak, S.; Porcu, M.; Xu, Q.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Tendeloo, G.; Van Aert, S.; Bals, S. |
Three-Dimensional Quantification of the Facet Evolution of Pt Nanoparticles in a Variable Gaseous Environment |
2019 |
Nano letters |
19 |
82 |
UA library record; WoS full record; WoS citing articles |
van den Bos, K.H.W.; Janssens, L.; De Backer, A.; Nellist, P.D.; Van Aert, S. |
The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials |
2019 |
Ultramicroscopy |
203 |
4 |
UA library record; WoS full record; WoS citing articles |
Guzzinati, G.; Altantzis, T.; Batuk, M.; De Backer, A.; Lumbeeck, G.; Samaee, V.; Batuk, D.; Idrissi, H.; Hadermann, J.; Van Aert, S.; Schryvers, D.; Verbeeck, J.; Bals, S. |
Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp |
2018 |
Materials |
11 |
15 |
UA library record; WoS full record; WoS citing articles |
Liao, Z.; Gauquelin, N.; Green, R.J.; Müller-Caspary, K.; Lobato, I.; Li, L.; Van Aert, S.; Verbeeck, J.; Huijben, M.; Grisolia, M.N.; Rouco, V.; El Hage, R.; Villegas, J.E.; Mercy, A.; Bibes, M.; Ghosez, P.; Sawatzky, G.A.; Rijnders, G.; Koster, G. |
Metal–insulator-transition engineering by modulation tilt-control in perovskite nickelates for room temperature optical switching |
2018 |
America |
115 |
50 |
UA library record; WoS full record; WoS citing articles |
Fatermans, J.; Van Aert, S.; den Dekker, A.J. |
The maximum a posteriori probability rule for atom column detection from HAADF STEM images |
2019 |
Ultramicroscopy |
201 |
1 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; De Backer, A.; Jones, L.; Martinez, G.T.; Béché, A.; Nellist, P.D. |
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy |
2019 |
Physical review letters |
122 |
3 |
UA library record; WoS full record; WoS citing articles |