NANOlab Center of Excellence literature database -- Query Results

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Author	Title	Year	Publication	Volume	Times cited	Additional Links
Zhang, Z.; Ma, L.N.; Liao, X.Z.; van Landuyt, J.	A transmission electron-microscopy study of crystalline surface domains on al-co decagonal quasi-crystals and the \tau²-Al₁₃CO₄ approximant	1994	Philosophical magazine letters	70	4	UA library record; WoS full record; WoS citing articles
Zhang, Z.; Geng, W.; van Landuyt, J.; Van Tendeloo, G.	A transmission electron microscopy study of tweed-like structures in Al₆₂Cu_17.5CO_17.5Si₃ decagonal quasicrystals	1995	Philosophical magazine: A: physics of condensed matter: defects and mechanical properties	71	7	UA library record; WoS full record; WoS citing articles
Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S.	Some examples of electron microscopy studies of microstructures and phase transitions in solids	1995	Meccanica	30	1	UA library record; WoS full record; WoS citing articles
Tokei, Z.; Lanckmans, F.; van den Bosch, G.; Van Hove, M.; Maex, K.; Bender, H.; Hens, S.; van Landuyt, J.	Reliability of copper dual damascene influenced by pre-clean	2002	Analysis Of Integrated Circuits		5	UA library record; WoS full record; WoS citing articles
de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J.	Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon	1999	The review of scientific instruments	70	5	UA library record; WoS full record; WoS citing articles
de Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.I.; van Landuyt, J.; Simoen, E.; Claeys, C.	Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy	2004	Journal of the electrochemical society	151	13	UA library record; WoS full record; WoS citing articles
Mihailescu, I.N.; Gyorgy, E.; Marin, G.; Popescu, M.; Teodorescu, V.S.; van Landuyt, J.; Grivas, C.; Hatziapostolou, A.	Crystalline structure of very hard tungsten carbide thin films obtained by reactive pulsed laser deposition	1999	Journal of vacuum science and technology: A: vacuum surfaces and films	17	8	UA library record; WoS full record; WoS citing articles
Nistor, L.; Bender, H.; Vantomme, A.; Wu, M.F.; van Landuyt, J.; O'Donnell, K.P.; Martin, R.; Jacobs, K.; Moerman, I.	Direct evidence of spontaneous quantum dot formation in a thick InGaN epilayer	2000	Applied physics letters	77	44	UA library record; WoS full record; WoS citing articles
Schryvers, D.; de Saegher, B.; van Landuyt, J.	Electron microscopy and diffraction study of the composition dependency of the 3R microtwinned martensite in Ni-Al	1991	Materials research bulletin	26	11	UA library record; WoS full record; WoS citing articles
Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J.	Electron microscopy of carbon nanotubes and related structures	1997	The journal of physics and chemistry of solids	58	12	UA library record; WoS full record; WoS citing articles
Frangis, N.; van Landuyt, J.; Lartiprete, R.; Martelli, S.; Borsella, E.; Chiussi, S.; Castro, J.; Leon, B.	High resolution electron microscopy and X-ray photoelectron spectroscopy studies of heteroepitaxial Si_xGe_1-x alloys produced through laser induced processing	1998	Applied physics letters	72	16	UA library record; WoS full record; WoS citing articles
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M.	Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays	1999	Applied physics letters	75	481	UA library record; WoS full record; WoS citing articles
Teodorescu, V.; Nistor, L.; Bender, H.; Steegen, A.; Lauwers, A.; Maex, K.; van Landuyt, J.	In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines	2001	Journal of applied physics	90	97	UA library record; WoS full record; WoS citing articles
Ghica, C.; Nistor, L.; Bender, H.; Steegen, A.; Lauwers, A.; Maex, K.; van Landuyt, J.	In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates	2001	Journal of materials research	16	4	UA library record; WoS full record; WoS citing articles
Dobbelaere, W.; de Boeck, J.; Heremans, P.; Mertens, R.; Borghs, G.; Luyten, W.; van Landuyt, J.	InAs p-n diodes grown on GaAs and GaAs-coated Si by molecular beam epitaxy	1992	Applied physics letters	60	20	UA library record; WoS full record; WoS citing articles
Dobbelaere, W.; de Boeck, J.; Heremans, P.; Mertens, R.; Borghs, G.; Luyten, W.; van Landuyt, J.	InAs0.85Sb0.15 infrared photodiodes grown on GaAs and GaAs-coated Si by molecular beam epitaxy	1992	Applied physics letters	600	32	UA library record; WoS full record; WoS citing articles
Rembeza, E.S.; Richard, O.; van Landuyt, J.	Influence of laser and isothermal treatments on microstructural properties of SnO₂ films	1999	Materials research bulletin	34	17	UA library record; WoS full record; WoS citing articles
Li, H.; Bender, H.; Conard, T.; Maex, K.; Gutakovskii, A.; van Landuyt, J.; Froyen, L.	Interaction of a Ti-capped Co thin film with Si₃N₄	2000	Applied physics letters	77	3	UA library record; WoS full record; WoS citing articles
Stuer, C.; van Landuyt, J.; Bender, H.; de Wolf, I.; Rooyackers, R.; Badenes, G.	Investigation by convergent beam electron diffraction of the stress around shallow trench isolation structures	2001	Journal of the electrochemical society	148	13	UA library record; WoS full record; WoS citing articles
Ignatova, V.A.; Lebedev, O.I.; Watjen, U.; van Vaeck, L.; van Landuyt, J.; Gijbels, R.; Adams, F.	Metal and composite nanocluster precipitate formation in silicon dioxide implanted with Sb+ ions	2002	Journal of applied physics	92	5	UA library record; WoS full record; WoS citing articles
Gryse, O.D.; Clauws, P.; van Landuyt, J.; Lebedev, O.; Claeys, C.; Simoen, E.; Vanhellemont, J.	Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques	2002	Journal of applied physics	91	27	UA library record; WoS full record; WoS citing articles
Nistor, L.C.; van Landuyt, J.	Structural studies of diamond thin films grown from the arc plasma	1998	Journal of materials research	12	13	UA library record; WoS full record; WoS citing articles
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.	The study of partially ordered 11/20 alloys by HREM	1993	Microscopy research and technique	25		UA library record; WoS full record
Teodorescu, V.S.; Nistor, L.C.; van Landuyt, J.; Dinescu, M.	TEM study of laser induced phase transition in iron thin films	1994	Materials research bulletin	29	2	UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Landuyt, J.	Transmission electron microscopy studies of (111) twinned silver halide microcrystals	1998	Microscopy research and technique	42	8	UA library record; WoS full record; WoS citing articles
Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S.	Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy	2001	Materials science in semiconductor processing	4		UA library record; WoS full record
Deveirman, A.; van Landuyt, J.; Vanhellemont, J.; Maes, H.E.; Yallup, K.	Defects in high-dose oxygen implanted silicon : a TEM study	1991	Vacuum: the international journal and abstracting service for vacuum science and technology T2 – 1ST SIOMX WORKSHOP ( SEPARATION BY IMPLANTATION OF OXYGEN ) ( SWI-88 ), NOV 07-08, 1988, UNIV SURREY, GUILDFORD, ENGLAND	42	4	UA library record; WoS full record; WoS citing articles
Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G.	The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures	2001	Materials science in semiconductor processing	4	6	UA library record; WoS full record; WoS citing articles
Zhang, X.B.; Zhang, X.F.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Ivanov, V.; Nagy, J.B.; Lambin, P.; Lucas, A.A.	The texture of catalytically grown coil-shaped carbon nanotubes	1994	Europhysics letters	27	168	UA library record; WoS full record; WoS citing articles
Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S.	Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp	1994	MRS bulletin			UA library record; WoS full record;