|
Records |
Links |
|
Author |
Janssens, K.; Adams, F.; Rivers, M.L.; Jones, K.W. |
|
|
Title |
Analysis of individual microscopic particles by means of synchrotron radiation induced X-ray micro fluorescence |
Type |
P3 Proceeding |
|
Year |
1992 |
Publication |
Proceedings 27th MAS |
Abbreviated Journal |
|
|
|
Volume |
|
Issue |
|
Pages |
|
|
|
Keywords |
P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
|
|
Abstract |
|
|
|
Address |
|
|
|
Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
|
Editor |
|
|
|
Language |
|
Wos |
|
Publication Date |
|
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
|
|
Impact Factor |
|
Times cited |
|
Open Access |
|
|
|
Notes ![sorted by Notes field, descending order (down)](img/sort_desc.gif) |
|
Approved |
no |
|
|
Call Number |
UA @ admin @ c:irua:2812 |
Serial |
5468 |
|
Permanent link to this record |
|
|
|
|
Author |
Janssens, K.H.; Adams, F.C.; van Langevelde, F.; Vis, R.D.; Jones, K.W.; Rivers, M.; Sutton, S. |
|
|
Title |
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis |
Type |
A3 Journal article |
|
Year |
1992 |
Publication |
Advances in X-ray analysis |
Abbreviated Journal |
|
|
|
Volume |
35 |
Issue |
|
Pages |
1265-1273 |
|
|
Keywords |
A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
|
|
Abstract |
|
|
|
Address |
|
|
|
Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
|
Editor |
|
|
|
Language |
|
Wos |
|
Publication Date |
|
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0376-0308 |
ISBN |
|
Additional Links |
UA library record |
|
|
Impact Factor |
|
Times cited |
|
Open Access |
|
|
|
Notes ![sorted by Notes field, descending order (down)](img/sort_desc.gif) |
|
Approved |
no |
|
|
Call Number |
UA @ admin @ c:irua:2811 |
Serial |
5530 |
|
Permanent link to this record |
|
|
|
|
Author |
Vincze, L.; Vekemans, B.; Szalóki, I.; Janssens, K.; Van Grieken, R.; Feng, H.; Jones, K.W.; Adams, F. |
![find record details (via OpenURL) openurl](img/xref.gif)
|
|
Title |
High-resolution X-ray fluorescence micro-tomography on single sediment particles |
Type |
H1 Book chapter |
|
Year |
2002 |
Publication |
|
Abbreviated Journal |
|
|
|
Volume |
|
Issue |
|
Pages |
240-248 |
|
|
Keywords |
H1 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
|
|
Abstract |
|
|
|
Address |
|
|
|
Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
|
Editor |
|
|
|
Language |
|
Wos |
000175177400027 |
Publication Date |
2003-11-19 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
|
Times cited |
11 |
Open Access |
|
|
|
Notes ![sorted by Notes field, descending order (down)](img/sort_desc.gif) |
|
Approved |
Most recent IF: NA |
|
|
Call Number |
UA @ admin @ c:irua:39525 |
Serial |
5643 |
|
Permanent link to this record |
|
|
|
|
Author |
Janssens, K.; Vincze, L.; Adams, F.; Jones, K.W. |
![find record details (via OpenURL) openurl](img/xref.gif)
|
|
Title |
Synchrotron radiation-induced X-ray microanalysis |
Type |
A1 Journal article |
|
Year |
1993 |
Publication |
Analytica chimica acta |
Abbreviated Journal |
|
|
|
Volume |
283 |
Issue |
|
Pages |
98-119 |
|
|
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
|
|
Abstract |
|
|
|
Address |
|
|
|
Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
|
Editor |
|
|
|
Language |
|
Wos |
A1993MK02800009 |
Publication Date |
2002-07-25 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0003-2670 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
|
Times cited |
|
Open Access |
|
|
|
Notes ![sorted by Notes field, descending order (down)](img/sort_desc.gif) |
|
Approved |
no |
|
|
Call Number |
UA @ admin @ c:irua:6107 |
Serial |
5865 |
|
Permanent link to this record |
|
|
|
|
Author |
Janssens, K.; Vincze, L.; Vekemans, B.; Aerts, A.; Adams, F.; Jones, K.W.; Knöchel, A. |
|
|
Title |
Synchrotron radiation induced X-ray microfluorescence analysis |
Type |
A1 Journal article |
|
Year |
1996 |
Publication |
Microchimica acta
T2 – 4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Microbeam Analysis, MAY, 1995, ST MALO, FRANCE |
Abbreviated Journal |
4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Micro |
|
|
Volume |
|
Issue |
s:[13] |
Pages |
87-115 |
|
|
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
|
|
Abstract |
mu-XRF is the microscopic equivalent of the well-established multielement analytical technique. In this paper, after comparing the interaction of X-ray photons, electrons and protons with matter and an introduction to synchrotron rings and microfocussing of X-rays, the instrumentation for mu-XRF is discussed, both for laboratory source and synchrotron based setups and the analytical characteristics of mu-XRF are contrasted to that of other microanalytical techniques, Also, this issue of quantification of mu-XRF data is addressed; the applicability of the method in archeological and geological analysis is illustrated. |
|
|
Address |
|
|
|
Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
|
Editor |
|
|
|
Language |
|
Wos |
A1996VT82300006 |
Publication Date |
|
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
|
Times cited |
|
Open Access |
|
|
|
Notes ![sorted by Notes field, descending order (down)](img/sort_desc.gif) |
|
Approved |
no |
|
|
Call Number |
UA @ admin @ c:irua:104410 |
Serial |
5866 |
|
Permanent link to this record |
|
|
|
|
Author |
Jones, K.W.; Feng, H.; Lindquist, W.B.; Adler, P.M.; Thover, J.F.; Vekemans, B.; Vincze, L.; Szalóki, I.; Van Grieken, R.; Adams, F.; Riekel, C. |
|
|
Title |
Study of microgeometry of porous materials using synchrotron computed microtomography |
Type |
H3 Book chapter |
|
Year |
2003 |
Publication |
|
Abbreviated Journal |
|
|
|
Volume |
|
Issue |
|
Pages |
39-49
T2 - Applications of X-ray computed tomograp |
|
|
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
|
|
Abstract |
|
|
|
Address |
|
|
|
Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
|
Editor |
|
|
|
Language |
|
Wos |
|
Publication Date |
|
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
|
|
Impact Factor |
|
Times cited |
|
Open Access |
|
|
|
Notes ![sorted by Notes field, descending order (down)](img/sort_desc.gif) |
|
Approved |
no |
|
|
Call Number |
UA @ admin @ c:irua:41596 |
Serial |
8602 |
|
Permanent link to this record |