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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Schryvers, D.; Shi, H.; Martinez, G.T.; Van Aert, S.; Frenzel, J.; Van Humbeeck, J. |
Nano- and microcrystal investigations of precipitates, interfaces and strain fields in Ni-Ti-Nb by various TEM techniques |
2013 |
Materials science forum
T2 – 9th European Symposium on Martensitic Transformations (ESOMAT 2012), SEP 09-16, 2012, St Petersburg, RUSSIA |
738/739 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. |
Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? |
2012 |
Ultramicroscopy |
114 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative |
2006 |
Optics express |
14 |
45 |
UA library record; WoS full record; WoS citing articles |
|
|
Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. |
Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images |
2014 |
Applied physics letters |
105 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. |
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images |
2014 |
Micron |
63 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
Akamine, H.; Van den Bos, K.H.W.; Gauquelin, N.; Farjami, S.; Van Aert, S.; Schryvers, D.; Nishida, M. |
Determination of the atomic width of an APB in ordered CoPt using quantified HAADF-STEM |
2015 |
Journal of alloys and compounds |
644 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
Goris, B.; de Backer, A.; Van Aert, S.; Gómez-Graña, S.; Liz-Marzán, L.M.; Van Tendeloo, G.; Bals, S. |
Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals |
2013 |
Nano letters |
13 |
90 |
UA library record; WoS full record; WoS citing articles |
|
|
Van Aert, S.; de Backer, A.; Martinez, G.T.; Goris, B.; Bals, S.; Van Tendeloo, G.; Rosenauer, A. |
Procedure to count atoms with trustworthy single-atom sensitivity |
2013 |
Physical review : B : condensed matter and materials physics |
87 |
106 |
UA library record; WoS full record; WoS citing articles |
|
|
Bals, S.; Van Aert, S.; Van Tendeloo, G. |
High resolution electron tomography |
2013 |
Current opinion in solid state and materials science |
17 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
Goris, B.; de Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, K.J.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Aert, S.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
Measuring lattice strain in three dimensions through electron microscopy |
2015 |
Nano letters |
15 |
87 |
UA library record; WoS full record; WoS citing articles |
|
|
Kundu, P.; Turner, S.; Van Aert, S.; Ravishankar, N.; Van Tendeloo, G. |
Atomic structure of quantum gold nanowires : quantification of the lattice strain |
2014 |
ACS nano |
8 |
20 |
UA library record; WoS full record; WoS citing articles |
|
|
Van Aert, S.; Chang, L.Y.; Bals, S.; Kirkland, A.I.; Van Tendeloo, G. |
Effect of amorphous layers on the interpretation of restored exit waves |
2009 |
Ultramicroscopy |
109 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
Klingstedt, M.; Sundberg, M.; Eriksson, L.; Haigh, S.; Kirkland, A.; Grüner, D.; de Backer, A.; Van Aert, S.; Tarasaki, O. |
Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x\sim0.11) |
2012 |
Zeitschrift für Kristallographie |
227 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. |
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy |
2009 |
Ultramicroscopy |
109 |
166 |
UA library record; WoS full record; WoS citing articles |
|
|
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. |
Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations |
2013 |
Ultramicroscopy |
134 |
48 |
UA library record; WoS full record; WoS citing articles |
|
|
den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S. |
Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits? |
2013 |
Ultramicroscopy |
134 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. |
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy |
2014 |
Ultramicroscopy |
137 |
74 |
UA library record; WoS full record; WoS citing articles |
|
|
Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. |
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images |
2006 |
Ultramicroscopy |
106 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. |
An alternative approach to determine attainable resolution directly from HREM images |
2013 |
Ultramicroscopy |
133 |
|
UA library record; WoS full record |
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Schryvers, D.; Van Aert, S.; Delville, R.; Idrissi, H.; Turner, S.; Salje, E.K.H. |
Dedicated TEM on domain boundaries from phase transformations and crystal growth |
2013 |
Phase transitions |
86 |
|
UA library record; WoS full record; WoS citing articles |
|
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Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D. |
Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range |
2006 |
Physical review letters |
96 |
69 |
UA library record; WoS full record; WoS citing articles |
|
|
Schryvers, D.; Cao, S.; Tirry, W.; Idrissi, H.; Van Aert, S. |
Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials |
2013 |
Science and technology of advanced materials |
14 |
6 |
UA library record; WoS full record; WoS citing articles |
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Bals, S.; Van Aert, S.; Romero, C.P.; Lauwaet, K.; Van Bael, M.J.; Schoeters, B.; Partoens, B.; Yuecelen, E.; Lievens, P.; Van Tendeloo, G. |
Atomic scale dynamics of ultrasmall germanium clusters |
2012 |
Nature communications |
3 |
90 |
UA library record; WoS full record; WoS citing articles |
|
|
Verbeeck, J.; Van Aert, S. |
Model based quantification of EELS spectra |
2004 |
Ultramicroscopy |
101 |
147 |
UA library record; WoS full record; WoS citing articles |
|
|
Verbeeck, J.; Van Aert, S.; Bertoni, G. |
Model-based quantification of EELS spectra: including the fine structure |
2006 |
Ultramicroscopy |
106 |
38 |
UA library record; WoS full record; WoS citing articles |
|
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Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. |
Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures |
2013 |
Physical review : B : condensed matter and materials physics |
88 |
15 |
UA library record; WoS full record; WoS citing articles |
|
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Gonnissen, J.; Batuk, D.; Nataf, G.F.; Jones, L.; Abakumov, A.M.; Van Aert, S.; Schryvers, D.; Salje, E.K.H. |
Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges |
2016 |
Advanced functional materials |
26 |
23 |
UA library record; WoS full record; WoS citing articles |
|
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Grünewald, L.; Chezganov, D.; De Meyer, R.; Orekhov, A.; Van Aert, S.; Bogaerts, A.; Bals, S.; Verbeeck, J. |
In Situ Plasma Studies Using a Direct Current Microplasma in a Scanning Electron Microscope |
2024 |
Advanced Materials Technologies |
|
|
UA library record; WoS full record |
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Liao, Z.; Gauquelin, N.; Green, R.J.; Macke, S.; Gonnissen, J.; Thomas, S.; Zhong, Z.; Li, L.; Si, L.; Van Aert, S.; Hansmann, P.; Held, K.; Xia, J.; Verbeeck, J.; Van Tendeloo, G.; Sawatzky, G.A.; Koster, G.; Huijben, M.; Rijnders, G. |
Thickness dependent properties in oxide heterostructures driven by structurally induced metal-oxygen hybridization variations |
2017 |
Advanced functional materials |
27 |
55 |
UA library record; WoS full record; WoS citing articles |
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Arisnabarreta, N.; Hao, Y.; Jin, E.; Salame, A.; Muellen, K.; Robert, M.; Lazzaroni, R.; Van Aert, S.; Mali, K.S.; De Feyter, S. |
Single-layered imine-linked porphyrin-based two-dimensional covalent organic frameworks targeting CO₂ reduction |
2024 |
Advanced energy materials |
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UA library record; WoS full record |
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