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Records |
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Author |
Ro, C.-U.; Kim, H.K.; Van Grieken, R. |
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Title |
An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
Analytical chemistry |
Abbreviated Journal |
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Volume |
76 |
Issue |
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Pages |
1322-1327 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000189275100020 |
Publication Date |
2004-02-27 |
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ISSN |
0003-2700; 5206-882x |
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no |
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Call Number |
UA @ admin @ c:irua:43879 |
Serial |
7949 |
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Author |
Godoi, A.F.L.; Ravindra, K.; Godoi, R.H.M.; Andrade, S.J.; Santiago-Silva, M.; Van Vaeck, L.; Van Grieken, R. |
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Title |
Fast chromatographic determination of polycyclic aromatic hydrocarbons in aerosol samples from sugar cane burning |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
Journal of chromatography: A: bibliography section |
Abbreviated Journal |
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Volume |
1027 |
Issue |
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Pages |
49-53 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000188498900008 |
Publication Date |
2003-11-15 |
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no |
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Call Number |
UA @ admin @ c:irua:43528 |
Serial |
7959 |
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Author |
Spolnik, Z.; Tsuji, K.; Van Grieken, R. |
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Title |
Grazing-exit electron probe x-ray microanalysis of light elements in particles |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
33 |
Issue |
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Pages |
16-20 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000188743100004 |
Publication Date |
2004-01-21 |
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Series Volume |
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Edition |
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ISSN |
0049-8246 |
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UA library record; WoS full record; WoS citing articles |
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no |
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Call Number |
UA @ admin @ c:irua:43524 |
Serial |
8009 |
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Author |
Gysels, K.; Delalieux, F.; Deutsch, F.; Van Grieken, R.; Camuffo, D.; Bernardi, A.; Sturaro, G.; Busse, H.-J.; Wieser, M. |
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Title |
Indoor environment and conservation in the Royal Museum of Fine Arts, Antwerp, Belgium |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
Journal of cultural heritage |
Abbreviated Journal |
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Volume |
5 |
Issue |
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Pages |
221-230 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000222196400010 |
Publication Date |
2004-05-29 |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1296-2074 |
ISBN |
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UA library record; WoS full record; WoS citing articles |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:44970 |
Serial |
8084 |
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Permanent link to this record |
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Author |
Van Grieken, R. |
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Title |
Introduction: considering the role of X-ray spectrometry in chemical analysis and outlining the volume |
Type |
H3 Book chapter |
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Year |
2004 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
1-11
T2 - X-ray spectrometry: recent technological |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:43877 |
Serial |
8121 |
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Permanent link to this record |
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Author |
Godoi, R.H.M.; Kontozova, V.; Godoi, A.F.L.; Van Grieken, R. |
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Title |
Investigation of individual particles and gaseous air pollutants in showcases |
Type |
H3 Book chapter |
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Year |
2004 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
147-150
T2 - Air pollution and cultural heritage / |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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UA library record |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:48941 |
Serial |
8126 |
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Permanent link to this record |
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Author |
Ravindra, K.; Bencs, L.; Van Grieken, R. |
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Title |
Platinum group elements in the environment and their health risk |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
The science of the total environment |
Abbreviated Journal |
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Volume |
318 |
Issue |
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Pages |
1-43 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000220194000001 |
Publication Date |
2003-09-12 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0048-9697; 1879-1026 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:43525 |
Serial |
8391 |
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Permanent link to this record |
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Author |
Vekemans, B.; Vincze, L.; Brenker, F.E.; Adams, F. |
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Title |
Processing of three-dimensional microscopic X-ray fluorescence data |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
Journal of analytical atomic spectrometry |
Abbreviated Journal |
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Volume |
19 |
Issue |
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Pages |
1302-1308 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000224275400005 |
Publication Date |
2004-10-05 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0267-9477 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:48543 |
Serial |
8419 |
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Permanent link to this record |
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Author |
Szalóki, I.; Ro, C.-U.; Osán, J.; de Hoog, J.; Van Grieken, R. |
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Title |
Speciation and surface analysis of single particles using electron-excited X-ray emission spectrometry |
Type |
H3 Book chapter |
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Year |
2004 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
569-592
T2 - X-ray spectrometry: recent technologi |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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UA library record |
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Impact Factor |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:43878 |
Serial |
8570 |
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Permanent link to this record |
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Author |
Vincze, L.; Vekemans, B.; Adams, F. |
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Title |
Synchrotron computed X-ray fluorescence tomography in environmental and earth sciences: radiation |
Type |
P3 Proceeding |
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Year |
2004 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Additional Links |
UA library record |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:46497 |
Serial |
8633 |
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Permanent link to this record |
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Author |
Adams, F.; Vincze, L.; Vekemans, B. |
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Title |
Synchrotron radiation for microscopic X-ray fluorescence analysis |
Type |
H3 Book chapter |
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Year |
2004 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
343-353
T2 - X-ray spectrometry: recent technologi |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Additional Links |
UA library record |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:46499 |
Serial |
8634 |
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Permanent link to this record |
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Author |
Vincze, L.; Vekemans, B.; Brenker, F.E.; Falkenberg, G.; Rickers, K.; Somogyi, A.; Kersten, M.; Adams, F. |
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Title |
Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
Analytical chemistry |
Abbreviated Journal |
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Volume |
76 |
Issue |
22 |
Pages |
6786-6791 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author |
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Place of Publication |
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Editor |
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Language |
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Wos |
000225076400034 |
Publication Date |
2004-11-12 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0003-2700; 5206-882x |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:49817 |
Serial |
8669 |
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Permanent link to this record |
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Author |
Vincze, L.; Vekemans, B.; Szaloki, I.; Brenker, F.E.; Falkenberg, G.; Rickers, K.; Aerts, K.; Van Grieken, R.; Adams, F. |
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Title |
X-ray fluorescence microtomography and polycapillary based confocal imaging using synchrotron radiation |
Type |
P1 Proceeding |
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Year |
2004 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
220-231
T2 - 4th Conference on Developments in X-R |
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Keywords |
P1 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
Ibis work illustrates the development of X-ray fluorescence tomography and polycapillary based confocal imaging towards a three-dimensional (313), quantitative analytical method with lateral resolution levels down to the 2-20 mum scale. Detailed analytical characterization is given for polycapillary based confocal XRF imaging, which is a new variant of the 3D micro-XRF technique. Applications for 2D/3D micro-XR-F are illustrated for the analysis of biological (zooplankton) and geological samples (microscopic inclusions in natural diamonds and fluid inclusions in quartz). Based on confocal imaging, fully three-dimensional distributions of trace elements could be obtained, representing a significant generalization of the regular 2D scanning technique for micro-XRF spectroscopy. The experimental work described in this paper has been carried out at the ESRF ID18F microfluorescence end-station and at HASYLAB Beam Line L. |
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Wos |
000225665000023 |
Publication Date |
2004-11-02 |
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Series Editor |
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Abbreviated Series Title |
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Edition |
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ISSN |
0-8194-5473-7 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:94812 |
Serial |
8767 |
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Permanent link to this record |
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Author |
Szalóki, I.; Osán, J.; Van Grieken, R.E. |
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Title |
X-ray spectrometry |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
Analytical chemistry |
Abbreviated Journal |
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Volume |
76 |
Issue |
12 |
Pages |
3445-3470 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000222011100014 |
Publication Date |
2004-06-14 |
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Edition |
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ISSN |
0003-2700; 5206-882x |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:46259 |
Serial |
8772 |
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Permanent link to this record |
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Author |
Van Grieken, R.; Delalieux, F. |
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Title |
X-ray spectrometry for air pollution and cultural heritage research |
Type |
P3 Proceeding |
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Year |
2004 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:51259 |
Serial |
8783 |
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Permanent link to this record |
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Author |
Tsuji, K.; Injuk, J.; Van Grieken, R. |
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Title |
X-ray spectrometry: recent technological advances |
Type |
ME1 Book as editor or co-editor |
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Year |
2004 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
616 p. |
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Keywords |
ME1 Book as editor or co-editor; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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ISBN |
0-471-48640-x |
Additional Links |
UA library record |
|
|
Impact Factor |
|
Times cited |
|
Open Access |
|
|
|
Notes |
|
Approved |
no |
|
|
Call Number |
UA @ admin @ c:irua:43876 |
Serial |
8786 |
|
Permanent link to this record |
|
|
|
|
Author |
Bals, S.; Kabius, B.; Haider, M.; Radmilovic, V.; Kisielowski, C. |
|
|
Title |
Annular dark field imaging in a TEM |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
Solid state communications |
Abbreviated Journal |
Solid State Commun |
|
|
Volume |
130 |
Issue |
10 |
Pages |
675-680 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
|
Abstract |
Annular objective apertures are fabricated for a CM300 transmission electron microscope using a focused ion beam system. A central beam stop in the back focal plane of the objective lens of the microscope blocks all electrons scattered up to a semi-angle of approximately 20 mrad. In this manner, contributions to the image from Bragg scattering are largely reduced and the image contrast is sensitive to the atomic number Z. Experimentally, we find that single atom scattering cross sections measured with this technique are close to Rutherford scattering values. A comparison between this new method and STEM-HAADF shows that both techniques result in qualitatively similar images although the resolution of ADF-TEM is limited by contrast delocalization caused by the spherical aberration of the objective lens. This problem can be overcome by using an aberration corrected microscope. |
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|
Address |
|
|
|
Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
New York, N.Y. |
Editor |
|
|
|
Language |
|
Wos |
000221489300007 |
Publication Date |
2004-04-10 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0038-1098; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
1.554 |
Times cited |
43 |
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: 1.554; 2004 IF: 1.523 |
|
|
Call Number |
UA @ lucian @ c:irua:87584 |
Serial |
132 |
|
Permanent link to this record |
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|
|
|
Author |
Lubyshev, D.; Fastenau, J.M.; Fang, X.-M.; Wu, Y.; Doss, C.; Snyder, A.; Liu, W.K.; Lamb, M.S.M.; Bals, S.; Song, C. |
|
|
Title |
Comparison of As- and P-based metamorphic buffers for high performance InP heterojunction bipolar transistor and high electron mobility transistor applications |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena |
Abbreviated Journal |
|
|
|
Volume |
22 |
Issue |
3 |
Pages |
1565-1569 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
|
Abstract |
Metamorphic buffers (M-buffers) consisting of graded InAlAs or bulk InP were employed for the production of InP-based epiwafers on GaAs substrates by molecular-beam epitaxy. The graded InAlAs is the standard for production metamorphic high electron mobility transistors (M-HEMTs), while the bulk InP offers superior thermal properties for higher current density circuits. The surface morphology and crystal structure of the two M-buffers showed different relaxation mechanisms. The graded InAlAs gave a cross-hatched pattern with nearly full relaxation and very effective dislocation filtering, while the bulk InP had a uniform isotropic surface with dislocations propagating further up towards the active layers. Both types of M-buffers had atomic force microscopy root-mean-square roughness values around 2030 Å. The Hall transport properties of high electron mobility transistors (HEMTs) grown on the InAlAs M-buffer, and a baseline HEMT grown lattice matched on InP, both had room-temperature mobilities >10 000 cm2/V s, while the M-HEMT on the InP M-buffer showed a decrease to 9000 cm2/V s. Similarly, the dc parameters of a double heterojunction bipolar transistor (DHBT) grown on the InAlAs M-buffer were much closer to the baseline heterojunction bipolar transistor than a DHBT grown on the InP M-buffer. A high breakdown voltage of 11.3 V was achieved on an M-DHBT with the InAlAs M-buffer. We speculate that the degradation in device characteristics on the InP M-buffer was related to the incomplete dislocation filtering. |
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Address |
|
|
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Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
Woodbury, N.Y. |
Editor |
|
|
|
Language |
|
Wos |
000222481400141 |
Publication Date |
2004-07-08 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0734-211X; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
|
Times cited |
25 |
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: NA |
|
|
Call Number |
UA @ lucian @ c:irua:87596 |
Serial |
427 |
|
Permanent link to this record |
|
|
|
|
Author |
Blumenau, A.T.; Frauenheim, T.; Öberg, S.; Willems, B.; Van Tendeloo, G. |
|
|
Title |
Dislocation structures in diamond: density-functional based modelling and high resolution electron microscopy |
Type |
MA1 Book as author |
|
Year |
2004 |
Publication |
|
Abbreviated Journal |
|
|
|
Volume |
|
Issue |
|
Pages |
|
|
|
Keywords |
MA1 Book as author; Electron microscopy for materials research (EMAT) |
|
|
Abstract |
|
|
|
Address |
|
|
|
Corporate Author |
|
Thesis |
|
|
|
Publisher |
Trans Tech Publications |
Place of Publication |
s.l. |
Editor |
|
|
|
Language |
|
Wos |
|
Publication Date |
0000-00-00 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
|
Times cited |
|
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: NA |
|
|
Call Number |
UA @ lucian @ c:irua:54872 |
Serial |
732 |
|
Permanent link to this record |
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|
|
Author |
Hamon, A.-L.; Verbeeck, J.; Schryvers, D.; Benedikt, J.; van den Sanden, R.M.C.M. |
|
|
Title |
ELNES study of carbon K-edge spectra of plasma deposited carbon films |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
Journal of materials chemistry |
Abbreviated Journal |
J Mater Chem |
|
|
Volume |
14 |
Issue |
|
Pages |
2030-2035 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
|
Abstract |
Electron energy loss spectroscopy was used to investigate the bonding of plasma deposited carbon films. The experimental conditions include the use of a specific collection angle for which the shape of the spectra is free of the orientation dependency usually encountered in graphite due to its anisotropic structure. The first quantification process of the energy loss near-edge structure was performed by a standard fit of the collected spectrum, corrected for background and multiple scattering, with three Gaussian functions followed by a comparison with the graphite spectrum obtained under equivalent experimental conditions. In a second approach a fitting model directly incorporating the background subtraction and multiple scattering removal was applied. The final numerical results are interpreted in view of the deposition conditions of the films and the actual fitting procedure with the related choice of parameters. |
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Address |
|
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Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
Cambridge |
Editor |
|
|
|
Language |
|
Wos |
000222312500017 |
Publication Date |
2004-06-28 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0959-9428;1364-5501; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
6.626 |
Times cited |
61 |
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: NA |
|
|
Call Number |
UA @ lucian @ c:irua:48782UA @ admin @ c:irua:48782 |
Serial |
1025 |
|
Permanent link to this record |
|
|
|
|
Author |
Verbeeck, J.; van Dyck, D.; Van Tendeloo, G. |
|
|
Title |
Energy-filtered transmission electron microscopy: an overview |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
Spectrochimica acta: part B : atomic spectroscopy |
Abbreviated Journal |
Spectrochim Acta B |
|
|
Volume |
59 |
Issue |
10/11 |
Pages |
1529-1534 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
|
Abstract |
This paper aims to give an overview of the technique of energy-filtered transmission electron microscopy (EFTEM). It explains the basic principles of the technique and points to the relevant literature for more detailed issues. Experimental examples are given to show the power of EFTEM to study the chemical composition of nanoscale samples in materials science. Advanced EFTEM applications like imaging spectroscopy and EFTEM tomography are briefly discussed. (C) 2004 Elsevier B.V. All rights reserved. |
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Address |
|
|
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Corporate Author |
|
Thesis |
|
|
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Publisher |
|
Place of Publication |
Oxford |
Editor |
|
|
|
Language |
|
Wos |
000224848000006 |
Publication Date |
2004-10-13 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0584-8547; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
3.241 |
Times cited |
37 |
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: 3.241; 2004 IF: 3.086 |
|
|
Call Number |
UA @ lucian @ c:irua:54869UA @ admin @ c:irua:54869 |
Serial |
1038 |
|
Permanent link to this record |
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|
|
Author |
Musolino, N.; Bals, S.; Van Tendeloo, G.; Clayton, N.; Walker, E.; Flukiger, R. |
|
|
Title |
Investigation of (Bi,Pb)2212 crystals : observation of modulation-free phase |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
Physica: C : superconductivity |
Abbreviated Journal |
Physica C |
|
|
Volume |
401 |
Issue |
1-4 |
Pages |
270-272 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
|
Abstract |
We report the complete disappearance of the structural modulation in heavily lead-doped Bi2-xPbxSr2CaCu2O8+delta crystals observed by transmission electron microscopy. Crystals with a nominal lead content of x = 0.8, corresponding to an effective lead content of x = 0.39, yield the non-modulated phase. The superconducting properties of this modulation-free phase (beta phase) have been studied and compared to those of undoped crystals displaying the modulated phase (alpha phase). Magnetisation measurements reveal that the irreversibility field H-irr(T) and relaxation rates are strongly improved within the beta phase. Measurements of the lower critical field, H-cl, show that the anisotropy factor, E, is considerably reduced in the modulation-free crystals. This is the signature of stronger coupling between CuO2 layers which in turn deeply influences the effectiveness of the pinning. These measurements explain the enhanced pinning properties in moderately Pb-doped crystals in which the a phase and P phase coexist. The enhanced pinning is not only due to the alpha/beta interfaces, which act as effective pinning centers: the emergence of modulation-free domains, characterized by a strongly reduced anisotropy, also significantly contribute to this effect. (C) 2003 Elsevier B.V. All rights reserved. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
|
|
Language |
|
Wos |
000187852100050 |
Publication Date |
2003-10-17 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0921-4534; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
1.404 |
Times cited |
9 |
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: 1.404; 2004 IF: 1.072 |
|
|
Call Number |
UA @ lucian @ c:irua:94809 |
Serial |
1730 |
|
Permanent link to this record |
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|
|
Author |
Kirschhock, C.E.A.; Liang, D.; Aerts, A.; Aerts, C.A.; Kremer, S.P.B.; Jacobs, P.A.; Van Tendeloo, G.; Martens, J.A. |
|
|
Title |
On the TEM and AFM evidence of zeosil nanoslabs present during the synthesis of silicalite-1 : reply |
Type |
L1 Letter to the editor |
|
Year |
2004 |
Publication |
Angewandte Chemie: international edition in English |
Abbreviated Journal |
Angew Chem Int Edit |
|
|
Volume |
43 |
Issue |
35 |
Pages |
4562-4564 |
|
|
Keywords |
L1 Letter to the editor; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
|
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Publisher |
|
Place of Publication |
Weinheim |
Editor |
|
|
|
Language |
|
Wos |
000224008400003 |
Publication Date |
2004-08-20 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
1433-7851;1521-3773; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
11.994 |
Times cited |
|
Open Access |
|
|
|
Notes |
Fwo; Iap-Pai |
Approved |
Most recent IF: 11.994; 2004 IF: 9.161 |
|
|
Call Number |
UA @ lucian @ c:irua:103253 |
Serial |
2457 |
|
Permanent link to this record |
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|
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Author |
Collart, O.; Cool, P.; van der Voort, P.; Meynen, V.; Vansant, E.F.; Houthoofd, K.J.; Grobet, P.J.; Lebedev, O.I.; Van Tendeloo, G. |
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|
Title |
Aluminum incorporation into MCM-48 toward the creation of Brønsted acidity |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
The journal of physical chemistry : B : condensed matter, materials, surfaces, interfaces and biophysical |
Abbreviated Journal |
J Phys Chem B |
|
|
Volume |
108 |
Issue |
|
Pages |
13905-13912 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Laboratory of adsorption and catalysis (LADCA) |
|
|
Abstract |
|
|
|
Address |
|
|
|
Corporate Author |
|
Thesis |
|
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|
Publisher |
|
Place of Publication |
Washington, D.C. |
Editor |
|
|
|
Language |
|
Wos |
000224164000003 |
Publication Date |
2004-09-09 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
1520-6106;1520-5207; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
3.177 |
Times cited |
13 |
Open Access |
|
|
|
Notes |
Fwo; Iuap P5/01 |
Approved |
Most recent IF: 3.177; 2004 IF: 3.834 |
|
|
Call Number |
UA @ lucian @ c:irua:49014 |
Serial |
92 |
|
Permanent link to this record |
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|
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Author |
de Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.I.; van Landuyt, J.; Simoen, E.; Claeys, C. |
|
|
Title |
Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
Journal of the electrochemical society |
Abbreviated Journal |
J Electrochem Soc |
|
|
Volume |
151 |
Issue |
9 |
Pages |
G598-G605 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
|
Abstract |
Infrared absorption spectra of oxygen precipitates in boron-doped silicon with a boron concentration between 10(17) and 10(19) cm(-3) are analyzed, applying the spectral function representation of composite materials. The aspect ratio of the platelet precipitates is determined by transmission electron microscopy measurements. The analysis shows that in samples with moderate doping levels (<10(18) B cm(-3)) SiOγ precipitates are formed with the same composition as in the lightly doped case. In the heavily boron-doped (>10(18) cm(-3)) samples, however, the measured spectra of the precipitates are consistent with a mixture of SiO2 and B2O3, with a volume fraction of B2O3 as high as 0.41 in the most heavily doped case. (C) 2004 The Electrochemical Society. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
New York, N.Y. |
Editor |
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|
Language |
|
Wos |
000223622000072 |
Publication Date |
2004-08-30 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0013-4651; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
3.259 |
Times cited |
13 |
Open Access |
|
|
|
Notes |
Fwo; Iuap P5/01 |
Approved |
Most recent IF: 3.259; 2004 IF: 2.356 |
|
|
Call Number |
UA @ lucian @ c:irua:103760 |
Serial |
330 |
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Permanent link to this record |
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|
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Author |
Verbeeck, J.; Van Aert, S. |
|
|
Title |
Model based quantification of EELS spectra |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
|
Volume |
101 |
Issue |
2/4 |
Pages |
207-224 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
|
Abstract |
Recent advances in model based quantification of electron energy loss spectra (EELS) are reported. The maximum likelihood method for the estimation of physical parameters describing an EELS spectrum, the validation of the model used in this estimation procedure, and the computation of the attainable precision, that is, the theoretical lower bound on the variance of these estimates, are discussed. Experimental examples on An and GaAs samples show the power of the maximum likelihood method and show that the theoretical prediction of the attainable precision can be closely approached even for spectra with overlapping edges where conventional EELS quantification fails. To provide end-users with a low threshold alternative to conventional quantification, a user friendly program was developed which is freely available under a GNU public license. (C) 2004 Elsevier B.V. All rights reserved. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
Amsterdam |
Editor |
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|
|
Language |
|
Wos |
000224046100016 |
Publication Date |
2004-07-23 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
2.843 |
Times cited |
147 |
Open Access |
|
|
|
Notes |
Fwo; Iuap P5/01 |
Approved |
Most recent IF: 2.843; 2004 IF: 2.215 |
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|
Call Number |
UA @ lucian @ c:irua:57130UA @ admin @ c:irua:57130 |
Serial |
2101 |
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Permanent link to this record |
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Author |
Pardo, J.A.; Santiso, J.; Solis, C.; Garcia, G.; Figueras, A.; Rossell, M.D.; Van Tendeloo, G. |
|
|
Title |
Epitaxial Sr4Fe6O13\pm\delta films obtained by pulsed laser deposition |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
Journal of crystal growth |
Abbreviated Journal |
J Cryst Growth |
|
|
Volume |
262 |
Issue |
|
Pages |
334-340 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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|
Abstract |
|
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Address |
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
Amsterdam |
Editor |
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Language |
|
Wos |
000189098700052 |
Publication Date |
2003-11-15 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0022-0248; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
1.751 |
Times cited |
8 |
Open Access |
|
|
|
Notes |
Iap V-1 |
Approved |
Most recent IF: 1.751; 2004 IF: 1.707 |
|
|
Call Number |
UA @ lucian @ c:irua:54786 |
Serial |
1074 |
|
Permanent link to this record |
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|
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Author |
van Daele, B.; Van Tendeloo, G.; Jacobs, K.; Moerman, I.; Leys, M. |
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Title |
Formation of metallic In in InGaN/GaN multiquantum wells |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
Applied physics letters |
Abbreviated Journal |
Appl Phys Lett |
|
|
Volume |
85 |
Issue |
19 |
Pages |
4379-4381 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
|
Abstract |
|
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|
Address |
|
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Corporate Author |
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Thesis |
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|
|
Publisher |
American Institute of Physics |
Place of Publication |
New York, N.Y. |
Editor |
|
|
|
Language |
|
Wos |
000224962800038 |
Publication Date |
2004-11-08 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0003-6951; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
3.411 |
Times cited |
32 |
Open Access |
|
|
|
Notes |
IAP V-1; IWT-Project No.980319 |
Approved |
Most recent IF: 3.411; 2004 IF: 4.308 |
|
|
Call Number |
UA @ lucian @ c:irua:54804 |
Serial |
1261 |
|
Permanent link to this record |
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Author |
Stefanovich, S.Y.; Belik, A.A.; Azuma, M.; Takano, M.; Baryshnikova, O.V.; Morozov, V.A.; Lazoryak, B.I.; Lebedev, O.I.; Van Tendeloo, G. |
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Title |
Antiferroelectric phase transition in Sr9In(PO4)7 |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
Physical review : B : condensed matter and materials physics |
Abbreviated Journal |
Phys Rev B |
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Volume |
70 |
Issue |
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Pages |
172103,1-4 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Lancaster, Pa |
Editor |
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Language |
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Wos |
000225477000003 |
Publication Date |
2004-11-12 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1098-0121;1550-235X; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
3.836 |
Times cited |
17 |
Open Access |
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Notes |
Iuap P5/01 |
Approved |
Most recent IF: 3.836; 2004 IF: 3.075 |
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Call Number |
UA @ lucian @ c:irua:54744 |
Serial |
135 |
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Permanent link to this record |
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Author |
Van Tendeloo, G.; Lebedev, O.I.; Hervieu, M.; Raveau, B. |
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Title |
Structure and microstructure of colossal magnetoresistant materials |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
Reports on progress in physics |
Abbreviated Journal |
Rep Prog Phys |
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Volume |
67 |
Issue |
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Pages |
1315-1365 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
London |
Editor |
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Language |
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Wos |
000223732200001 |
Publication Date |
2004-07-06 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0034-4885;1361-6633; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
14.311 |
Times cited |
79 |
Open Access |
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Notes |
Iuap P5/01 |
Approved |
Most recent IF: 14.311; 2004 IF: 7.842 |
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Call Number |
UA @ lucian @ c:irua:54867 |
Serial |
3285 |
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Permanent link to this record |