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Author Ro, C.-U.; Kim, H.K.; Van Grieken, R.
Title An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data Type A1 Journal article
Year 2004 Publication Analytical chemistry Abbreviated Journal
Volume 76 Issue Pages 1322-1327
Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000189275100020 Publication Date 2004-02-27
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0003-2700; 5206-882x ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:43879 Serial 7949
Permanent link to this record
 
 
Author Godoi, A.F.L.; Ravindra, K.; Godoi, R.H.M.; Andrade, S.J.; Santiago-Silva, M.; Van Vaeck, L.; Van Grieken, R.
Title Fast chromatographic determination of polycyclic aromatic hydrocarbons in aerosol samples from sugar cane burning Type A1 Journal article
Year 2004 Publication Journal of chromatography: A: bibliography section Abbreviated Journal
Volume 1027 Issue Pages 49-53
Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000188498900008 Publication Date 2003-11-15
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:43528 Serial 7959
Permanent link to this record
 
 
Author Spolnik, Z.; Tsuji, K.; Van Grieken, R.
Title Grazing-exit electron probe x-ray microanalysis of light elements in particles Type A1 Journal article
Year 2004 Publication X-ray spectrometry Abbreviated Journal
Volume 33 Issue Pages 16-20
Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000188743100004 Publication Date 2004-01-21
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0049-8246 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:43524 Serial 8009
Permanent link to this record
 
 
Author Gysels, K.; Delalieux, F.; Deutsch, F.; Van Grieken, R.; Camuffo, D.; Bernardi, A.; Sturaro, G.; Busse, H.-J.; Wieser, M.
Title Indoor environment and conservation in the Royal Museum of Fine Arts, Antwerp, Belgium Type A1 Journal article
Year 2004 Publication Journal of cultural heritage Abbreviated Journal
Volume 5 Issue Pages 221-230
Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000222196400010 Publication Date 2004-05-29
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1296-2074 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:44970 Serial 8084
Permanent link to this record
 
 
Author Van Grieken, R.
Title Introduction: considering the role of X-ray spectrometry in chemical analysis and outlining the volume Type H3 Book chapter
Year 2004 Publication Abbreviated Journal
Volume Issue Pages 1-11 T2 - X-ray spectrometry: recent technological
Keywords H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:43877 Serial 8121
Permanent link to this record
 
 
Author Godoi, R.H.M.; Kontozova, V.; Godoi, A.F.L.; Van Grieken, R.
Title Investigation of individual particles and gaseous air pollutants in showcases Type H3 Book chapter
Year 2004 Publication Abbreviated Journal
Volume Issue Pages 147-150 T2 - Air pollution and cultural heritage /
Keywords H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:48941 Serial 8126
Permanent link to this record
 
 
Author Ravindra, K.; Bencs, L.; Van Grieken, R.
Title Platinum group elements in the environment and their health risk Type A1 Journal article
Year 2004 Publication The science of the total environment Abbreviated Journal
Volume 318 Issue Pages 1-43
Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000220194000001 Publication Date 2003-09-12
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0048-9697; 1879-1026 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:43525 Serial 8391
Permanent link to this record
 
 
Author Vekemans, B.; Vincze, L.; Brenker, F.E.; Adams, F.
Title Processing of three-dimensional microscopic X-ray fluorescence data Type A1 Journal article
Year 2004 Publication Journal of analytical atomic spectrometry Abbreviated Journal
Volume 19 Issue Pages 1302-1308
Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000224275400005 Publication Date 2004-10-05
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0267-9477 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:48543 Serial 8419
Permanent link to this record
 
 
Author Szalóki, I.; Ro, C.-U.; Osán, J.; de Hoog, J.; Van Grieken, R.
Title Speciation and surface analysis of single particles using electron-excited X-ray emission spectrometry Type H3 Book chapter
Year 2004 Publication Abbreviated Journal
Volume Issue Pages 569-592 T2 - X-ray spectrometry: recent technologi
Keywords H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:43878 Serial 8570
Permanent link to this record
 
 
Author Vincze, L.; Vekemans, B.; Adams, F.
Title Synchrotron computed X-ray fluorescence tomography in environmental and earth sciences: radiation Type P3 Proceeding
Year 2004 Publication Abbreviated Journal
Volume Issue Pages
Keywords P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:46497 Serial 8633
Permanent link to this record
 
 
Author Adams, F.; Vincze, L.; Vekemans, B.
Title Synchrotron radiation for microscopic X-ray fluorescence analysis Type H3 Book chapter
Year 2004 Publication Abbreviated Journal
Volume Issue Pages 343-353 T2 - X-ray spectrometry: recent technologi
Keywords H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:46499 Serial 8634
Permanent link to this record
 
 
Author Vincze, L.; Vekemans, B.; Brenker, F.E.; Falkenberg, G.; Rickers, K.; Somogyi, A.; Kersten, M.; Adams, F.
Title Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging Type A1 Journal article
Year 2004 Publication Analytical chemistry Abbreviated Journal
Volume 76 Issue 22 Pages 6786-6791
Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000225076400034 Publication Date 2004-11-12
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0003-2700; 5206-882x ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:49817 Serial 8669
Permanent link to this record
 
 
Author Vincze, L.; Vekemans, B.; Szaloki, I.; Brenker, F.E.; Falkenberg, G.; Rickers, K.; Aerts, K.; Van Grieken, R.; Adams, F.
Title X-ray fluorescence microtomography and polycapillary based confocal imaging using synchrotron radiation Type P1 Proceeding
Year 2004 Publication Abbreviated Journal
Volume Issue Pages 220-231 T2 - 4th Conference on Developments in X-R
Keywords P1 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract Ibis work illustrates the development of X-ray fluorescence tomography and polycapillary based confocal imaging towards a three-dimensional (313), quantitative analytical method with lateral resolution levels down to the 2-20 mum scale. Detailed analytical characterization is given for polycapillary based confocal XRF imaging, which is a new variant of the 3D micro-XRF technique. Applications for 2D/3D micro-XR-F are illustrated for the analysis of biological (zooplankton) and geological samples (microscopic inclusions in natural diamonds and fluid inclusions in quartz). Based on confocal imaging, fully three-dimensional distributions of trace elements could be obtained, representing a significant generalization of the regular 2D scanning technique for micro-XRF spectroscopy. The experimental work described in this paper has been carried out at the ESRF ID18F microfluorescence end-station and at HASYLAB Beam Line L.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000225665000023 Publication Date 2004-11-02
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0-8194-5473-7 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:94812 Serial 8767
Permanent link to this record
 
 
Author Szalóki, I.; Osán, J.; Van Grieken, R.E.
Title X-ray spectrometry Type A1 Journal article
Year 2004 Publication Analytical chemistry Abbreviated Journal
Volume 76 Issue 12 Pages 3445-3470
Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000222011100014 Publication Date 2004-06-14
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0003-2700; 5206-882x ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:46259 Serial 8772
Permanent link to this record
 
 
Author Van Grieken, R.; Delalieux, F.
Title X-ray spectrometry for air pollution and cultural heritage research Type P3 Proceeding
Year 2004 Publication Abbreviated Journal
Volume Issue Pages
Keywords P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:51259 Serial 8783
Permanent link to this record
 
 
Author Tsuji, K.; Injuk, J.; Van Grieken, R.
Title X-ray spectrometry: recent technological advances Type ME1 Book as editor or co-editor
Year 2004 Publication Abbreviated Journal
Volume Issue Pages 616 p.
Keywords ME1 Book as editor or co-editor; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN 0-471-48640-x Additional Links UA library record
Impact Factor Times cited Open Access
Notes (up) Approved no
Call Number UA @ admin @ c:irua:43876 Serial 8786
Permanent link to this record
 
 
Author Bals, S.; Kabius, B.; Haider, M.; Radmilovic, V.; Kisielowski, C.
Title Annular dark field imaging in a TEM Type A1 Journal article
Year 2004 Publication Solid state communications Abbreviated Journal Solid State Commun
Volume 130 Issue 10 Pages 675-680
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Annular objective apertures are fabricated for a CM300 transmission electron microscope using a focused ion beam system. A central beam stop in the back focal plane of the objective lens of the microscope blocks all electrons scattered up to a semi-angle of approximately 20 mrad. In this manner, contributions to the image from Bragg scattering are largely reduced and the image contrast is sensitive to the atomic number Z. Experimentally, we find that single atom scattering cross sections measured with this technique are close to Rutherford scattering values. A comparison between this new method and STEM-HAADF shows that both techniques result in qualitatively similar images although the resolution of ADF-TEM is limited by contrast delocalization caused by the spherical aberration of the objective lens. This problem can be overcome by using an aberration corrected microscope.
Address
Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos 000221489300007 Publication Date 2004-04-10
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0038-1098; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.554 Times cited 43 Open Access
Notes (up) Approved Most recent IF: 1.554; 2004 IF: 1.523
Call Number UA @ lucian @ c:irua:87584 Serial 132
Permanent link to this record
 
 
Author Lubyshev, D.; Fastenau, J.M.; Fang, X.-M.; Wu, Y.; Doss, C.; Snyder, A.; Liu, W.K.; Lamb, M.S.M.; Bals, S.; Song, C.
Title Comparison of As- and P-based metamorphic buffers for high performance InP heterojunction bipolar transistor and high electron mobility transistor applications Type A1 Journal article
Year 2004 Publication Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena Abbreviated Journal
Volume 22 Issue 3 Pages 1565-1569
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Metamorphic buffers (M-buffers) consisting of graded InAlAs or bulk InP were employed for the production of InP-based epiwafers on GaAs substrates by molecular-beam epitaxy. The graded InAlAs is the standard for production metamorphic high electron mobility transistors (M-HEMTs), while the bulk InP offers superior thermal properties for higher current density circuits. The surface morphology and crystal structure of the two M-buffers showed different relaxation mechanisms. The graded InAlAs gave a cross-hatched pattern with nearly full relaxation and very effective dislocation filtering, while the bulk InP had a uniform isotropic surface with dislocations propagating further up towards the active layers. Both types of M-buffers had atomic force microscopy root-mean-square roughness values around 2030 Å. The Hall transport properties of high electron mobility transistors (HEMTs) grown on the InAlAs M-buffer, and a baseline HEMT grown lattice matched on InP, both had room-temperature mobilities >10 000 cm2/V s, while the M-HEMT on the InP M-buffer showed a decrease to 9000 cm2/V  s. Similarly, the dc parameters of a double heterojunction bipolar transistor (DHBT) grown on the InAlAs M-buffer were much closer to the baseline heterojunction bipolar transistor than a DHBT grown on the InP M-buffer. A high breakdown voltage of 11.3 V was achieved on an M-DHBT with the InAlAs M-buffer. We speculate that the degradation in device characteristics on the InP M-buffer was related to the incomplete dislocation filtering.
Address
Corporate Author Thesis
Publisher Place of Publication Woodbury, N.Y. Editor
Language Wos 000222481400141 Publication Date 2004-07-08
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0734-211X; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited 25 Open Access
Notes (up) Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:87596 Serial 427
Permanent link to this record
 
 
Author Blumenau, A.T.; Frauenheim, T.; Öberg, S.; Willems, B.; Van Tendeloo, G.
Title Dislocation structures in diamond: density-functional based modelling and high resolution electron microscopy Type MA1 Book as author
Year 2004 Publication Abbreviated Journal
Volume Issue Pages
Keywords MA1 Book as author; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Trans Tech Publications Place of Publication s.l. Editor
Language Wos Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes (up) Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:54872 Serial 732
Permanent link to this record
 
 
Author Hamon, A.-L.; Verbeeck, J.; Schryvers, D.; Benedikt, J.; van den Sanden, R.M.C.M.
Title ELNES study of carbon K-edge spectra of plasma deposited carbon films Type A1 Journal article
Year 2004 Publication Journal of materials chemistry Abbreviated Journal J Mater Chem
Volume 14 Issue Pages 2030-2035
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Electron energy loss spectroscopy was used to investigate the bonding of plasma deposited carbon films. The experimental conditions include the use of a specific collection angle for which the shape of the spectra is free of the orientation dependency usually encountered in graphite due to its anisotropic structure. The first quantification process of the energy loss near-edge structure was performed by a standard fit of the collected spectrum, corrected for background and multiple scattering, with three Gaussian functions followed by a comparison with the graphite spectrum obtained under equivalent experimental conditions. In a second approach a fitting model directly incorporating the background subtraction and multiple scattering removal was applied. The final numerical results are interpreted in view of the deposition conditions of the films and the actual fitting procedure with the related choice of parameters.
Address
Corporate Author Thesis
Publisher Place of Publication Cambridge Editor
Language Wos 000222312500017 Publication Date 2004-06-28
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0959-9428;1364-5501; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 6.626 Times cited 61 Open Access
Notes (up) Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:48782UA @ admin @ c:irua:48782 Serial 1025
Permanent link to this record
 
 
Author Verbeeck, J.; van Dyck, D.; Van Tendeloo, G.
Title Energy-filtered transmission electron microscopy: an overview Type A1 Journal article
Year 2004 Publication Spectrochimica acta: part B : atomic spectroscopy Abbreviated Journal Spectrochim Acta B
Volume 59 Issue 10/11 Pages 1529-1534
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract This paper aims to give an overview of the technique of energy-filtered transmission electron microscopy (EFTEM). It explains the basic principles of the technique and points to the relevant literature for more detailed issues. Experimental examples are given to show the power of EFTEM to study the chemical composition of nanoscale samples in materials science. Advanced EFTEM applications like imaging spectroscopy and EFTEM tomography are briefly discussed. (C) 2004 Elsevier B.V. All rights reserved.
Address
Corporate Author Thesis
Publisher Place of Publication Oxford Editor
Language Wos 000224848000006 Publication Date 2004-10-13
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0584-8547; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.241 Times cited 37 Open Access
Notes (up) Approved Most recent IF: 3.241; 2004 IF: 3.086
Call Number UA @ lucian @ c:irua:54869UA @ admin @ c:irua:54869 Serial 1038
Permanent link to this record
 
 
Author Musolino, N.; Bals, S.; Van Tendeloo, G.; Clayton, N.; Walker, E.; Flukiger, R.
Title Investigation of (Bi,Pb)2212 crystals : observation of modulation-free phase Type A1 Journal article
Year 2004 Publication Physica: C : superconductivity Abbreviated Journal Physica C
Volume 401 Issue 1-4 Pages 270-272
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract We report the complete disappearance of the structural modulation in heavily lead-doped Bi2-xPbxSr2CaCu2O8+delta crystals observed by transmission electron microscopy. Crystals with a nominal lead content of x = 0.8, corresponding to an effective lead content of x = 0.39, yield the non-modulated phase. The superconducting properties of this modulation-free phase (beta phase) have been studied and compared to those of undoped crystals displaying the modulated phase (alpha phase). Magnetisation measurements reveal that the irreversibility field H-irr(T) and relaxation rates are strongly improved within the beta phase. Measurements of the lower critical field, H-cl, show that the anisotropy factor, E, is considerably reduced in the modulation-free crystals. This is the signature of stronger coupling between CuO2 layers which in turn deeply influences the effectiveness of the pinning. These measurements explain the enhanced pinning properties in moderately Pb-doped crystals in which the a phase and P phase coexist. The enhanced pinning is not only due to the alpha/beta interfaces, which act as effective pinning centers: the emergence of modulation-free domains, characterized by a strongly reduced anisotropy, also significantly contribute to this effect. (C) 2003 Elsevier B.V. All rights reserved.
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000187852100050 Publication Date 2003-10-17
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0921-4534; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.404 Times cited 9 Open Access
Notes (up) Approved Most recent IF: 1.404; 2004 IF: 1.072
Call Number UA @ lucian @ c:irua:94809 Serial 1730
Permanent link to this record
 
 
Author Kirschhock, C.E.A.; Liang, D.; Aerts, A.; Aerts, C.A.; Kremer, S.P.B.; Jacobs, P.A.; Van Tendeloo, G.; Martens, J.A.
Title On the TEM and AFM evidence of zeosil nanoslabs present during the synthesis of silicalite-1 : reply Type L1 Letter to the editor
Year 2004 Publication Angewandte Chemie: international edition in English Abbreviated Journal Angew Chem Int Edit
Volume 43 Issue 35 Pages 4562-4564
Keywords L1 Letter to the editor; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Weinheim Editor
Language Wos 000224008400003 Publication Date 2004-08-20
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1433-7851;1521-3773; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 11.994 Times cited Open Access
Notes (up) Fwo; Iap-Pai Approved Most recent IF: 11.994; 2004 IF: 9.161
Call Number UA @ lucian @ c:irua:103253 Serial 2457
Permanent link to this record
 
 
Author Collart, O.; Cool, P.; van der Voort, P.; Meynen, V.; Vansant, E.F.; Houthoofd, K.J.; Grobet, P.J.; Lebedev, O.I.; Van Tendeloo, G.
Title Aluminum incorporation into MCM-48 toward the creation of Brønsted acidity Type A1 Journal article
Year 2004 Publication The journal of physical chemistry : B : condensed matter, materials, surfaces, interfaces and biophysical Abbreviated Journal J Phys Chem B
Volume 108 Issue Pages 13905-13912
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Laboratory of adsorption and catalysis (LADCA)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Washington, D.C. Editor
Language Wos 000224164000003 Publication Date 2004-09-09
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1520-6106;1520-5207; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.177 Times cited 13 Open Access
Notes (up) Fwo; Iuap P5/01 Approved Most recent IF: 3.177; 2004 IF: 3.834
Call Number UA @ lucian @ c:irua:49014 Serial 92
Permanent link to this record
 
 
Author de Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.I.; van Landuyt, J.; Simoen, E.; Claeys, C.
Title Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy Type A1 Journal article
Year 2004 Publication Journal of the electrochemical society Abbreviated Journal J Electrochem Soc
Volume 151 Issue 9 Pages G598-G605
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Infrared absorption spectra of oxygen precipitates in boron-doped silicon with a boron concentration between 10(17) and 10(19) cm(-3) are analyzed, applying the spectral function representation of composite materials. The aspect ratio of the platelet precipitates is determined by transmission electron microscopy measurements. The analysis shows that in samples with moderate doping levels (<10(18) B cm(-3)) SiOγ precipitates are formed with the same composition as in the lightly doped case. In the heavily boron-doped (>10(18) cm(-3)) samples, however, the measured spectra of the precipitates are consistent with a mixture of SiO2 and B2O3, with a volume fraction of B2O3 as high as 0.41 in the most heavily doped case. (C) 2004 The Electrochemical Society.
Address
Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos 000223622000072 Publication Date 2004-08-30
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0013-4651; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.259 Times cited 13 Open Access
Notes (up) Fwo; Iuap P5/01 Approved Most recent IF: 3.259; 2004 IF: 2.356
Call Number UA @ lucian @ c:irua:103760 Serial 330
Permanent link to this record
 
 
Author Verbeeck, J.; Van Aert, S.
Title Model based quantification of EELS spectra Type A1 Journal article
Year 2004 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
Volume 101 Issue 2/4 Pages 207-224
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Recent advances in model based quantification of electron energy loss spectra (EELS) are reported. The maximum likelihood method for the estimation of physical parameters describing an EELS spectrum, the validation of the model used in this estimation procedure, and the computation of the attainable precision, that is, the theoretical lower bound on the variance of these estimates, are discussed. Experimental examples on An and GaAs samples show the power of the maximum likelihood method and show that the theoretical prediction of the attainable precision can be closely approached even for spectra with overlapping edges where conventional EELS quantification fails. To provide end-users with a low threshold alternative to conventional quantification, a user friendly program was developed which is freely available under a GNU public license. (C) 2004 Elsevier B.V. All rights reserved.
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000224046100016 Publication Date 2004-07-23
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.843 Times cited 147 Open Access
Notes (up) Fwo; Iuap P5/01 Approved Most recent IF: 2.843; 2004 IF: 2.215
Call Number UA @ lucian @ c:irua:57130UA @ admin @ c:irua:57130 Serial 2101
Permanent link to this record
 
 
Author Pardo, J.A.; Santiso, J.; Solis, C.; Garcia, G.; Figueras, A.; Rossell, M.D.; Van Tendeloo, G.
Title Epitaxial Sr4Fe6O13\pm\delta films obtained by pulsed laser deposition Type A1 Journal article
Year 2004 Publication Journal of crystal growth Abbreviated Journal J Cryst Growth
Volume 262 Issue Pages 334-340
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000189098700052 Publication Date 2003-11-15
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0022-0248; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.751 Times cited 8 Open Access
Notes (up) Iap V-1 Approved Most recent IF: 1.751; 2004 IF: 1.707
Call Number UA @ lucian @ c:irua:54786 Serial 1074
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Author van Daele, B.; Van Tendeloo, G.; Jacobs, K.; Moerman, I.; Leys, M.
Title Formation of metallic In in InGaN/GaN multiquantum wells Type A1 Journal article
Year 2004 Publication Applied physics letters Abbreviated Journal Appl Phys Lett
Volume 85 Issue 19 Pages 4379-4381
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher American Institute of Physics Place of Publication New York, N.Y. Editor
Language Wos 000224962800038 Publication Date 2004-11-08
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0003-6951; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.411 Times cited 32 Open Access
Notes (up) IAP V-1; IWT-Project No.980319 Approved Most recent IF: 3.411; 2004 IF: 4.308
Call Number UA @ lucian @ c:irua:54804 Serial 1261
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Author Stefanovich, S.Y.; Belik, A.A.; Azuma, M.; Takano, M.; Baryshnikova, O.V.; Morozov, V.A.; Lazoryak, B.I.; Lebedev, O.I.; Van Tendeloo, G.
Title Antiferroelectric phase transition in Sr9In(PO4)7 Type A1 Journal article
Year 2004 Publication Physical review : B : condensed matter and materials physics Abbreviated Journal Phys Rev B
Volume 70 Issue Pages 172103,1-4
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Lancaster, Pa Editor
Language Wos 000225477000003 Publication Date 2004-11-12
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1098-0121;1550-235X; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.836 Times cited 17 Open Access
Notes (up) Iuap P5/01 Approved Most recent IF: 3.836; 2004 IF: 3.075
Call Number UA @ lucian @ c:irua:54744 Serial 135
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Author Van Tendeloo, G.; Lebedev, O.I.; Hervieu, M.; Raveau, B.
Title Structure and microstructure of colossal magnetoresistant materials Type A1 Journal article
Year 2004 Publication Reports on progress in physics Abbreviated Journal Rep Prog Phys
Volume 67 Issue Pages 1315-1365
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication London Editor
Language Wos 000223732200001 Publication Date 2004-07-06
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0034-4885;1361-6633; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 14.311 Times cited 79 Open Access
Notes (up) Iuap P5/01 Approved Most recent IF: 14.311; 2004 IF: 7.842
Call Number UA @ lucian @ c:irua:54867 Serial 3285
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