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  Author Title Year Publication Volume Times cited Additional Links Links
van Landuyt, J.; Van Tendeloo, G.; Amelinckx, S.; Zhang, X.F.; Zhang, X.B.; Luyten, W. Crystallography of fullerites and related graphene textures 1994 Materials science forum 150/151 UA library record; WoS full record;
Van Tendeloo, G.; Hervieu, M.; Chaillout, C. Defect structure of Hg-based ceramic superconductors (invited) 1994 Sciences UA library record; WoS full record;
Deveirman, A.; van Landuyt, J.; Vanhellemont, J.; Maes, H.E.; Yallup, K. Defects in high-dose oxygen implanted silicon : a TEM study 1991 Vacuum: the international journal and abstracting service for vacuum science and technology T2 – 1ST SIOMX WORKSHOP ( SEPARATION BY IMPLANTATION OF OXYGEN ) ( SWI-88 ), NOV 07-08, 1988, UNIV SURREY, GUILDFORD, ENGLAND 42 4 UA library record; WoS full record; WoS citing articles pdf doi
Ignatova, V.A.; Conard, T.; Möller, W.; Vandervorst, W.; Gijbels, R. Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study 2004 Applied surface science 231/232 4 UA library record; WoS full record; WoS citing articles doi
Kolev, I.; Bogaerts, A. Detailed numerical investigation of a DC sputter magnetron 2006 IEEE transactions on plasma science 34 28 UA library record; WoS full record; WoS citing articles doi
Huygh, S.; Bogaerts, A.; van Duin, A.C.T.; Neyts, E.C. Development of a ReaxFF reactive force field for intrinsic point defects in titanium dioxide 2014 Computational materials science 95 15 UA library record; WoS full record; WoS citing articles pdf url doi
De Bie, C.; Martens, T.; van Dijk, J.; Paulussen, S.; Verheyde, B.; Corthals, S.; Bogaerts, A. Dielectric barrier discharges used for the conversion of greenhouse gases: modeling the plasma chemistry by fluid simulations 2011 Plasma sources science and technology 20 38 UA library record; WoS full record; WoS citing articles pdf doi
Peerenboom, K.; Parente, A.; Kozák, T.; Bogaerts, A.; Degrez, G. Dimension reduction of non-equilibrium plasma kinetic models using principal component analysis 2015 Plasma sources science and technology 24 11 UA library record; WoS full record; WoS citing articles pdf url doi
Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Kononenko, T.V.; Obraztsova, E.D.; Strelnitsky, V.E. Direct observation of laser-induced crystallization of a-C : H films 1994 Applied physics A : materials science & processing 58 73 UA library record; WoS full record; WoS citing articles doi
Leadley, D.R.; Nicholas, R.J.; Singleton, J.; Xu, W.; Peeters, F.M.; Devreese, J.T.; van Bockstal, L.; Herlach, F.; Perenboom, J.A.A.J.; Harris, J.J.; Foxon, C.T. Disappearance of magnetophonon resonance at high magnetic fields in GaAs-GaAlAs heterojunctions 1994 Surface science : a journal devoted to the physics and chemistry of interfaces 305 1 UA library record; WoS full record; WoS citing articles doi
Kalitzova, M.; Lebedev, O.I.; Zollo, G.; Gesheva, K.; Vlakhov, E.; Marinov, Y.; Ivanova, T.; Dynamics of nanoclustering in Te+ implanted Si after application of high frequency electromagnetic field and thermal annealing 2008 Applied physics A : materials science & processing 91 UA library record; WoS full record pdf doi
Srivastava, A.K.; Yang, Z.; Schryvers, D.; van Hurnbeeck, J. Effect of annealing on cold-rolled Ni-Ti alloys 2008 Materials science and engineering: part A: structural materials: properties, microstructure and processing 481 8 UA library record; WoS full record; WoS citing articles pdf doi
Wang, X.; Amin-Ahmadi, B.; Schryvers, D.; Verlinden, B.; Van Humbeeck, J. Effect of annealing on the transformation behavior and mechanical properties of two nanostructured Ti-50.8at.%Ni thin wires produced by different methods 2013 Materials science forum 738/739 5 UA library record; WoS full record; WoS citing articles doi
Amin-Ahmadi, B.; Idrissi, H.; Galceran, M.; Colla, M.S.; Raskin, J.P.; Pardoen, T.; Godet, S.; Schryvers, D. Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films 2013 Thin solid films : an international journal on the science and technology of thin and thick films 539 13 UA library record; WoS full record; WoS citing articles pdf doi
Kalitzova, M.; Vlakhov, E.; Marinov, Y.; Gesheva, K.; Ignatova, V.A.; Lebedev, O.; Muntele, C.; Gijbels, R. Effect of high-frequency electromagnetic field on Te+-implanted (001) Si</tex> 2004 Vacuum: the international journal and abstracting service for vacuum science and technology 76 2 UA library record; WoS full record; WoS citing articles pdf doi
Berdiyorov, G.; Harrabi, K.; Maneval, J.P.; Peeters, F.M. Effect of pinning on the response of superconducting strips to an external pulsed current 2015 Superconductor science and technology 28 19 UA library record; WoS full record; WoS citing articles url doi
E. Zaghi, A.; Buffière, M.; Koo, J.; Brammertz, G.; Batuk, M.; Verbist, C.; Hadermann, J.; Kim, W.K.; Meuris, M.; Poortmans, J.; Vleugels, J.; Effect of selenium content of CuInSex alloy nanopowder precursors on recrystallization of printed CuInSe2 absorber layers during selenization heat treatment 2014 Thin solid films : an international journal on the science and technology of thin and thick films 7 UA library record; WoS full record; WoS citing articles pdf doi
Zhao, S.-X.; Gao, F.; Wang, Y.-N.; Bogaerts, A. The effect of F2 attachment by low-energy electrons on the electron behaviour in an Ar/CF4 inductively coupled plasma 2012 Plasma sources science and technology 21 23 UA library record; WoS full record; WoS citing articles pdf doi
Batuk, M.; Buffiere, M.; Zaghi, A.E.; Lenaers, N.; Verbist, C.; Khelifi, S.; Vleugels, J.; Meuris, M.; Hadermann, J. Effect of the burn-out step on the microstructure of the solution-processed Cu(In,Ga)Se2 solar cells 2015 Thin solid films : an international journal on the science and technology of thin and thick films 583 5 UA library record; WoS full record; WoS citing articles pdf doi
Liu, Y.-X.; Zhang, Y.-R.; Bogaerts, A.; Wang, Y.-N. Electromagnetic effects in high-frequency large-area capacitive discharges : a review 2015 Journal of vacuum science and technology: A: vacuum surfaces and films 33 10 UA library record; WoS full record; WoS citing articles pdf doi
Liu, Y.-X.; Zhang, Q.-Z.; Liu, L.; Song, Y.-H.; Bogaerts, A.; Wang, Y.-N. Electron bounce resonance heating in dual-frequency capacitively coupled oxygen discharges 2013 Plasma sources science and technology 22 20 UA library record; WoS full record; WoS citing articles pdf doi
Tirry, W.; Schryvers, D.; Jorissen, K.; Lamoen, D. Electron-diffraction structure refinement of Ni4Ti3 precipitates in Ni52Ti48 2006 Acta crystallographica: section B: structural science 62 30 UA library record; WoS full record; WoS citing articles doi
Yan, M.; Bogaerts, A.; Goedheer, W.J.; Gijbels, R. Electron energy distribution function in capacitively coupled RF discharges: differences between electropositive Ar and electronegative SiH4 discharges 2000 Plasma sources science and technology 9 21 UA library record; WoS full record; WoS citing articles doi
Yang, Z.Q.; Schryvers, D. Electron energy-loss spectroscopy study of NiTi shape memory alloys 2008 Materials science and engineering: part A: structural materials: properties, microstructure and processing 481 7 UA library record; WoS full record; WoS citing articles pdf doi
Van Tendeloo, G.; Amelinckx, S. Electron-microscopy and the structural studies of superconducting materials and fullerites 1994 NATO Advanced Study Institutes series: series E : applied sciences T2 – NATO Advanced Study Institute on Materials and crystallographic Aspects, of HT(c)-Superconductivity, May 17-30, 1993, Erice, Italy UA library record; WoS full record;
Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate 1996 Applied surface science 102 9 UA library record; WoS full record; WoS citing articles doi
Ibrahim, I.S.; Peeters, F.M. Electrons in a periodic magnetic field 1996 Surface science : a journal devoted to the physics and chemistry of interfaces 361/362 3 UA library record; WoS full record; WoS citing articles doi
Shi, H.; Frenzel, J.; Schryvers, D. EM characterization of precipitates in as-cast and annealed Ni45.5Ti45.5Nb9 shape memory alloys 2013 Materials science forum 738/739 1 UA library record; WoS full record; WoS citing articles pdf doi
Zhang, X.B.; Vasiliev, A.L.; Van Tendeloo, G.; He, Y.; Yu, L.-M.; Thiry, P.A. EM, XPS and LEED study of deposition of Ag on hydrogenated Si substrate prepared by wet chemical treatments 1995 Surface science : a journal devoted to the physics and chemistry of interfaces 340 11 UA library record; WoS full record; WoS citing articles doi
de Mondt, R.; Adriaensen, L.; Vangaever, F.; Lenaerts, J.; van Vaeck, L.; Gijbels, R. Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) 2006 Applied surface science 252 9 UA library record; WoS full record; WoS citing articles doi
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