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Author Araujo, M.F.; van Espen, P.; Van Grieken, R.
Title Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation Type A1 Journal article
Year 1990 Publication X-ray spectrometry Abbreviated Journal
Volume 19 Issue 1 Pages 29-33
Keywords (up) A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract A semi-empirical approach is described for determining the mass per unit area of a sample being analysed. The method can be used to estimate the concentration of minor and trace elements in matrices containing a substantial amount of light elements. The procedure utilizes the coherently and incoherently scattered radiation induced in the sample by the filtered continuum radiation of a rhodium x-ray tube. The relationship between the intensity of the scattered radiation per unit mass and the average atomic number of the sample is established via calibration graphs, which can be applied for different x-ray tube voltages and for different primary beam filters. The overall procedure was validated by the analysis of several geological standards, deposited as thin slurries of unknown thickness either on Mylar foil or on Nuclepore filters.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos A1990CU24700005 Publication Date 2005-05-28
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0049-8246 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:116491 Serial 7787
Permanent link to this record
 

 
Author van Espen, P.; Van 't dack, L.; Adams, F.; Van Grieken, R.
Title Effective sample weight from scatter peaks in energy-dispersive x-ray fluorescence Type A1 Journal article
Year 1979 Publication Analytical chemistry Abbreviated Journal
Volume 51 Issue 7 Pages 961-967
Keywords (up) A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos A1979GW66100047 Publication Date 2005-03-16
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0003-2700; 5206-882x ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:111404 Serial 7841
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Author Osán, J.; de Hoog, J.; van Espen, P.; Szalóki, I.; Ro, C.-U.; Van Grieken, R.
Title Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles Type A1 Journal article
Year 2001 Publication X-ray spectrometry Abbreviated Journal
Volume 30 Issue Pages 419-426
Keywords (up) A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000172347800010 Publication Date 2002-08-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0049-8246 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:36091 Serial 7939
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Author Kindratenko, V.V.; van Espen, P.J.M.; Treiger, B.A.; Van Grieken, R.E.
Title Fractal dimensional classification of aerosol particles by computer-controlled scanning electron microscopy Type A1 Journal article
Year 1994 Publication Environmental science and technology Abbreviated Journal
Volume 28 Issue Pages 2197-2202
Keywords (up) A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos A1994PP82900033 Publication Date 2007-05-30
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0013-936x; 1520-5851 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:9497 Serial 7983
Permanent link to this record
 

 
Author Bondarenko, I.; Treiger, B.; Van Grieken, R.; van Espen, P.
Title IDAS: a Windows based software package for cluster analysis Type A1 Journal article
Year 1996 Publication Spectrochimica acta: part B : atomic spectroscopy Abbreviated Journal
Volume 51 Issue Pages 441-456
Keywords (up) A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0584-8547; 1873-3565 ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:14649 Serial 8050
Permanent link to this record
 

 
Author Treiger, B.; Injuk, J.; Bondarenko, I.; van Espen, P.; Van Grieken, R.; Breitenbach, L.; Wätjen, U.
Title Non-linear mapping of microbeam proton-induced X-ray emission data for source identification of North Sea aerosols Type A1 Journal article
Year 1994 Publication Spectrochimica acta: part B : atomic spectroscopy Abbreviated Journal
Volume 49 Issue 4 Pages 345-353
Keywords (up) A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos A1994NM41200004 Publication Date 2003-04-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0584-8547; 1873-3565 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:9500 Serial 8314
Permanent link to this record
 

 
Author Samek, L.; Injuk, J.; van Espen, P.; Van Grieken, R.
Title Performance of a new compact EDXRF spectrometer for aerosol analysis Type A1 Journal article
Year 2002 Publication X-ray spectrometry Abbreviated Journal
Volume 31 Issue Pages 84-86
Keywords (up) A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000173653400015 Publication Date 2002-10-06
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0049-8246 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:36383 Serial 8371
Permanent link to this record
 

 
Author Maenhaut, W.; Selen, A.; van Espen, P.; Van Grieken, R.; Winchester, W.J.
Title Pixe analysis of aerosol samples collected over the atlantic-ocean from a sailboat Type A1 Journal article
Year 1981 Publication Nuclear instruments and methods Abbreviated Journal
Volume 181 Issue 1-3 Pages 399-405
Keywords (up) A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract Size-fractionated aerosol samples, collected over the Atlantic Ocean, were analyzed for up to 20 elements by PIXE. Using a sailboat as sampling platform, duplicate samples were taken for two-day periods by means of battery operated 6-stage cascade impactors, positioned about 8 m above the sea surface. In the PIXE analysis of the fine particle stages (stages 3 to 5) a 5 times smaller beam size was used than for stages 1 and 2. This led to significant improvement in the detection limits for the former stages. The results from the duplicate impactor samples were normally in good agreement, indicating that the combined uncertainty of sampling and PIXE analysis was of the order of 20%. The precision of the PIXE analysis alone was investigated by rebombarding some samples six months after the first analysis. The trends with time of the fine particle sulfur and the coarse particle iron concentrations are discussed in some detail.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos A1981LH81100073 Publication Date 2002-11-11
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0029-554x; 1878-3759 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:113628 Serial 8386
Permanent link to this record
 

 
Author Eltayeb, M.A.H.; van Espen, P.J.; Cafmeyer, J.; Van Grieken, R.E.; Maenhaut, W.
Title Size-differentiated composition of aerosols in Khartoum, Sudan Type A1 Journal article
Year 1992 Publication The science of the total environment Abbreviated Journal
Volume 120 Issue Pages 281-299
Keywords (up) A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos A1992JA65200008 Publication Date 2003-09-12
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0048-9697; 1879-1026 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:2834 Serial 8543
Permanent link to this record
 

 
Author Treiger, B.; van Malderen, H.; Bondarenko, I.; van Espen, P.; Van Grieken, R.
Title Studying aerosol samples by non-linear mapping of electron probe microanalysis data Type A1 Journal article
Year 1993 Publication Analytica chimica acta Abbreviated Journal
Volume 284 Issue Pages 119-124
Keywords (up) A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos A1993MR27600014 Publication Date 2002-07-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0003-2670; 1873-4324 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:6224 Serial 8610
Permanent link to this record
 

 
Author Trincavelli, J.; Montoro, S.; van Espen, P.; Van Grieken, R.
Title M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range Type A1 Journal article
Year 1993 Publication X-ray spectrometry Abbreviated Journal
Volume 22 Issue Pages 372-376
Keywords (up) A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract Both energy- and wavelength-dispersive systems were used to obtain Malpha/Lalpha intensity ratios for Ta, W, Pt, Au, Pb and Bi at various overvoltages. A table of these ratios corrected for matrix absorption and detector efficiency is presented, in addition to an interpolatory function of Malpha/Lalpha generated ratios vs. overvoltage, for each element. In addition, three different ZAF correction models were used to predict both detected and generated ratios. Finally, experimental Mbeta/Malpha ratios measured at different overvoltages are presented for the six elements considered.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos A1993MB01200008 Publication Date 2005-05-28
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0049-8246 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:6221 Serial 8649
Permanent link to this record
 

 
Author Baly, L.; Quesada, I.; Murray, A.S.; Martin, G.; van Espen, P.; Arteche, R.; Jain, M.
Title Modeling the charge deposition in quartz grains during natural irradiation and its influence on the optically stimulated luminescence signal Type A1 Journal article
Year 2021 Publication Radiation Measurements Abbreviated Journal Radiat Meas
Volume 142 Issue Pages 106564
Keywords (up) A1 Journal article; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract The rate of charge deposition in quartz grains irradiated in natural conditions is computed by radiation transport modeling. Quartz luminescence models are modified with the addition of the resulting charge deposition term, and the influence of this process on the optically stimulated luminescence (OSL) signal is analyzed. The results indicate that the charge deposition occurring in the quartz grain during the time of residence within rock could lead to the depletion of trapped holes in the recombination centres. For the two different quartz models investigated here, complete depletion is expected to occur for rock ages between 500 Ma and 1100 Ma. It is predicted that for sedimentary quartz derived from such rocks, the OSL signal is dominated by the slow component. It was also found that the shape and saturation level of the natural sensitivity-corrected dose response curve (DRC) of quartz is affected by the charge deposition; specifically, a linear reduction of the saturation level with the age of the rock is observed.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000639160300003 Publication Date 2021-03-18
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1350-4487 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.442 Times cited Open Access Not_Open_Access
Notes Approved Most recent IF: 1.442
Call Number UA @ admin @ c:irua:178307 Serial 8265
Permanent link to this record
 

 
Author Piñera, I.; Cruz, C.M.; van Espen, P.; Abreu, Y.; Leyva, A.
Title Study of dpa distributions in electron irradiated YBCO slabs through MCCM algorithm Type A1 Journal article
Year 2012 Publication Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms Abbreviated Journal
Volume 274 Issue Pages 191-194
Keywords (up) A1 Journal article; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract The Monte Carlo assisted Classical Method (MCCM) consists on a calculation procedure for determining the displacements per atom (dpa) distribution in solid materials. This algorithm allows studying the gamma and electron irradiation damage in different materials. It is based on the electrons elastic scattering classic theories and the use of Monte Carlo simulation for the physical processes involved. The present study deals with the Monte Carlo simulation of electron irradiation effects on YBa2Cu3O7-x (YBCO) slabs using the MCNPX code system. Displacements per atom distributions are obtained through the MCCM for electron irradiation up to 10 MeV. In-depth dpa profiles for electrons and positrons are obtained and analysed. Also, dpa contributions from each atomic specie in the material are calculated. It was found that the dpa distribution is more homogeneous in the material volume when increasing energy of incident electrons. Also, the dpa produced by positrons has no relevance when irradiating with electrons, in contrast with previous similar gamma irradiation studies. All the results are presented and discussed in this contribution. (C) 2011 Elsevier B.V. All rights reserved.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000301611900031 Publication Date 2011-12-05
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0168-583x ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:97819 Serial 8595
Permanent link to this record
 

 
Author Van Echelpoel, R.; de Jong, M.; Daems, D.; van Espen, P.; De Wael, K.
Title Unlocking the full potential of voltammetric data analysis : a novel peak recognition approach for (bio)analytical applications Type A1 Journal article
Year 2021 Publication Talanta Abbreviated Journal Talanta
Volume 233 Issue Pages 122605
Keywords (up) A1 Journal article; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract Bridging the gap between complex signal data output and clear interpretation by non-expert end-users is a major challenge many scientists face when converting their scientific technology into a real-life application. Currently, pattern recognition algorithms are the most frequently encountered signal data interpretation algorithms to close this gap, not in the least because of their straight-forward implementation via convenient software packages. Paradoxically, just because their implementation is so straight-forward, it becomes cumbersome to integrate the expert's domain-specific knowledge. In this work, a novel signal data interpretation approach is presented that uses this domain-specific knowledge as its fundament, thereby fully exploiting the unique expertise of the scientist. The new approach applies data preprocessing in an innovative way that transcends its usual purpose and is easy to translate into a software application. Multiple case studies illustrate the straight-forward application of the novel approach. Ultimately, the approach is highly suited for integration in various (bio)analytical applications that require interpretation of signal data.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000668000500108 Publication Date 2021-06-11
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0039-9140; 1873-3573 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 4.162 Times cited Open Access OpenAccess
Notes Approved Most recent IF: 4.162
Call Number UA @ admin @ c:irua:179417 Serial 8712
Permanent link to this record
 

 
Author Janssens, K.; Vekemans, B.; Adams, F.; van Espen, P.; Mutsaers, P.
Title Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting Type A1 Journal article
Year 1996 Publication Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 – 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy Abbreviated Journal 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY
Volume 109 Issue Pages 179-185
Keywords (up) A1 Journal article; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract The integration of the nonlinear least squares X-ray spectrum evaluation progam AXIL. into a mu-PIXE and a mu-XRF setup is discussed. The use of the software when procesing data sets derived from biological and geological samples is described.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos A1996UV44400035 Publication Date 2002-07-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0168-583x ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:95887 Serial 5457
Permanent link to this record
 

 
Author Pinera, I.; Cruz, C.M.; Abreu, Y.; Leyva, A.; van Espen, P.; Diaz, A.; Cabal, A.E.; Van Remortel, N.
Title Gamma induced atom displacements in LYSO and LuYAP crystals as used in medical imaging applications Type A1 Journal article
Year 2015 Publication Interactions With Materials And Atoms Abbreviated Journal
Volume 356 Issue Pages 46-52
Keywords (up) A1 Journal article; Engineering sciences. Technology; Particle Physics Group; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract The radiation damage, in terms of atom displacements, induced by gamma irradiation in LYSO and LuYAP crystals is presented. Sc-44, Na-22 and V-48 are used as gamma sources for this study. The energy of gammas from the electron positron annihilation processes (511 keV) is also included in the study. The atom displacements distributions inside each material are calculated following the Monte Carlo assisted Classical Method introduced by the authors. This procedure also allows to study the atom displacements in-depth distributions inside each crystal. The atom displacements damage in LYSO crystals is found to be higher than in LuYAP crystals, mainly provoked by the displacements of silicon and oxygen atoms. But the difference between atom displacements produced in LYSO and LuYAP decreases when more energetic sources are used. On the other hand, the correlation between the atom displacements and energy deposition in-depth distributions is excellent. The atom displacements to energy deposition ratio is found to increases with more energetic photon sources. LYSO crystals are then more liable to the atom displacements damage than LuYAP crystals. (C) 2015 Elsevier B.V. All rights reserved.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000356990400008 Publication Date 2015-05-14
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0168-583x ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:127012 Serial 7987
Permanent link to this record
 

 
Author Pinera, I.; Cruz, C.M.; Leyva, A.; Abreu, Y.; Cabal, A.E.; van Espen, P.; Van Remortel, N.
Title Improved calculation of displacements per atom cross section in solids by gamma and electron irradiation Type A1 Journal article
Year 2014 Publication Interactions With Materials And Atoms Abbreviated Journal
Volume 339 Issue Pages 1-7
Keywords (up) A1 Journal article; Engineering sciences. Technology; Particle Physics Group; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract Several authors had estimated the displacements per atom cross sections under different approximations and models, including most of the main gamma- and electron-material interaction processes. These previous works used numerical approximation formulas which are applicable for limited energy ranges. We proposed the Monte Carlo assisted Classical Method (MCCM), which relates the established theories about atom displacements to the electron and positron secondary fluence distributions calculated from the Monte Carlo simulation. In this study the MCCM procedure is adapted in order to estimate the displacements per atom cross sections for gamma and electron irradiation. The results obtained through this procedure are compared with previous theoretical calculations. An improvement in about 10-90% for the gamma irradiation induced dpa cross section is observed in our results on regard to the previous evaluations for the studied incident energies. On the other hand, the dpa cross section values produced by irradiation with electrons are improved by our calculations in about 5-50% when compared with the theoretical approximations. When thin samples are irradiated with electrons, more precise results are obtained through the MCCM (in about 20-70%) with respect to the previous studies. (C) 2014 Elsevier B.V. All rights reserved.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000343785500001 Publication Date 2014-09-15
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0168-583x ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:121161 Serial 8069
Permanent link to this record
 

 
Author Abreu, Y.; Cruz, C.M.; Pinera, I.; Leyva, A.; Cabal, A.E.; van Espen, P.; Van Remortel, N.
Title Hyperfine electric parameters calculation in Si samples implanted with 57Mn\rightarrow57Fe Type A1 Journal article
Year 2014 Publication Physica: B : condensed matter Abbreviated Journal
Volume 445 Issue Pages 1-4
Keywords (up) A1 Journal article; Particle Physics Group; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract Nowadays the electronic structure calculations allow the study of complex systems determining the hyperfine parameters measured at a probe atom, including the presence of crystalline defects. The hyperfine electric parameters have been measured by Mossbauer spectroscopy in silicon materials implanted with Mn-57 ->,Fe-57 ions, observing four main contributions to the spectra. Nevertheless, some ambiguities still remain in the Fe-57 Mossbauer spectra interpretation in this case, regarding the damage configurations and its evolution with annealing. In the present work several implantation environments are evaluated and the Fe-57 hyperfine parameters are calculated. The observed correlation among the studied local environments and the experimental observations is presented, and a tentative microscopic description of the behavior and thermal evolution of the characteristic defects local environments of the probe atoms concerning the location of vacancies and interstitial Si in the neighborhood of Fe-57 ions in substitutional and interstitial sites is proposed. (C) 2014 Elsevier B.V. All rights reserved
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000336478700001 Publication Date 2014-03-22
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0921-4526; 1873-2135 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:117697 Serial 8046
Permanent link to this record
 

 
Author Gregory, C.L.; Nullens, H.A.; Gijbels, R.H.; van Espen, P.J.; Geuens, I.; de Keyzer, R.
Title Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions Type A1 Journal article
Year 1998 Publication Analytical chemistry Abbreviated Journal Anal Chem
Volume 70 Issue Pages 2551-2559
Keywords (up) A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Washington, D.C. Editor
Language Wos 000074584700047 Publication Date 2002-07-26
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0003-2700;1520-6882; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 6.32 Times cited 12 Open Access
Notes Approved Most recent IF: 6.32; 1998 IF: 4.580
Call Number UA @ lucian @ c:irua:21308 Serial 210
Permanent link to this record
 

 
Author van Vaeck, L.; van Espen, P.; Gijbels, R.; Baykut, G.; Laukien, F.H.
Title A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source Type A1 Journal article
Year 2000 Publication European mass spectrometry Abbreviated Journal Eur Mass Spectrom
Volume 6 Issue Pages 277-287
Keywords (up) A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher I.M. Place of Publication Chichester Editor
Language Wos 000165327900008 Publication Date 2007-12-04
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1356-1049; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited 10 Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:34088 Serial 2312
Permanent link to this record
 

 
Author Geuens, I.; Nys, B.; Naudts, J.; Gijbels, R.; Jacob, W.; van Espen, P.
Title The primary energy dependence of backscattered electron images up to 100 keV Type A1 Journal article
Year 1991 Publication Scanning microscopy Abbreviated Journal
Volume 5 Issue 2 Pages 339-344
Keywords (up) A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Chicago, Ill. Editor
Language Wos A1991GC67000005 Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0891-7035 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited 3 Open Access
Notes Approved no
Call Number UA @ lucian @ c:irua:709 Serial 2713
Permanent link to this record
 

 
Author Oleshko, V.; Kindratenko, V.; Gijbels, R.; van Espen, P.; Jacob, W.
Title Study of quasi-fractal many-particle-systems and percolation networks by zero-loss spectroscopic imaging, electron energy-loss spectroscopy and digital image analysis Type A1 Journal article
Year 1996 Publication Mikrochimica acta: supplementum Abbreviated Journal
Volume 13 Issue Pages 443-451
Keywords (up) A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); Chemometrics (Mitac 3)
Abstract Submicron colloidal Ag particles and nano-sized filaments forming a statistical percolation network during ''in situ'' development of double structure tabular microcrystals of AgRr(I) emulsions have been studied by electron energy-loss spectroscopy and zero-loss electron spectroscopic imaging (EELS/ZLESI). Image analysis has shown that random quasi-fractal clusters were formed in the colloid. ZLESI has been applied to characterise the morphology and defect structure of aggregated particles and filaments. Their energy-loss spectra revealed plasmon excitations and interband 4d electron transitions between 4-32 eV energy-loss. To study the cluster structure and its relation to the physical properties, fractal analysis including estimations of cluster fractal dimensions and of density autocorrelation functions has been performed. Mechanisms of fractal aggregation based on known models of diffusion limited aggregation, cluster-cluster aggregation and percolation are discussed.
Address
Corporate Author Thesis
Publisher Place of Publication Wien Editor
Language Wos A1996VT82300038 Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0076-8642 ISBN Additional Links UA library record; WoS full record;
Impact Factor Times cited Open Access
Notes Approved PHYSICS, APPLIED 28/145 Q1 #
Call Number UA @ lucian @ c:irua:16247 Serial 3332
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Author Verlinden, G.; Janssens, G.; Gijbels, R.; van Espen, P.; Geuens, I.
Title Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis Type A1 Journal article
Year 1997 Publication Analytical chemistry Abbreviated Journal Anal Chem
Volume 69 Issue Pages 3773-3779
Keywords (up) A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Washington, D.C. Editor
Language Wos A1997XV71200019 Publication Date 2002-07-26
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0003-2700;1520-6882; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 6.32 Times cited 6 Open Access
Notes Approved Most recent IF: 6.32; 1997 IF: 4.743
Call Number UA @ lucian @ c:irua:16959 Serial 3647
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Author Padilla, R.; Janssens, K.; van Espen, P.; Van Grieken, R.
Title XRS activities at the Micro & Trace Analysis Centre (MiTAC), University of Antwerp, Belgium Type A3 Journal article
Year 2006 Publication IAEA XRF newsletter Abbreviated Journal
Volume 12 Issue Pages 13-16
Keywords (up) A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved Most recent IF: NA
Call Number UA @ admin @ c:irua:65080 Serial 5921
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Author Annegarn, H.; Van Grieken, R.; van Espen, P.; von Blottnitz, F.; Sellschop, J.; Winchester, J.; Maenhaut, W.
Title Background aerosol composition at Gobabeb, South West Africa Type A3 Journal article
Year 1976 Publication Madoqua Abbreviated Journal
Volume Issue 2 Pages 107-118
Keywords (up) A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1011-5498 ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:116512 Serial 7544
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Author Buydens, L.; van Espen, P.; Rutan, S.
Title CAC-2010 : Twelfth international conference on chemometrics in analytical chemistry Type Editorial
Year 2011 Publication Analytica chimica acta Abbreviated Journal
Volume 705 Issue 1/2 Pages 1
Keywords (up) Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000295993900001 Publication Date 2011-08-14
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0003-2670; 1873-4324 ISBN Additional Links UA library record; WoS full record
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:93573 Serial 7570
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Author Janssens, K.; van Espen, P.; Van 't dack, L.
Title Euroanalysis 14: the European Conference on Analytical Chemistry Type Editorial
Year 2008 Publication Analytical and bioanalytical chemistry Abbreviated Journal Anal Bioanal Chem
Volume 391 Issue 4 Pages 1107-1108
Keywords (up) Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000256088700001 Publication Date 2008-05-05
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1618-2642 ISBN Additional Links UA library record; WoS full record
Impact Factor 3.431 Times cited Open Access
Notes Approved Most recent IF: 3.431; 2008 IF: 3.328
Call Number UA @ admin @ c:irua:69316 Serial 5608
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Author Vanmeert, F.; De Meyer, S.; Gestels, A.; Clerici, E.A.; Deleu, N.; Legrand, S.; Van Espen, P.; Van der Snickt, G.; Alfeld, M.; Dik, J.; Monico, L.; De Nolf, W.; Cotte, M.; Gonzalez, V.; Saverwyns, S.; Depuydt-Elbaum, L.; Janssens, K.
Title Non-invasive and non-destructive examination of artists’ pigments, paints and paintings by means of X-ray imaging methods Type H1 Book chapter
Year 2022 Publication Abbreviated Journal
Volume Issue Pages 317-357
Keywords (up) H1 Book chapter; Art; Antwerp Cultural Heritage Sciences (ARCHES); Antwerp X-ray Imaging and Spectroscopy (AXIS)
Abstract Recent studies in which X-ray beams of (sub)micrometre to millimetre dimensions have been used for non-destructive analysis and characterization of pigments, minute paint samples and/or entire paintings from fifteenth to twentieth century artists are discussed. The overview presented encompasses the use of laboratory and synchrotron radiation-based instrumentation and deals with the use of several variants of X-ray fluorescence (XRF) as a method of elemental analysis and imaging as well as with the combined use with X-ray diffraction (XRD). Microscopic XRF (μ-XRF) is a variant of the XRF method able to visualize the elemental distribution of key elements, mostly metals, on the scale from 1 μm to 100 μm present inside multi-layered micro samples taken from paintings. In the context of the characterization of artists’ pigments subjected to natural degradation, in many cases the use of methods limited to elemental analysis or imaging does not suffice to elucidate the chemical transformations that have taken place. However, at synchrotron facilities, combinations of μ-XRF with related methods such as μ-XAS (microscopic X-ray absorption spectroscopy) and μ-XRD have proven themselves to be very suitable for such studies. Since microscopic investigation of a relatively limited number of minute paint samples may not yield representative information about the complete artefact they were taken from, several methods for macroscopic, non-invasive imaging have recently been developed. Combined macroscopic XRF/XRD scanning is able to provide a fairly complete overview of the inorganic pigments employed to create a work of art, to answer questions about ongoing degradation phenomena and about its authenticity. As such these newly developed non-invasive and highly specific imaging methods are of interest for many cultural heritage stakeholders.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date 2022-09-08
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN 978-3-030-86864-2 Additional Links UA library record
Impact Factor Times cited Open Access Not_Open_Access
Notes Approved Most recent IF: NA
Call Number UA @ admin @ c:irua:190777 Serial 7183
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Author Vandevijvere, M.; Van de Voorde, L.; Caen, J.; van Espen, P.; Vekemans, B.; Vincze, L.; Schalm, O.
Title Manufacturing techniques and production defects of 16th-17th century majolica tiles from Antwerp (Belgium) Type H2 Book chapter
Year 2013 Publication Abbreviated Journal
Volume Issue Pages 169-176 T2 - Recent advances in glass, stained-gla
Keywords (up) H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Antwerp Cultural Heritage Sciences (ARCHES)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN 978-90-8932-113-8 Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:115032 Serial 8199
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Author Van Grieken, R.; Janssens, K.; van Espen, P.; Injuk, J.; Padilla, R.; Vittiglio, G.; Potgieter, J.H.
Title Novel quantitative procedures for in-situ X-ray fluorescence analysis Type H3 Book chapter
Year 2005 Publication Abbreviated Journal
Volume Issue Pages 45-60
Keywords (up) H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved Most recent IF: NA
Call Number UA @ admin @ c:irua:54563 Serial 5751
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