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  Author Title Year Publication Volume Times cited Additional Links Links
Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kruse, P.; Gerthsen, D. Ab initio computation of the mean inner Coulomb potential of technological important semiconductors 2005 1007 UA library record; WoS full record;
Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. Calculation of Debye-Waller temperature factors for GaAs 2008 Springer proceedings in physics 120 UA library record; WoS full record;
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Effect of temperature on the 002 electron structure factor and its consequence for the quantification of ternary and quaternary III-V crystals 2008 Springer proceedings in physics 120 UA library record; WoS full record;
Rosenauer, A.; Schowalter, M.; Glas, F.; Lamoen, D. First-principles calculations of 002 structure factors for electron scattering in strained InxGa1-xAs 2005 107 UA library record; WoS full record;
Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. Temperature-dependent Debye-Waller factors for semiconductors with the wurtzite-type structure 2009 Acta crystallographica: section A: foundations of crystallography 65 23 UA library record; WoS full record; WoS citing articles doi
Grieb, T.; Krause, F.F.; Mahr, C.; Zillmann, D.; Müller-Caspary, K.; Schowalter, M.; Rosenauer, A. Optimization of NBED simulations for disc-detection measurements 2017 Ultramicroscopy 181 6 UA library record; WoS full record; WoS citing articles pdf doi
Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer 2019 UA library record doi
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations 2013 Ultramicroscopy 134 48 UA library record; WoS full record; WoS citing articles pdf url doi
Mueller, K.; Krause, F.F.; Béché, A.; Schowalter, M.; Galioit, V.; Loeffler, S.; Verbeeck, J.; Zweck, J.; Schattschneider, P.; Rosenauer, A. Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction 2014 Nature communications 5 197 UA library record; WoS full record; WoS citing articles pdf url doi
van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. Correction of non-linear thickness effects in HAADF STEM electron tomography 2012 Ultramicroscopy 116 67 UA library record; WoS full record; WoS citing articles pdf doi
Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images 2014 Micron 63 25 UA library record; WoS full record; WoS citing articles pdf url doi
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. Measurement of the mean inner potential of ZnO nanorods by transmission electron holography 2005 Microscopy of Semiconducting Materials 107 UA library record; WoS full record; pdf
Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM 2014 Ultramicroscopy 141 6 UA library record; WoS full record; WoS citing articles pdf url doi
Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy 2014 Ultramicroscopy 137 74 UA library record; WoS full record; WoS citing articles pdf doi
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Ab initio based atomic scattering amplitudes and {002} electron structure factors of InxGa1-xAs/GaAs quantum wells 2010 Journal of physics : conference series 209 UA library record; WoS full record url doi
Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. Computation and parametrization of the temperature dependence of Debye-Waller factors for group IV, III-V and II-VI semiconductors 2009 Acta crystallographica: section A: foundations of crystallography 65 51 UA library record; WoS full record; WoS citing articles doi
Müller, K.; Schowalter, M.; Rosenauer, A.; Jansen, J.; Tsuda, K.; Titantah, J.T.; Lamoen, D. Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction 2010 Journal of physics : conference series 209 UA library record url doi
Mahr, C.; Müller-Caspary, K.; Graf, M.; Lackmann, A.; Grieb, T.; Schowalter, M.; Krause, F.F.; Mehrtens, T.; Wittstock, A.; Weissmueller, J.; Rosenauer, A. Measurement of local crystal lattice strain variations in dealloyed nanoporous gold 2018 Materials research letters 6 4 UA library record; WoS full record; WoS citing articles doi
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Density-functional theory calculations of the electron energy-loss near-edge structure of Li-intercalated graphite 2009 Carbon 47 12 UA library record; WoS full record; WoS citing articles pdf doi
Müller-Caspary, K.; Grieb, T.; Müßener, J.; Gauquelin, N.; Hille, P.; Schörmann, J.; Verbeeck, J.; Van Aert, S.; Eickhoff, M.; Rosenauer, A. Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy 2019 Physical review letters 122 26 UA library record; WoS full record; WoS citing articles pdf url doi
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Bond length variation in Ga1-xInxAs crystals from the Tersoff potential 2007 Journal of applied physics 101 19 UA library record; WoS full record; WoS citing articles doi
Rosenauer, A.; Schowalter, M.; Titantah, J.T.; Lamoen, D. An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy 2008 Ultramicroscopy 108 25 UA library record; WoS full record; WoS citing articles doi
Müller-Caspary, K.; Duchamp, M.; Roesner, M.; Migunov, V.; Winkler, F.; Yang, H.; Huth, M.; Ritz, R.; Simson, M.; Ihle, S.; Soltau, H.; Wehling, T.; Dunin-Borkowski, R.E.; Van Aert, S.; Rosenauer, A. Atomic-scale quantification of charge densities in two-dimensional materials 2018 Physical review B 98 10 UA library record; WoS full record; WoS citing articles url doi
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R.; Waag, A. Measurement of the mean inner potential of ZnO nanorods by transmission electron holography 2005 Applied Physics Letters 86 5 UA library record; WoS full record; WoS citing articles doi
Krause, F.F.; Ahl, J.P.; Tytko, D.; Choi, P.P.; Egoavil, R.; Schowalter, M.; Mehrtens, T.; Müller-Caspary, K.; Verbeeck, J.; Raabe, D.; Hertkorn, J.; Engl, K.; Rosenauer, A. Homogeneity and composition of AlInGaN : a multiprobe nanostructure study 2015 Ultramicroscopy 156 11 UA library record; WoS full record; WoS citing articles pdf url doi
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Size effects and strain state of Ga1-xInxAs/GaAs multiple quantum wells: Monte Carlo study 2008 Physical review : B : condensed matter and materials physics 78 5 UA library record; WoS full record; WoS citing articles url doi
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. Locating light and heavy atomic column positions with picometer precision using ISTEM 2016 Ultramicroscopy 172 8 UA library record; WoS full record; WoS citing articles url doi
Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy 2016 Ultramicroscopy 178 93 UA library record; WoS full record; WoS citing articles pdf url doi
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis 2003 Institute of physics conference series UA library record; WoS full record;
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? 2017 Ultramicroscopy 181 3 UA library record; WoS full record; WoS citing articles pdf url doi
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