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Author Iungin, O.; Shydlovska, O.; Moshynets, O.; Vasylenko, V.; Sidorenko, M.; Mickevicius, S.; Potters, G.
Title Metal-based nanoparticles : an alternative treatment for biofilm infection in hard-to-heal wounds Type A1 Journal article
Year 2024 Publication Journal of wound care Abbreviated Journal
Volume 33 Issue s:[4A] Pages 99-110
Keywords A1 Journal article; Antwerp engineering, PhotoElectroChemistry & Sensing (A-PECS)
Abstract Metal-based nanoparticles (MNPs) are promoted as effective compounds in the treatment of bacterial infections and as possible alternatives to antibiotics. These MNPs are known to affect a broad spectrum of microorganisms using a multitude of strategies, including the induction of reactive oxygen species and interaction with the inner structures of the bacterial cells. The aim of this review was to summarise the latest studies about the effect of metal-based nanoparticles on pathogenic bacterial biofilm formed in wounds, using the examples of Gram-positive bacterium Staphylococcus aureus and Gram-negative bacterium Pseudomonas aeruginosa, as well as provide an overview of possible clinical applications. Declaration of interest: The authors have no conflicts of interest.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 001208810700003 Publication Date 2024-04-08
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0969-0700 ISBN Additional Links UA library record; WoS full record
Impact Factor 1.9 Times cited Open Access
Notes Approved Most recent IF: 1.9; 2024 IF: 1.446
Call Number UA @ admin @ c:irua:205959 Serial 9159
Permanent link to this record
 
 
Author Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A.
Title Analytical electron microscopy of silver halide photographic systems Type A1 Journal article
Year 2000 Publication Micron Abbreviated Journal Micron
Volume 31 Issue Pages 55-95
Keywords A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000083352100007 Publication Date 2002-07-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 8 Open Access
Notes Approved Most recent IF: 1.98; 2000 IF: 1.324
Call Number UA @ lucian @ c:irua:34068 Serial 108
Permanent link to this record
 
 
Author van Dyck, D.; Lobato, I.; Chen, F.-R.; Kisielowski, C.
Title Do you believe that atoms stay in place when you observe them in HREM? Type A1 Journal article
Year 2015 Publication Micron Abbreviated Journal Micron
Volume 68 Issue 68 Pages 158-163
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract Recent advancements in aberration-corrected electron microscopy allow for an evaluation of unexpectedly large atom displacements beyond a resolution limit of similar to 0.5 angstrom, which are found to be dose-rate dependent in high resolution images. In this paper we outline a consistent description of the electron scattering process, which explains these unexpected phenomena. Our approach links thermal diffuse scattering to electron beam-induced object excitation and relaxation processes, which strongly contribute to the image formation process. The effect can provide an explanation for the well-known contrast mismatch (“Stobbs factor”) between image calculations and experiments. (C) 2014 Elsevier Ltd. All rights reserved.
Address
Corporate Author Thesis
Publisher Place of Publication Oxford Editor
Language Wos 000348016500023 Publication Date 2014-09-16
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 11 Open Access
Notes Approved Most recent IF: 1.98; 2015 IF: 1.988
Call Number c:irua:123802 Serial 745
Permanent link to this record
 
 
Author Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S.
Title The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images Type A1 Journal article
Year 2014 Publication Micron Abbreviated Journal Micron
Volume 63 Issue Pages 57-63
Keywords A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT)
Abstract Quantitative structural and chemical information can be obtained from high angle annular dark field scanning transmission electron microscopy (HAADF STEM) images when using statistical parameter estimation theory. In this approach, we assume an empirical parameterized imaging model for which the total scattered intensities of the atomic columns are estimated. These intensities can be related to the material structure or composition. Since the experimental probe profile is assumed to be known in the description of the imaging model, we will explore how the uncertainties in the probe profile affect the estimation of the total scattered intensities. Using multislice image simulations, we analyze this effect for Cs corrected and non-Cs corrected microscopes as a function of inaccuracies in cylindrically symmetric aberrations, such as defocus and spherical aberration of third and fifth order, and non-cylindrically symmetric aberrations, such as 2-fold and 3-fold astigmatism and coma.
Address
Corporate Author Thesis
Publisher Place of Publication Oxford Editor
Language Wos 000338402500011 Publication Date 2014-01-02
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 25 Open Access
Notes FWO (G.0393.11; G.0064.10; G.0374.13; G.0044.13); European Research Council under the 7th Framework Program (FP7); ERC GrantNo. 246791-COUNTATOMS and ERC Starting Grant No. 278510-VORTEX. A.R. thanks the DFG under contract number RO2057/8-1.The research leading to these results has received funding fromthe European Union 7th Framework Programme [FP7/2007-2013]under grant agreement no. 312483 (ESTEEM2).; esteem2ta ECASJO; Approved Most recent IF: 1.98; 2014 IF: 1.988
Call Number UA @ lucian @ c:irua:113857UA @ admin @ c:irua:113857 Serial 831
Permanent link to this record
 
 
Author Felten, A.; Ghijsen, J.; Pireaux, J.-J.; Drube, W.; Johnson, R.L.; Liang, D.; Hecq, M.; Van Tendeloo, G.; Bittencourt, C.
Title Electronic structure of Pd nanoparticles on carbon nanotubes Type A1 Journal article
Year 2009 Publication Micron Abbreviated Journal Micron
Volume 40 Issue 1 Pages 74-79
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract The effect of the oxygen plasma treatment on the electronic states of multi-wall carbon nanotubes (MWCNTs) is analyzed by X-ray photoemission measurements (XPS) and UPS, both using synchrotron radiation. It is found that the plasma treatment effectively grafts oxygen at the CNT-surface. Thereafter, the interaction between evaporated Pd and pristine or oxygen plasma-treated MWCNTs is investigated. Pd is found to nucleate at defective sites, whether initially present or introduced by oxygen plasma treatment. The plasma treatment induced a uniform dispersion of Pd clusters at the CNT-surface. The absence of additional features in the Pd 3d and C I s core levels spectra testifies that no Pd-C bond is formed. The shift of the Pd 3d core level towards high-binding energy for the smallest clusters is attributed to the Coulomb energy of the charged final state. (C) 2008 Elsevier Ltd. All rights reserved.
Address
Corporate Author Thesis
Publisher Place of Publication Oxford Editor
Language Wos 000261420900015 Publication Date 2008-02-21
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 44 Open Access
Notes Pai 608 Approved Most recent IF: 1.98; 2009 IF: 1.626
Call Number UA @ lucian @ c:irua:94578 Serial 1015
Permanent link to this record
 
 
Author Béché, A.; Winkler, R.; Plank, H.; Hofer, F.; Verbeeck, J.
Title Focused electron beam induced deposition as a tool to create electron vortices Type A1 Journal article
Year 2015 Publication Micron Abbreviated Journal Micron
Volume 80 Issue 80 Pages 34-38
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Focused electron beam induced deposition (FEBID) is a microscopic technique that allows geometrically controlled material deposition with very high spatial resolution. This technique was used to create a spiral aperture capable of generating electron vortex beams in a transmission electron microscope (TEM). The vortex was then fully characterized using different TEM techniques, estimating the average orbital angular momentum to be approximately 0.8variant Planck's over 2pi per electron with almost 60% of the beam ending up in the l=1 state.
Address EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
Corporate Author Thesis
Publisher Place of Publication Editor
Language English Wos 000366770100006 Publication Date 2015-09-12
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 21 Open Access
Notes A.B and J.V. acknowledge funding from the European Research Council under the 7th Framework Program (FP7), ERC Starting Grant No. 278510 VORTEX. J.V., R.W., H.P. and F.H. acknowledge financial support from the European Union under the 7th Framework Program (FP7) under a contract for an Integrated Infrastructure Initiative (Reference No. 312483 ESTEEM2). R.W and H.P also acknowledge financial support by the COST action CELINA (Nr. CM1301) and the EUROSTARS project TRIPLE-S (Nr. E!8213). The Qu-Ant-EM microscope was partly funded by the Hercules fund from the Flemish Government.; esteem2jra3 ECASJO; Approved Most recent IF: 1.98; 2015 IF: 1.988
Call Number c:irua:129203 c:irua:129203UA @ admin @ c:irua:129203 Serial 3946
Permanent link to this record
 
 
Author Bertoni, G.; Calmels, L.
Title First-principles calculation of the electronic structure and energy loss near edge spectra of chiral carbon nanotubes Type A1 Journal article
Year 2006 Publication Micron Abbreviated Journal Micron
Volume 37 Issue 5 Pages 486-491
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000238806400018 Publication Date 2005-11-22
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 12 Open Access
Notes Fwo Approved Most recent IF: 1.98; 2006 IF: 1.200
Call Number UA @ lucian @ c:irua:59604 Serial 1200
Permanent link to this record
 
 
Author Ruelle, B.; Felten, A.; Ghijsen, J.; Drube, W.; Johnson, R.L.; Liang, D.; Erni, R.; Van Tendeloo, G.; Sophie, P.; Dubois, P.; Godfroid, T.; Hecq, M.; Bittencourt, C.;
Title Functionalization of MWCNTs with atomic nitrogen Type A1 Journal article
Year 2009 Publication Micron Abbreviated Journal Micron
Volume 40 Issue 1 Pages 85-88
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract In this study of the changes induced by exposing MWCNTs to a nitrogen plasma, it was found by HRTEM that the atomic nitrogen exposure does not significantly etch the surface of the carbon nanotube (CNT). Nevertheless, the atomic nitrogen generated by a microwave plasma effectively grafts amine, nitrile, amide, and oxime groups onto the CNT surface, as observed by XPS, altering the density of valence electronic states, as seen in UPS. (C) 2008 Elsevier Ltd. All fights reserved.
Address
Corporate Author Thesis
Publisher Place of Publication Oxford Editor
Language Wos 000261420900017 Publication Date 2008-01-29
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 24 Open Access
Notes Pai 6/1; Pa 6/27 Approved Most recent IF: 1.98; 2009 IF: 1.626
Call Number UA @ lucian @ c:irua:103080 Serial 1305
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.
Title How to optimize the experimental design of quantitative atomic resolution TEM experiments? Type A1 Journal article
Year 2004 Publication Micron Abbreviated Journal Micron
Volume 35 Issue Pages 425-429
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000221721000005 Publication Date 2004-03-06
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 14 Open Access
Notes Approved Most recent IF: 1.98; 2004 IF: 1.464
Call Number UA @ lucian @ c:irua:47514 Serial 1495
Permanent link to this record
 
 
Author Xu, Q.; Zandbergen, H.W.; van Dyck, D.
Title Imaging from atomic structure to electronic structure Type A1 Journal article
Year 2012 Publication Micron Abbreviated Journal Micron
Volume 43 Issue 4 Pages 524-531
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract This paper discusses the possibility of retrieving the electron distribution (with highlighted valence electron distribution information) of materials from recorded HREM images. This process can be achieved by solving two inverse problems: reconstruction of the exit wave and reconstruction of the electron distribution from exit waves. The first inverse problem can be solved using a focal series reconstruction method. We show that the second inverse problem can be solved by combining a series of exit waves recorded at different thickness conditions. This process is designed based on an improved understanding of the dynamical scattering process. It also explains the fundamental difficulty of obtaining the valence electron distribution information and the basis of our solution.
Address
Corporate Author Thesis
Publisher Place of Publication Oxford Editor
Language Wos 000301702400005 Publication Date 2011-11-05
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record
Impact Factor 1.98 Times cited Open Access
Notes Fwo Approved Most recent IF: 1.98; 2012 IF: 1.876
Call Number UA @ lucian @ c:irua:93634 Serial 1553
Permanent link to this record
 
 
Author Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D.
Title Model-based electron microscopy : from images toward precise numbers for unknown structure parameters Type A1 Journal article
Year 2012 Publication Micron Abbreviated Journal Micron
Volume 43 Issue 4 Pages 509-515
Keywords A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT); Vision lab
Abstract Statistical parameter estimation theory is proposed as a method to quantify electron microscopy images. It aims at obtaining precise and accurate values for the unknown structure parameters including, for example, atomic column positions and types. In this theory, observations are purely considered as data planes, from which structure parameters have to be determined using a parametric model describing the images. The method enables us to measure positions of atomic columns with a precision of the order of a few picometers even though the resolution of the electron microscope is one or two orders of magnitude larger. Moreover, small differences in averaged atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark field scanning transmission electron microscopy images. Finally, it is shown how to optimize the experimental design so as to attain the highest precision. As an example, the optimization of the probe size for nanoparticle radius measurements is considered. It is also shown how to quantitatively balance signal-to-noise ratio and resolution by adjusting the probe size.
Address
Corporate Author Thesis
Publisher Place of Publication Oxford Editor
Language Wos 000301702400003 Publication Date 2011-11-03
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 7 Open Access
Notes Fwo Approved Most recent IF: 1.98; 2012 IF: 1.876
Call Number UA @ lucian @ c:irua:94114 Serial 2099
Permanent link to this record
 
 
Author Kirilenko, D.A.; Dideykin, A.T.; Aleksenskiy, A.E.; Sitnikova, A.A.; Konnikov, S.G.; Vul', A.Y.
Title One-step synthesis of a suspended ultrathin graphene oxide film: Application in transmission electron microscopy Type A1 Journal article
Year 2015 Publication Micron Abbreviated Journal Micron
Volume 68 Issue 68 Pages 23-26
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Ultrathin graphene films find their use as advantageous support for nano- and biomaterials investigations. Thin film causes a very slight deterioration to measured signals, thus providing more details of the object's structure at nanoscale. The ultimate thinness of graphene works in the best way for this purpose. However, obtaining suspended thin film of a large-area, which is convenient for applications, is often a relatively complicated and time-consuming task. Here we present a one-step 1-min technique for synthesis of an extremely thin (about 1-2 nm) continuous film suspended over cells of a conventional copper grid (50-400 mu m mesh). This technique enables us to acquire a large-area film which is water-resistant, stable in organic solvents and can act as a support when studying nanoparticles or biomaterials. Moreover, the very mechanism of the film formation can be interesting from the point of view of other applications of ultrathin graphene oxide papers. (C) 2014 Elsevier Ltd. All rights reserved.
Address
Corporate Author Thesis
Publisher Place of Publication Oxford Editor
Language Wos 000348016500004 Publication Date 2014-08-30
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 13 Open Access
Notes Approved Most recent IF: 1.98; 2015 IF: 1.988
Call Number c:irua:123800 Serial 2467
Permanent link to this record
 
 
Author Yang, Z.; Schryvers, D.
Title Study of changes in composition and EELS ionization edges upon Ni4Ti3 precipitation in a NiTi alloy Type A1 Journal article
Year 2006 Publication Micron Abbreviated Journal Micron
Volume 37 Issue 5 Pages 503-507
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000238806400020 Publication Date 2005-09-08
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 10 Open Access
Notes Approved Most recent IF: 1.98; 2006 IF: 1.200
Call Number UA @ lucian @ c:irua:59605 Serial 3327
Permanent link to this record
 
 
Author Leroux, O.; Leroux, F.; Bagniewska-Zadworna,.; Knox, J.P.; Claeys, M.; Bals, S.; Viane, R.L.L.
Title Ultrastructure and composition of cell wall appositions in the roots of Asplenium (Polypodiales) Type A1 Journal article
Year 2011 Publication Micron Abbreviated Journal Micron
Volume 42 Issue 8 Pages 863-870
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Cell wall appositions (CWAs), formed by the deposition of extra wall material at the contact site with microbial organisms, are an integral part of the response of plants to microbial challenge. Detailed histological studies of CWAs in fern roots do not exist. Using light and electron microscopy we examined the (ultra)structure of CWAs in the outer layers of roots of Asplenium species. All cell walls studded with CWAs were impregnated with yellow-brown pigments. CWAs had different shapes, ranging from warts to elongated branched structures, as observed with scanning and transmission electron microscopy. Ultrastructural study further showed that infecting fungi grow intramurally and that they are immobilized by CWAs when attempting to penetrate intracellularly. Immunolabelling experiments using monoclonal antibodies indicated pectic homogalacturonan, xyloglucan, mannan and cellulose in the CWAs, but tests for lignins and callose were negative. We conclude that these appositions are defense-related structures made of a non-lignified polysaccharide matrix on which phenolic compounds are deposited in order to create a barrier protecting the root against infections.
Address
Corporate Author Thesis
Publisher Place of Publication Oxford Editor
Language Wos 000294942600013 Publication Date 2011-06-24
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 20 Open Access
Notes Fwo Approved Most recent IF: 1.98; 2011 IF: 1.527
Call Number UA @ lucian @ c:irua:92540 Serial 3798
Permanent link to this record
 
 
Author Samaeeaghmiyoni, V.; Idrissi, H.; Groten, J.; Schwaiger, R.; Schryvers, D.
Title Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach Type A1 Journal article
Year 2017 Publication Micron Abbreviated Journal Micron
Volume 94 Issue 94 Pages 66-73
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Twin-jet electro-polishing and Focused Ion Beam (FIB) were combined to produce small size Nickel single crystal specimens for quantitative in-situ nanotensile experiments in the transmission electron microscope. The combination of these techniques allows producing samples with nearly defect-free zones in the centre in contrast to conventional FIB-prepared samples. Since TEM investigations can be performed on the electro-polished samples prior to in-situ TEM straining, specimens with desired crystallographic orientation and initial microstructure can be prepared. The present results reveal a dislocation nucleation controlled plasticity, in which small loops induced by FIB near the edges of the samples play a central role.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000393247300008 Publication Date 2016-12-21
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 11 Open Access OpenAccess
Notes This research has been performed with the financial support of the Belgian Science Policy (Belspo) under the framework of the interuniversity attraction poles program, IAP7/21. Financial support from the Flemish (FWO) and German Research Foundation (DFG) through the European M-ERA.NET project “FaSS” (Fatigue Simulation near Surfaces) under the grant numbers GA.014.13N and SCHW855/5-1, respectively, is gratefully acknowledged. V. Samaeeaghmiyoni also acknowledges the FWO research project G012012N “Understanding nanocrystalline mechanical behaviour from structural investigations”. H. Idrissi is currently mandated by the Belgian National Fund for Scientific Research (FSR-FNRS). Approved Most recent IF: 1.98
Call Number EMAT @ emat @ c:irua:139515 Serial 4341
Permanent link to this record
 
 
Author Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L.
Title Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope Type A1 Journal article
Year 2016 Publication Micron Abbreviated Journal Micron
Volume 80 Issue 80 Pages 145-165
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract The last few years have seen a great deal of progress in the development of transmission electron microscopy based techniques for strain mapping. New techniques have appeared such as dark field electron holography and nanobeam diffraction and better known ones such as geometrical phase analysis have been improved by using aberration corrected ultra-stable modern electron microscopes. In this paper we apply dark field electron holography, the geometrical phase analysis of high angle annular dark field scanning transmission electron microscopy images, nanobeam diffraction and precession diffraction, all performed at the state-of-the-art to five different types of semiconductor samples. These include a simple calibration structure comprising 10-nm-thick SiGe layers to benchmark the techniques. A SiGe recessed source and drain device has been examined in order to test their capabilities on 2D structures. Devices that have been strained using a nitride stressor have been examined to test the sensitivity of the different techniques when applied to systems containing low values of deformation. To test the techniques on modern semiconductors, an electrically tested device grown on a SOI wafer has been examined. Finally a GaN/AlN superlattice was tested in order to assess the different methods of measuring deformation on specimens that do not have a perfect crystalline structure. The different deformation mapping techniques have been compared to one another and the strengths and weaknesses of each are discussed.
Address
Corporate Author Thesis
Publisher Place of Publication Oxford Editor
Language Wos 000366770100018 Publication Date 2015-09-15
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 50 Open Access
Notes Approved Most recent IF: 1.98
Call Number UA @ lucian @ c:irua:136446 Serial 4401
Permanent link to this record
 
 
Author Godet, M.; Vergès-Belmin, V.; Gauquelin, N.; Saheb, M.; Monnier, J.; Leroy, E.; Bourgon, J.; Verbeeck, J.; Andraud, C.
Title Nanoscale investigation by TEM and STEM-EELS of the laser induced yellowing Type A1 Journal article
Year 2018 Publication Micron Abbreviated Journal Micron
Volume 115 Issue Pages 25-31
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Nd-YAG QS laser cleaning of soiled stone at 1064 nm can sometimes result in a more yellow appearance compared to other cleaning techniques. Especially in France, this yellowing effect is still considered as a major aesthetic issue by the architects and conservators. One explanation states that the yellowing is linked to the formation of iron-rich nanophase(s) through the laser beam interaction with black crusts that would re-deposit on the cleaned substrate after irradiation. To characterize these nanophases, a model crust containing hematite was elaborated and laser irradiated using a Nd-YAG QS laser. The color of the sample shifted instantaneously from red to a bright yellow and numerous particles were ablated in a visible smoke. Transmission electron microscopy (TEM) was used to examine the morphology and the crystallinity of the neo-formed compounds, both on the surface of the samples and in the ablated materials. In addition, an investigation of the chemical and structural properties of the nanophases was conducted by X-ray dispersive energy (EDX) and electron energy loss (EELS) spectroscopies. It was found that both the surface of the sample and the ablated materials are covered by crystallized nano-spheres and nano-residues, all containing iron and oxygen, sometimes along with calcium and sulfur. In particular an interfacial area containing the four elements was evidenced between some nanostructures and the substrate. Magnetite Fe3O4 was also identified at the nanoscale. This study demonstrates that the laser yellowing of a model crust is linked to the presence of iron-rich nanophases including CaxFeySzOδ nanostructures and magnetite Fe3O4 at the surface after irradiation.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000449125600004 Publication Date 2018-08-18
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 9 Open Access Not_Open_Access: Available from 19.08.2020
Notes The authors wish to thank Valérie Lalanne for the sample preparation for TEM and Stijn Van den Broeck for the FIB cut elaboration. The research leading to these results has received funding from the European Union Seventh Framework Programme under Grant Agreement 312483 – ESTEEM2 (Integrated Infrastructure Initiative–I3). Approved Most recent IF: 1.98
Call Number EMAT @ emat @c:irua:154356UA @ admin @ c:irua:154356 Serial 5056
Permanent link to this record
 
 
Author De Meyer, R.; Albrecht, W.; Bals, S.
Title Effectiveness of reducing the influence of CTAB at the surface of metal nanoparticles during in situ heating studies by TEM Type A1 Journal article
Year 2021 Publication Micron Abbreviated Journal Micron
Volume 144 Issue Pages 103036
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract In situ TEM is a valuable technique to offer novel insights in the behavior of nanomaterials under various conditions. However, interpretation of in situ experiments is not straightforward since the electron beam can impact the outcome of such measurements. For example, ligands surrounding metal nanoparticles transform into a protective carbon layer upon electron beam irradiation and may impact the apparent thermal stability during in situ heating experiments. In this work, we explore the effect of different treatments typically proposed to remove such ligands. We found that plasma treatment prior to heating experiments for Au nanorods and nanostars increased the apparent thermal stability of the nanoparticles, while an activated carbon treatment resulted in a decrease of the observed thermal stability. Treatment with HCl barely changed the experimental outcome. These results demonstrate the importance of carefully selecting pre-treatments procedures during in situ heating experiments.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000632282600002 Publication Date 2021-02-19
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328 ISBN Additional Links UA library record; WoS full record
Impact Factor 1.98 Times cited Open Access OpenAccess
Notes H2020; European Research Council; This work was supported by the European Union’s Horizon 2020 research and innovation program [grant agreement No 823717 (ESTEEM3) and No 815128 (REALNANO)]; We acknowledge Prof. Luis M. Liz-Marzán and co-workers of the Bionanoplasmonics Laboratory, CICbiomaGUNE, Spain for providing the Au nanoparticles.; sygma; esteem3jra; esteem3reported Approved Most recent IF: 1.98
Call Number EMAT @ emat @c:irua:175874 Serial 6677
Permanent link to this record
 
 
Author Jain, N.; Hao, Y.; Parekh, U.; Kaltenegger, M.; Pedrazo-Tardajos, A.; Lazzaroni, R.; Resel, R.; Geerts, Y.H.; Bals, S.; Van Aert, S.
Title Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals Type A1 Journal article
Year 2023 Publication Micron Abbreviated Journal
Volume 169 Issue Pages 103444
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract High-resolution transmission electron microscopy (TEM) of organic crystals, such as Lead Phthalocyanine (PbPc), is very challenging since these materials are prone to electron beam damage leading to the breakdown of the crystal structure during investigation. Quantification of the damage is imperative to enable high-resolution imaging of PbPc crystals with minimum structural changes. In this work, we performed a detailed electron diffraction study to quantitatively measure degradation of PbPc crystals upon electron beam irradiation. Our study is based on the quantification of the fading intensity of the spots in the electron diffraction patterns. At various incident dose rates (e/Å2/s) and acceleration voltages, we experimentally extracted the decay rate (1/s), which directly correlates with the rate of beam damage. In this manner, a value for the critical dose (e/Å2) could be determined, which can be used as a measure to quantify beam damage. Using the same methodology, we explored the influence of cryogenic temperatures, graphene TEM substrates, and graphene encapsulation in prolonging the lifetime of the PbPc crystal structure during TEM investigation. The knowledge obtained by diffraction experiments is then translated to real space high-resolution TEM imaging of PbPc.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000965998800001 Publication Date 2023-03-21
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-4328 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.4 Times cited 1 Open Access OpenAccess
Notes This work is supported by FWO and FNRS within the 2Dto3D network of the EOS (Excellence of Science) program (grant number 30489208) and ERC-CoGREALNANO-815128 (to Prof. Dr. Sara Bals). N.J. would like to thank Dr. Kunal S. Mali and Dr. Da Wang for useful and interesting discussions on sample preparation procedures. Approved Most recent IF: 2.4; 2023 IF: 1.98
Call Number EMAT @ emat @c:irua:196069 Serial 7379
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Author Van Passel, S.
Title Food miles to assess sustainability : a revision Type A1 Journal article
Year 2013 Publication Sustainable Development Abbreviated Journal Sustain Dev
Volume 21 Issue 1 Pages 1-17
Keywords A1 Journal article; Economics; Engineering Management (ENM)
Abstract Sustainability assessment is an essential process in our aim to reach a more sustainable production and consumption pattern. This research revises the food miles concept as a guiding tool to assess sustainability. Food miles measure the distance that food travels from where it is grown or raised to where it is consumed. Three different concepts to assess sustainability are described: (i) food miles, (ii) enhanced food miles, (iii) food chain sustainability. An illustrative case study shows that there is a strong danger of oversimplification when using food miles as an assessment tool. Second, the food miles concept can be enhanced with all relevant transport externalities taking into account different transport modes and transport (in)efficiency. Third, all relevant economic, social, and ecological aspects should be taken into account. Besides transport externalities, also externalities caused by food production, food packaging, food marketing, and food consumption should be incorporated. Moreover, the trade-off with development goals cannot be neglected. As a consequence, there is a strong danger of incommensurability as the result of different sustainability model assumptions and unclear system boundaries. Nevertheless, sustainability assessment can enrich policy making and support tailored policy measures to improve food chain sustainability. Copyright (c) 2010 John Wiley & Sons, Ltd and ERP Environment.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000314187900001 Publication Date 2010-07-15
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0968-0802 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.167 Times cited 17 Open Access
Notes ; ; Approved Most recent IF: 2.167; 2013 IF: 1.692
Call Number UA @ admin @ c:irua:127553 Serial 6204
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Author Schryvers, D.; Holland-Moritz, D.
Title Austenite and martensite microstructures in splat-cooled Ni-Al Type A1 Journal article
Year 1998 Publication Intermetallics Abbreviated Journal Intermetallics
Volume 6 Issue Pages 427-436
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Chicago, Ill. Editor
Language Wos 000074235500010 Publication Date 2002-07-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0966-9795; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.14 Times cited 13 Open Access
Notes Approved Most recent IF: 3.14; 1998 IF: 1.785
Call Number UA @ lucian @ c:irua:48365 Serial 209
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Author Zelaya, E.; Schryvers, D.; Tolley, A.; Fitchner, P.F.P.
Title Cavity nucleation and growth in Cu-Zn-Al irradiated with Cu+ ions at different temperatures Type A1 Journal article
Year 2010 Publication Intermetallics Abbreviated Journal Intermetallics
Volume 18 Issue 4 Pages 493-498
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract The effects of high dose ion irradiation in β CuZnAl were investigated between room temperature and 150 °C. Single crystal samples with surface normal close to [001]β were irradiated with 300 keV Cu+ ions. Microstructural changes were characterized using transmission electron microscopy. Irradiation induced cavities located on the surface exposed to the irradiation were observed. The morphology, size and density distribution of these cavities were analyzed as a function of different irradiation conditions. The shape and location of the cavities with respect to the irradiation surface were not affected by irradiation temperature or irradiation dose. Instead, the cavity size distribution showed a bi-modal shape for a dose of 15 dpa, regardless of irradiation temperature. For a dose of 30 dpa the bi-modal distribution was only observed after room temperature irradiation. The diffusion effects of vacancies produced by irradiation are analyzed in shape memory CuZnAl alloys, which main characteristic is the diffusionless martensitic transformation. Particularly, the cavity size distributions were analyzed in terms of nucleation, growth and coalescence.
Address
Corporate Author Thesis
Publisher Place of Publication Chicago, Ill. Editor
Language Wos 000276058200014 Publication Date 2009-10-17
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0966-9795; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.14 Times cited 1 Open Access
Notes Iaea Approved Most recent IF: 3.14; 2010 IF: 2.335
Call Number UA @ lucian @ c:irua:80924 Serial 302
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Author Srivastava, A.K.; Schryvers, D.; van Humbeeck, J.
Title Grain growth and precipitation in an annealed cold-rolled Ni50.2Ti49.8 alloy Type A1 Journal article
Year 2007 Publication Intermetallics Abbreviated Journal Intermetallics
Volume 15 Issue 12 Pages 1538-1547
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Chicago, Ill. Editor
Language Wos 000250930300006 Publication Date 2007-08-17
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0966-9795; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.14 Times cited 37 Open Access
Notes FWO project G.0465.05; EU RTN Approved Most recent IF: 3.14; 2007 IF: 2.219
Call Number UA @ lucian @ c:irua:65851 Serial 1363
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Author Satto, C.; Ledda, A.; Potapov, P.; Janssens, J.F.; Schryvers, D.
Title Phase transformations and precipitation in amorphous Ti50Ni25Cu25 ribbons Type A1 Journal article
Year 2001 Publication Intermetallics Abbreviated Journal Intermetallics
Volume 9 Issue Pages 395-401
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Chicago, Ill. Editor
Language Wos 000168882500005 Publication Date 2002-07-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0966-9795; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.14 Times cited 16 Open Access
Notes Approved Most recent IF: 3.14; 2001 IF: 1.239
Call Number UA @ lucian @ c:irua:48367 Serial 2590
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Author Samajdar, I.; Ratchev, P.; Verlinden, B.; Schryvers, D.
Title Recrystallization and grain growth in a B2 iron aluminide alloy Type A1 Journal article
Year 1998 Publication Intermetallics Abbreviated Journal Intermetallics
Volume 6 Issue Pages 419-425
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Chicago, Ill. Editor
Language Wos 000074235500009 Publication Date 2002-07-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0966-9795; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.14 Times cited 17 Open Access
Notes Approved Most recent IF: 3.14; 1998 IF: 1.785
Call Number UA @ lucian @ c:irua:48366 Serial 2846
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Author Delville, R.; Schryvers, D.
Title Transmission electron microscopy study of combined precipitation of Ti2Ni(Pd) and Ti2Pd(Ni) in a Ti50Ni30Pd20 alloy Type A1 Journal article
Year 2010 Publication Intermetallics Abbreviated Journal Intermetallics
Volume 18 Issue 12 Pages 2353-2360
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract We report a new mode of precipitation in a B19 martensitic Ti50Ni30Pd20 shape memory alloy consisting of a central Ti2Ni(Pd) precipitate surrounded by an austenite area containing Ti2Pd(Ni) precipitates. The morphology and crystallography of the precipitation area is investigated using conventional and high resolution electron microscopy. In particular, the orientation relationship and the coherency strain between the Ti2Pd(Ni) precipitate and the surrounding retained B2 matrix are discussed. A study of local composition in relation with a ternary phase diagram using X-ray energy dispersive spectroscopy with a nanoprobe gives evidences of the formation mechanism.
Address
Corporate Author Thesis
Publisher Place of Publication Chicago, Ill. Editor
Language Wos 000284447500014 Publication Date 2010-09-04
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0966-9795; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.14 Times cited 9 Open Access
Notes Multimat; Iap Approved Most recent IF: 3.14; 2010 IF: 2.335
Call Number UA @ lucian @ c:irua:84473 Serial 3714
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Author Santamarta, R.; Schryvers, D.
Title Twinned b.c.c. sherical particles in a partially crystallised Ti50Ni25Cu25 melt-spun ribbon Type A1 Journal article
Year 2004 Publication Intermetallics Abbreviated Journal Intermetallics
Volume 12 Issue Pages 341-348
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Chicago, Ill. Editor
Language Wos 000189229300012 Publication Date 2004-01-29
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0966-9795; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.14 Times cited 14 Open Access
Notes Approved Most recent IF: 3.14; 2004 IF: 1.770
Call Number UA @ lucian @ c:irua:48369 Serial 3767
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Author Potgieter-Vermaak, S.; Van Grieken, R.; Potgieter, J.H.
Title Integrated analytical techniques for the characterisation of environmental particles Type A1 Journal article
Year 2010 Publication Spectroscopy Europe Abbreviated Journal
Volume 22 Issue 5 Pages 12-15
Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0966-0941; 2634-2561 ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved no
Call Number UA @ admin @ c:irua:85517 Serial 8109
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Author Yandouzi, M.; Toth, L.; Schryvers, D.
Title High resolution transmission electron microscopy study of nanoscale Ni-rich Ni-Al films evaporated onto NaCl and KCl Type A1 Journal article
Year 1998 Publication Nanostructured materials Abbreviated Journal Nanostruct Mater
Volume 10 Issue Pages 99-115
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication New York Editor
Language Wos 000073840600011 Publication Date 2002-07-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0965-9773; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited 2 Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:48370 Serial 1463
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Author Oleshko, V.P.; van Daele, A.; Gijbels, R.H.; Jacob, W.A.
Title Structural and analytical characterization of Ag(Br,I) nanocrystals by cryo-AEM techniques Type A1 Journal article
Year 1998 Publication Journal of nanostructured materials Abbreviated Journal Nanostruct Mater
Volume 10 Issue 8 Pages 1225-1246
Keywords A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000079226900001 Publication Date 2002-07-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0965-9773; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited 5 Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:24909 Serial 3190
Permanent link to this record