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  Author Title Year Publication Volume Times cited Additional Links Links
De Backer, A.; Zhang, Z.; van den Bos, K.H.W.; Bladt, E.; Sánchez‐Iglesias, A.; Liz‐Marzán, L.M.; Nellist, P.D.; Bals, S.; Van Aert, S. Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X‐ray Spectroscopy 2022 Small methods 5 UA library record; WoS full record; WoS citing articles url doi
van den Bos, K.H.W.; Altantzis, T.; De Backer, A.; Van Aert, S.; Bals, S. Recent breakthroughs in scanning transmission electron microscopy of small species 2018 Advances in Physics: X 3 8 UA library record; WoS full record; WoS citing articles pdf url doi
Müller-Caspary, K.; Duchamp, M.; Roesner, M.; Migunov, V.; Winkler, F.; Yang, H.; Huth, M.; Ritz, R.; Simson, M.; Ihle, S.; Soltau, H.; Wehling, T.; Dunin-Borkowski, R.E.; Van Aert, S.; Rosenauer, A. Atomic-scale quantification of charge densities in two-dimensional materials 2018 Physical review B 98 10 UA library record; WoS full record; WoS citing articles url doi
Samal, D.; Gauquelin, N.; Takamura, Y.; Lobato, I.; Arenholz, E.; Van Aert, S.; Huijben, M.; Zhong, Z.; Verbeeck, J.; Van Tendeloo, G.; Koster, G. Unusual structural rearrangement and superconductivity in infinite layer cuprate superlattices 2023 Physical review materials 7 UA library record; WoS full record url doi
Hugenschmidt, M.; Jannis, D.; Kadu, A.A.; Grünewald, L.; De Marchi, S.; Perez-Juste, J.; Verbeeck, J.; Van Aert, S.; Bals, S. Low-dose 4D-STEM tomography for beam-sensitive nanocomposites 2023 ACS materials letters 6 UA library record; WoS full record pdf doi
Groenendijk, D.J.; Autieri, C.; van Thiel, T.C.; Brzezicki, W.; Hortensius, J.R.; Afanasiev, D.; Gauquelin, N.; Barone, P.; van den Bos, K.H.W.; van Aert, S.; Verbeeck, J.; Filippetti, A.; Picozzi, S.; Cuoco, M.; Caviglia, A.D. Berry phase engineering at oxide interfaces 2020 2 58 UA library record; WoS full record; WoS citing articles pdf url doi
Friedrich, T.; Yu, C.-P.; Verbeek, J.; Pennycook, T.; Van Aert, S. Phase retrieval from 4-dimensional electron diffraction datasets 2021 Proceedings T2 – IEEE International Conference on Image Processing (ICIP), SEP 19-22, 2021, Electr. network UA library record; WoS full record; WoS citing articles pdf url doi
Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S. Investigating lattice strain in Au nanodecahedrons 2016 UA library record doi
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