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  Author Title Year Publication Volume Times cited Additional Links Links
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. Plasmon holographic experiments: theoretical framework 2005 Ultramicroscopy 102 43 UA library record; WoS full record; WoS citing articles pdf doi
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? 2012 Ultramicroscopy 114 5 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy 2009 Ultramicroscopy 109 166 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. Throughput maximization of particle radius measurements by balancing size and current of the electron probe 2011 Ultramicroscopy 111 7 UA library record; WoS full record; WoS citing articles pdf doi
Lobato, I.; Van Dyck, D. MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA 2015 Ultramicroscopy 156 32 UA library record; WoS full record; WoS citing articles pdf doi
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? 2017 Ultramicroscopy 181 3 UA library record; WoS full record; WoS citing articles pdf url doi
Schalm, O.; van der Linden, V.; Frederickx, P.; Luyten, S.; van der Snickt, G.; Caen, J.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. Enamels in stained glass windows: preparation, chemical composition, microstructure and causes of deterioration 2009 Spectrochimica acta: part B : atomic spectroscopy 64 28 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; van Dyck, D.; Van Tendeloo, G. Energy-filtered transmission electron microscopy: an overview 2004 Spectrochimica acta: part B : atomic spectroscopy 59 37 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; van Dyck, D.; den Dekker, A.J. Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative 2006 Optics express 14 45 UA library record; WoS full record; WoS citing articles url doi
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M. Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays 1999 Applied physics letters 75 481 UA library record; WoS full record; WoS citing articles pdf doi
van Dyck, D.; Croitoru, M.D. Statistical method for thickness measurement of amorphous objects 2007 Applied physics letters 90 4 UA library record; WoS full record; WoS citing articles pdf url doi
Tsai, C.-Y.; Chang, Y.-C.; Lobato, I.; Van Dyck, D.; Chen, F.-R. Hollow Cone Electron Imaging for Single Particle 3D Reconstruction of Proteins 2016 Scientific reports 6 UA library record; WoS full record; WoS citing articles url doi
Ferroni, M.; Carotta, M.C.; Guidi, V.; Martinelli, G.; Ronconi, F.; Richard, O.; van Dyck, D.; van Landuyt, J. Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application 2000 Sensors and actuators : B : chemical 68 51 UA library record; WoS full record; WoS citing articles doi
Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S. Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp 1994 MRS bulletin UA library record; WoS full record;
Lobato Hoyos, I.P.; van Dyck, D. An accurate parameterization for scattering factors, electron densities and electrostatic potentials for neutral atoms that obey all physical constraints 2014 Acta crystallographica: section A: foundations of crystallography 70 19 UA library record; WoS full record; WoS citing articles url doi
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. Advanced electron crystallography through model-based imaging 2016 IUCrJ 3 30 UA library record; WoS full record; WoS citing articles pdf url doi
Zhang, X.B.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D.; Briers, J.; Bao, Y.; Geise, H.J. An electron microscopic study of highly oriented undoped and FeCl3-doped poly (p-phenylenevinylene) 1996 Macromolecules 29 10 UA library record; WoS full record; WoS citing articles pdf doi
Van Tendeloo, G.; Bals, S.; Van Aert, S.; Verbeeck, J.; van Dyck, D. Advanced electron microscopy for advanced materials 2012 Advanced materials 24 107 UA library record; WoS full record; WoS citing articles pdf url doi
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