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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Gauquelin, N.; van den Bos, K.H.W.; Béché, A.; Krause, F.F.; Lobato, I.; Lazar, S.; Rosenauer, A.; Van Aert, S.; Verbeeck, J. |
Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques |
2017 |
Ultramicroscopy |
181 |
34 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Grieb, T.; Krause, F.F.; Mahr, C.; Zillmann, D.; Müller-Caspary, K.; Schowalter, M.; Rosenauer, A. |
Optimization of NBED simulations for disc-detection measurements |
2017 |
Ultramicroscopy |
181 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. |
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation |
2018 |
Ultramicroscopy |
184 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Grieb, T.; Krause, F.F.; Schowalter, M.; Zillmann, D.; Sellin, R.; Müller-Caspary, K.; Mahr, C.; Mehrtens, T.; Bimberg, D.; Rosenauer, A. |
Strain analysis from nano-beam electron diffraction : influence of specimen tilt and beam convergence |
2018 |
Ultramicroscopy |
190 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
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Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. |
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose |
2019 |
Ultramicroscopy |
203 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Bond length variation in Ga1-xInxAs crystals from the Tersoff potential |
2007 |
Journal of applied physics |
101 |
19 |
UA library record; WoS full record; WoS citing articles |
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Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Modified atomic scattering amplitudes and size effects on the 002 and 220 electron structure factors of multiple Ga1-xInxAs/GaAs quantum wells |
2009 |
Journal of applied physics |
105 |
|
UA library record; WoS full record |
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Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. |
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images |
2014 |
Micron |
63 |
25 |
UA library record; WoS full record; WoS citing articles |
|
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Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. |
Computational aspects in quantitative EELS |
2010 |
Microscopy and microanalysis |
16 |
|
UA library record |
|
|
|
Rossi, E.H.M.; Van Tendeloo, G.; Rosenauer, A. |
Influence of strain, specimen orientation and background estimation on composition evaluation of InAs/GaAs by TEM |
2007 |
Philosophical magazine |
87 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Piscopiello, E.; Rosenauer, A.; Passaseo, A.; Montoya Rossi, E.H.; Van Tendeloo, G. |
Segregation in InxGa1-xAs/GaAs Stranski-Krastanow layers grown by metal-organic chemical vapour deposition |
2005 |
Philosophical magazine |
85 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Ab initio based atomic scattering amplitudes and {002} electron structure factors of InxGa1-xAs/GaAs quantum wells |
2010 |
Journal of physics : conference series |
209 |
|
UA library record; WoS full record |
|
|
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Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kruse, P.; Gerthsen, D. |
Ab initio computation of the mean inner Coulomb potential of technological important semiconductors |
2005 |
|
1007 |
|
UA library record; WoS full record; |
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Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. |
Calculation of Debye-Waller temperature factors for GaAs |
2008 |
Springer proceedings in physics |
120 |
|
UA library record; WoS full record; |
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Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Effect of temperature on the 002 electron structure factor and its consequence for the quantification of ternary and quaternary III-V crystals |
2008 |
Springer proceedings in physics |
120 |
|
UA library record; WoS full record; |
|
|
|
Rosenauer, A.; Schowalter, M.; Glas, F.; Lamoen, D. |
First-principles calculations of 002 structure factors for electron scattering in strained InxGa1-xAs |
2005 |
|
107 |
|
UA library record; WoS full record; |
|
|
|
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Microscopy of Semiconducting Materials |
107 |
|
UA library record; WoS full record; |
|
|
|
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis |
2003 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
|
|
|
Müller, K.; Schowalter, M.; Rosenauer, A.; Jansen, J.; Tsuda, K.; Titantah, J.T.; Lamoen, D. |
Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction |
2010 |
Journal of physics : conference series |
209 |
|
UA library record |
|
|
|
Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. |
Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer |
2019 |
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UA library record |
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