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Author Title Year Publication Volume Times cited Additional Links
Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S. Investigating lattice strain in Au nanodecahedrons 2016 UA library record
de Backer, A. Quantitative atomic resolution electron microscopy using advanced statistical techniques 2015 UA library record
De Backer, A.; De Wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? 2015 Journal of physics : conference series 644 UA library record; WoS full record
de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? 2015 Journal of physics : conference series 644 UA library record
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images 2017 Journal of physics : conference series T2 – Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK 902 1 UA library record; WoS full record; WoS citing articles
van den Bos, K.H.W.; Altantzis, T.; De Backer, A.; Van Aert, S.; Bals, S. Recent breakthroughs in scanning transmission electron microscopy of small species 2018 Advances in Physics: X 3 8 UA library record; WoS full record; WoS citing articles
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. Atom column detection 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Atom counting 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Efficient fitting algorithm 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. General conclusions and future perspectives 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. Image-quality evaluation and model selection with maximum a posteriori probability 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Introduction 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Optimal experiment design for nanoparticle atom counting from ADF STEM images 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Statistical parameter estimation theory : principles and simulation studies 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
De Backer, A.; Van Aert, S.; Faes, C.; Arslan Irmak, E.; Nellist, P.D.; Jones, L. Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm 2022 N P J Computational Materials 8 UA library record; WoS full record; WoS citing articles
Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images 2014 Micron 63 25 UA library record; WoS full record; WoS citing articles
De wael, A.; De Backer, A.; Van Aert, S. Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations 2020 Ultramicroscopy 219 UA library record; WoS full record; WoS citing articles
Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S. Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors 2022 Ultramicroscopy 242 UA library record; WoS full record; WoS citing articles
De Backer, A.; Bals, S.; Van Aert, S. A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection 2023 Ultramicroscopy 3 UA library record; WoS full record; WoS citing articles
Zhang, Z.; Lobato, I.; De Backer, A.; Van Aert, S.; Nellist, P. Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions 2023 Ultramicroscopy 246 UA library record; WoS full record; WoS citing articles
Lobato, I.; De Backer, A.; Van Aert, S. Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network 2023 Ultramicroscopy 251 UA library record; WoS full record
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. Atom counting from a combination of two ADF STEM images 2024 Ultramicroscopy 255 UA library record; WoS full record; WoS citing articles
Şentürk, D.G.; De Backer, A.; Van Aert, S. Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination 2024 Ultramicroscopy 259 UA library record
Guzzinati, G.; Altantzis, T.; Batuk, M.; De Backer, A.; Lumbeeck, G.; Samaee, V.; Batuk, D.; Idrissi, H.; Hadermann, J.; Van Aert, S.; Schryvers, D.; Verbeeck, J.; Bals, S. Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp 2018 Materials 11 15 UA library record; WoS full record; WoS citing articles
De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM 2022 Microscopy and microanalysis UA library record; WoS full record
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations 2013 Ultramicroscopy 134 48 UA library record; WoS full record; WoS citing articles
de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting 2015 Ultramicroscopy 151 29 UA library record; WoS full record; WoS citing articles
den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S. Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits? 2013 Ultramicroscopy 134 31 UA library record; WoS full record; WoS citing articles
de Backer, A.; Van Aert, S.; van Dyck, D. High precision measurements of atom column positions using model-based exit wave reconstruction 2011 Ultramicroscopy 111 8 UA library record; WoS full record; WoS citing articles
de Backer, A.; De wael, A.; Gonnissen, J.; Van Aert, S. Optimal experimental design for nano-particle atom-counting from high-resolution STEM images 2015 Ultramicroscopy 151 24 UA library record; WoS full record; WoS citing articles