| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Asfora, V.K.; Bueno, C.C.; de Barros, V.M.; Khoury, H.; Van Grieken, R. |
X-ray spectrometry applied for characterization of bricks of Brazilian historical sites |
2020 |
X-Ray Spectrometry |
|
|
UA library record; WoS full record |
| Van Grieken, R. |
Introducing four new members of the editorial board of X-ray spectrometry |
2015 |
X-ray spectrometry |
44 |
|
UA library record; WoS full record |
| Van Grieken, R. |
New members of the editorial board of X-ray Spectrometry |
2013 |
X-ray spectrometry |
42 |
|
UA library record; WoS full record |
| Van Grieken, R. |
Editorial : award for best X-Ray Spectrometry referee during 2011-2012 |
2013 |
X-ray spectrometry |
42 |
|
UA library record; WoS full record |
| Török, S.; Braun, T.; Van Dyck, P.; Van Grieken, R. |
Heterogeneity effects in direct XRF analysis of traces of heavy metals preconcentrated on polyurethane foam sorbents |
1986 |
X-ray spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
| Bichlmeier, S.; Janssens, K.; Heckel, J.; Gibson, D.; Hoffmann, P.; Ortner, H.M. |
Component selection for a compact micro-XRF spectrometer |
2001 |
X-ray spectrometry |
30 |
33 |
UA library record; WoS full record; WoS citing articles |
| Labrecque, J.J.; Beusen, J.M.; Van Grieken, R.E. |
Determination of barium, lanthanum, cerium and neodymium in lateritic materials by various energy-dispersive X-ray fluorescence techniques and neutron activation analysis |
1986 |
X-ray spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
| Spolnik, Z.; Tsuji, K.; Van Grieken, R. |
Grazing-exit electron probe x-ray microanalysis of light elements in particles |
2004 |
X-ray spectrometry |
33 |
|
UA library record; WoS full record; WoS citing articles |
| Padilla, R.; van Espen, P.; Abrahantes, A.; Janssens, K. |
Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses |
2005 |
X-ray spectrometry |
34 |
23 |
UA library record; WoS full record; WoS citing articles |
| Török, S.; Van Dyck, P.; Van Grieken, R. |
Heterogeneity effects in direct X-ray fluorescence analysis of hair |
1984 |
X-ray spectrometry |
13 |
|
UA library record; WoS full record; WoS citing articles |
| Araujo, M.F.; van Espen, P.; Van Grieken, R. |
Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation |
1990 |
X-ray spectrometry |
19 |
|
UA library record; WoS full record; WoS citing articles |
| Injuk, J.; Van Grieken, R. |
Literature trends in x-ray emission spectrometry in the period 1990-2000: a review |
2003 |
X-ray spectrometry |
32 |
|
UA library record; WoS full record; WoS citing articles |
| Storms, H.M.; Janssens, K.H.; Török, S.B.; Van Grieken, R.E. |
Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles |
1989 |
X-ray spectrometry |
18 |
|
UA library record; WoS full record; WoS citing articles |
| Szalóki, I.; Szegedi, S.; Varga, K.; Braun, M.; Osán, J.; Van Grieken, R. |
Efficiency calibartion of energy-dispersive detectors for application in quantitative x- and γ-ray spectrometry |
2001 |
X-ray spectrometry |
30 |
|
UA library record; WoS full record; WoS citing articles |
| Markowicz, A.; Van Dyck, P.; Van Grieken, R. |
Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis |
1980 |
X-ray spectrometry |
9 |
|
UA library record; WoS full record; WoS citing articles |
| Van Grieken, R.E.; Adams, F.C. |
Folding of aerosol loaded filters during X-ray fluorescence analysis |
1976 |
X-ray spectrometry |
5 |
|
UA library record; WoS full record; WoS citing articles |
| Van Grieken, R. |
Introducing John Campbell, the new regional editor for North America of X-Ray Spectrometry |
2014 |
X-ray spectrometry |
43 |
|
UA library record; WoS full record |
| Van Grieken, R. |
Awards for best referees of X-ray Spectrometry |
2014 |
X-ray spectrometry |
43 |
|
UA library record |
| Van Dyck, P.; Markowicz, A.; Van Grieken, R. |
Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal |
1980 |
X-ray spectrometry |
9 |
|
UA library record; WoS full record; WoS citing articles |
| Janssens, K.; Vittiglio, G.; Deraedt, I.; Aerts, A.; Vekemans, B.; Vincze, L.; Wei, F.; de Ryck, I.; Schalm, O.; Adams, F.; Rindby, A.; Knöchel, A.; Simionovici, A.S.; Snigirev, A. |
Use of microscopic XRF for non-destructive analysis in art an archaeometry |
2000 |
X-ray spectrometry |
29 |
|
UA library record; WoS full record; WoS citing articles |
| Samek, L.; Injuk, J.; van Espen, P.; Van Grieken, R. |
Performance of a new compact EDXRF spectrometer for aerosol analysis |
2002 |
X-ray spectrometry |
31 |
|
UA library record; WoS full record; WoS citing articles |
| Bichlmeier, S.; Janssens, K.; Heckel, J.; Hoffmann, P.; Ortner, H.M. |
Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer |
2002 |
X-ray spectrometry |
31 |
12 |
UA library record; WoS full record; WoS citing articles |
| van der Snickt, G.; Janssens, K.; Schalm, O.; Aibéo, C.; Kloust, H.; Alfeld, M. |
James Ensor's pigment use: artistic and material evolution studied by means of portable X-ray fluorescence spectrometry |
2010 |
X-ray spectrometry |
39 |
25 |
UA library record; WoS full record; WoS citing articles |
| Van Dyck, P.; Van Grieken, R. |
Automated matrix-correction of line ratios in energy-dispersive x-ray fluorescence spectrum deconvolution |
1983 |
X-ray spectrometry |
12 |
|
UA library record; WoS full record |
| van der Linden, V.; Schalm, O.; Houbraken, J.; Thomas, M.; Meesdom, E.; Devos, A.; van Dooren, R.; Nieuwdorp, H.; Janssen, E.; Janssens, K. |
Chemical analysis of 16th to 19th century Limoges School painted enamel objects in three museums of the Low Countries |
2010 |
X-ray spectrometry |
39 |
8 |
UA library record; WoS full record; WoS citing articles |
| Belikov, K.N.; Mikhailova, L.I.; Spolnik, Z.M.; Van Grieken, R. |
EDXRF determination of impurities in potassium dihydrogenphosphate single crystals and raw materials |
2006 |
X-ray spectrometry |
35 |
|
UA library record; WoS full record; WoS citing articles |
| Markowicz, A.; Storms, H.; Van Grieken, R. |
A simple absorption correction for electron probe X-ray microanalysis of bulk samples |
1986 |
X-ray spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
| Markowicz, A.; Storms, H.; Van Grieken, R. |
Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples |
1986 |
X-ray spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
| Cabal, A.; Schalm, O.; Eyskens, P.; Willems, P.; Harth, A.; van Espen, P. |
Comparison of x-ray absorption and emission techniques for the investigation of paintings |
2015 |
X-ray spectrometry |
44 |
|
UA library record; WoS full record; WoS citing articles |
| Muia, L.M.; Van Grieken, R. |
Use of theoretical accurate binary influence coefficients with Tertian's equation in X-ray fluorescence analysis of silicate rocks in borax glass beads |
1990 |
X-ray spectrometry |
19 |
|
UA library record; WoS full record; WoS citing articles |
