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  Author Title Year Publication Volume Times cited Additional Links Links
Lobato, I.; Friedrich, T.; Van Aert, S. Deep convolutional neural networks to restore single-shot electron microscopy images 2024 N P J Computational Materials 10 UA library record; WoS full record pdf url doi
Zhang, Z.; Lobato, I.; De Backer, A.; Van Aert, S.; Nellist, P. Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions 2023 Ultramicroscopy 246 UA library record; WoS full record; WoS citing articles pdf url doi
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