| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Denisov, N.; Jannis, D.; Orekhov, A.; Müller-Caspary, K.; Verbeeck, J. |
Characterization of a Timepix detector for use in SEM acceleration voltage range |
2023 |
Ultramicroscopy |
253 |
|
UA library record; WoS full record |
| Annys, A.; Jannis, D.; Verbeeck, J.; Annys, A.; Jannis, D.; Verbeeck, J. |
Deep learning for automated materials characterisation in core-loss electron energy loss spectroscopy |
2023 |
Scientific reports |
13 |
|
UA library record; WoS full record |
| Friedrich, T.; Yu, C.-P.; Verbeeck, J.; Van Aert, S. |
Phase object reconstruction for 4D-STEM using deep learning |
2023 |
Microscopy and microanalysis |
29 |
1 |
UA library record; WoS full record; WoS citing articles |
| Grünewald, L.; Chezganov, D.; De Meyer, R.; Orekhov, A.; Van Aert, S.; Bogaerts, A.; Bals, S.; Verbeeck, J. |
In Situ Plasma Studies Using a Direct Current Microplasma in a Scanning Electron Microscope |
2024 |
Advanced Materials Technologies |
|
|
UA library record; WoS full record |
