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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
New method to determine the parity of the number of twin planes in tabular silver halide microcrystals from top views |
1997 |
The journal of imaging science and technology |
41 |
1 |
UA library record; WoS full record; WoS citing articles |
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Van Tendeloo, G.; De Meulenaere, P.; Schryvers, D. |
Landscape roughness at an atomic scale |
1997 |
Physica: D : nonlinear phenomena |
107 |
2 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D. |
Electron microscopy studies of martensite microstructures |
1997 |
Journal de physique: 4 |
C5 |
2 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Yandouzi, M.; Holland-Moritz, D.; Toth, L. |
HRTEM study of austenite and martensite in splat-cooled and nanoscale thin film Ni-Al |
1997 |
Journal de physique: 4 |
C5 |
2 |
UA library record; WoS full record; WoS citing articles |
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Seo, J.W.; Schryvers, D. |
Defect structures in CuZr martensite, studies by CTEM and HRTEM |
1997 |
Journal de physique: 4 |
C5 |
1 |
UA library record; WoS full record; WoS citing articles |
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Frangis, N.; van Landuyt, J.; Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G. |
Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction |
1997 |
Journal of crystal growth |
172 |
29 |
UA library record; WoS full record; WoS citing articles |
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Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Obratzova, E.D.; Korothushenko, K.G.; Smolin, A.A. |
Structural studies of nanocrystalline diamond thin films |
1997 |
Materials science forum |
239-241 |
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UA library record; WoS full record; |
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Teodorescu, V.S.; Nistor, L.C.; van Landuyt, J. |
High resolution TEM observation of in situ colloid formation in CaF2 crystals |
1997 |
Materials science forum |
239-241 |
3 |
UA library record; WoS full record; WoS citing articles |
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Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
Microstructure and formation mechanisms of cylindrical and conical scrolls of the misfit layer compounds PbNbnS2n+1 |
1997 |
Journal of crystal growth |
172 |
23 |
UA library record; WoS full record; WoS citing articles |
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Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Obratzova, E.D.; Smolin, A.A. |
Nanocrystalline diamond films: transmission electron microscopy and Raman spectroscopy characterization |
1997 |
Diamond and related materials |
6 |
116 |
UA library record; WoS full record; WoS citing articles |
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Morimura, T.; Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Hasaka, M.; Hisatsune, K. |
Microstructure of Mn-doped, spin-cast FeSi2 |
1997 |
Journal of electron microscopy |
46 |
3 |
UA library record; WoS full record; WoS citing articles |
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Suvorov, A.V.; Lebedev, O.I.; Suvorova, A.A.; van Landuyt, J.; Usov, I.O. |
Defect characterization in high temperature implanted 6H-SiC using TEM |
1997 |
Nuclear instruments and methods in physics research: B |
127/128 |
17 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation |
1997 |
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UA library record |
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de Hosson, J.T.M.; Van Tendeloo, G. |
Metals and alloys |
1997 |
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UA library record |
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de Hosson, J.T.M.; Van Tendeloo, G. |
Superconducting ceramics |
1997 |
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UA library record |
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Frangis, N.; Stoemenos, J.; van Landuyt, J.; Nejim, A.; Hemment, P.L.F. |
The formation of 3C-SiC in crystalline Si by carbon implantation at 9500C and annealing: a structural study |
1997 |
Journal of crystal growth |
181 |
9 |
UA library record; WoS full record; WoS citing articles |
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Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. |
Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging |
1997 |
Ultramicroscopy |
69 |
11 |
UA library record; WoS full record; WoS citing articles |
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Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Handbook of microscopy: applications in materials science, solid-state physics and chemistry |
1997 |
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UA library record |
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Van Tendeloo, G.; Lebedev, O.I.; Shpanchenko, R.V.; Antipov, E.V. |
Structure determination of YBCO fluorinated phases by HREM |
1997 |
Journal of electron microscopy |
1 |
|
UA library record |
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van Landuyt, J.; van Bockstael, M.H.G.; van Royen, J. |
Microscopy of gemmological materials |
1997 |
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4 |
UA library record; WoS full record; WoS citing articles |
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Volkov, V.V.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S.; Busheva, E.E.; Shabunina, G.G.; Aminov, T.G.; Novotortsev, V.M. |
HREM image analysis up to structure determination of SbCrSe3: a new 1D ferromagnet |
1997 |
Journal of solid state chemistry |
132 |
1 |
UA library record; WoS full record; WoS citing articles |
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Milants, K.; Hendrickx, P.; Verheyden, J.; Barancira, T.; Deweerd, W.; Pattyn, H.; Bukshpan, S.; Vermeiren, F.; Van Tendeloo, G. |
133Xe(Cs) Mössbauer measurements on Ar, Ne, Kr, Xe, Rb, and Cs inclusions in W and Mo |
1997 |
Physical review : B : condensed matter and materials physics |
55 |
2 |
UA library record; WoS full record; WoS citing articles |
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Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
Electron microscopy of carbon nanotubes and related structures |
1997 |
The journal of physics and chemistry of solids |
58 |
12 |
UA library record; WoS full record; WoS citing articles |
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Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Verhoeven, M.A.J.; Rijnders, A.J.H.M.; Blank, D.H.A.; Rogalia, H. |
Ga segregation in DyBa2Cu3O7-\delta/PrBa2Cu3-xGaxO7-\delta/DyBa2Cu3O7-\delta ramp-type Josephson junctions |
1997 |
Applied physics letters |
70 |
8 |
UA library record; WoS full record; WoS citing articles |
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Monot, I.; Verbist, K.; Hervieu, M.; Laffez, P.; Delamare, M.P.; Wang, J.; Desgardin, G.; Van Tendeloo, G. |
Microstructure and flux pinning properties of melt textured grown doped YBa2Cu3O7-\delta |
1997 |
Physica: C : superconductivity |
274 |
33 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
New intermediate defect configuration in Si studied by in situ HREM irradiation |
1997 |
Conference series of the Institute of Physics |
157 |
|
UA library record; WoS full record; |
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De Meulenaere, P.; Mommaert, C.; Van Tendeloo, G. |
Short-range order in phase segregation systems |
1997 |
Solid state communications |
102 |
|
UA library record; WoS full record |
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Vanhellemont, J.; Bender, H.; van Landuyt, J. |
TEM studies of processed Si device materials |
1997 |
Conference series of the Institute of Physics |
157 |
|
UA library record; WoS full record; |
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Devouard, B.; Baronnet, A.; Van Tendeloo, G.; Amelinckx, S. |
First evidence of synthetic polygonal serpentines |
1997 |
European journal of mineralogy |
9 |
15 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Lebedev, O.I.; Van Tendeloo, G.; van Landuyt, J. |
In-situ HREM irradiation study of point defect clustering in strained GexSi1-x/(001)Si heterostructure |
1997 |
Conference series of the Institute of Physics |
157 |
1 |
UA library record; WoS full record; WoS citing articles |
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