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A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy”. van den Broek W, Van Aert S, van Dyck D, Ultramicroscopy 110, 548 (2010). http://doi.org/10.1016/j.ultramic.2009.09.008
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Throughput maximization of particle radius measurements by balancing size and current of the electron probe”. van den Broek W, Van Aert S, Goos P, van Dyck D, Ultramicroscopy 111, 940 (2011). http://doi.org/10.1016/j.ultramic.2010.11.025
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A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM”. Van den Broek W, Rosenauer A, Van Aert S, Sijbers J, van Dyck D, Ultramicroscopy 141, 22 (2014). http://doi.org/10.1016/j.ultramic.2014.03.008
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Correction of non-linear thickness effects in HAADF STEM electron tomography”. van den Broek W, Rosenauer A, Goris B, Martinez GT, Bals S, Van Aert S, van Dyck D, Ultramicroscopy 116, 8 (2012). http://doi.org/10.1016/j.ultramic.2012.03.005
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Various compressed sensing setups evaluated against Shannon sampling under constraint of constant illumination”. Van den Broek W, Reed BW, Béché, A, Velazco A, Verbeeck J, Koch CT, IEEE transactions on computational imaging 5, 502 (2019). http://doi.org/10.1109/TCI.2019.2894950
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Convexity constraints on linear background models for electron energy-loss spectra”. Van den Broek W, Jannis D, Verbeeck J, Ultramicroscopy 254, 113830 (2023). http://doi.org/10.1016/j.ultramic.2023.113830
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Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy”. van den Bos KH W, De Backer A, Martinez GT, Winckelmans N, Bals S, Nellist PD, Van Aert S, Physical review letters 116, 246101 (2016). http://doi.org/10.1103/PhysRevLett.116.246101
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Locating light and heavy atomic column positions with picometer precision using ISTEM”. van den Bos KHW, Krause FF, Béché, A, Verbeeck J, Rosenauer A, Van Aert S, Ultramicroscopy 172, 75 (2016). http://doi.org/10.1016/j.ultramic.2016.10.003
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The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials”. van den Bos KHW, Janssens L, De Backer A, Nellist PD, Van Aert S, Ultramicroscopy 203, 155 (2019). http://doi.org/10.1016/j.ultramic.2018.12.004
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Recent breakthroughs in scanning transmission electron microscopy of small species”. van den Bos KHW, Altantzis T, De Backer A, Van Aert S, Bals S, Advances in Physics: X 3, 1480420 (2018). http://doi.org/10.1080/23746149.2018.1480420
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van den Bos KHW (2017) Quantitative atomic resolution transmission electron microscopy for heterogeneous nanomaterials. Antwerpen
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Selective bifunctional catalytic conversion of cellulose over reshaped ni particles at the tip of carbon nanofibers”. Van de Vyver S, Geboers J, Dusselier M, Schepers H, Vosch T, Zhang L, Van Tendeloo G, Jacobs PA, Sels BF, Chemsuschem 3, 698 (2010). http://doi.org/10.1002/cssc.201000087
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How flue gas impurities affect the electrochemical reduction of CO₂, to CO and formate”. Van Daele S, Hintjens L, Hoekx S, Bohlen B, Neukermans S, Daems N, Hereijgers J, Breugelmans T, Applied catalysis : B : environmental 341, 123345 (2024). http://doi.org/10.1016/J.APCATB.2023.123345
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Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN”. van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys MR, Germain M, Springer proceedings in physics 107, 389 (2005)
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The role of Al on Ohmic contact formation on n-type GaN and AlGaN/GaN”. van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys M, Germain M, Applied physics letters 87, 061905 (2005). http://doi.org/10.1063/1.2008361
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Formation of metallic In in InGaN/GaN multiquantum wells”. van Daele B, Van Tendeloo G, Jacobs K, Moerman I, Leys M, Applied physics letters 85, 4379 (2004). http://doi.org/10.1063/1.1815054
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Relation between microstructure and 2DEG properties of AlGaN/GaN structures”. van Daele B, Van Tendeloo G, Germain M, Leys M, Bougrioua Z, Moerman I, Physica status solidi: B: basic research 234, 830 (2002). http://doi.org/10.1002/1521-3951(200212)234:3<830::AID-PSSB830>3.0.CO;2-O
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Unravelling the multi-scale structure-property relationship of laser powder bed fusion processed and heat-treated AlSi10Mg”. Van Cauwenbergh P, Samaee V, Thijs L, Nejezchlebova J, Sedlak P, Ivekovic A, Schryvers D, Van Hooreweder B, Vanmeensel K, Scientific Reports 11, 6423 (2021). http://doi.org/10.1038/S41598-021-85047-2
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Spin effects in electron vortex states”. Van Boxem R, Verbeeck J, Partoens B, Europhysics letters 102, 40010 (2013). http://doi.org/10.1209/0295-5075/102/40010
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Inelastic electron-vortex-beam scattering”. Van Boxem R, Partoens B, Verbeeck J, Physical review : A : atomic, molecular and optical physics 91, 032703 (2015). http://doi.org/10.1103/PhysRevA.91.032703
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Rutherford scattering of electron vortices”. Van Boxem R, Partoens B, Verbeeck J, Physical review : A : atomic, molecular and optical physics 89, 032715 (2014). http://doi.org/10.1103/PhysRevA.89.032715
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Van Boxem R (2015) Electron vortex beams : an in-depth theoretical study. Antwerpen
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Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, van Dyck D, Van Tendeloo G, Ultramicroscopy 109, 1236 (2009). http://doi.org/10.1016/j.ultramic.2009.05.010
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Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Bals S, Erni R, van Dyck D, Van Tendeloo G, Microscopy and microanalysis 15, 464 (2009). http://doi.org/10.1017/S1431927609093957
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Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative”. Van Aert S, van Dyck D, den Dekker AJ, Optics express 14, 3830 (2006). http://doi.org/10.1364/OE.14.003830
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Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns?”.Van Aert S, van Dyck D, Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 81, 1833 (2001). http://doi.org/10.1080/13642810108223121
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Model-based electron microscopy : from images toward precise numbers for unknown structure parameters”. Van Aert S, van den Broek W, Goos P, van Dyck D, Micron 43, 509 (2012). http://doi.org/10.1016/j.micron.2011.10.019
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Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy”. Van Aert S, Turner S, Delville R, Schryvers D, Van Tendeloo G, Salje EKH, Advanced materials 24, 523 (2012). http://doi.org/10.1002/adma.201103717
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Functional twin boundaries”. Van Aert S, Turner S, Delville R, Schryvers D, Van Tendeloo G, Ding X, Salje EKH, Phase transitions 86, 1052 (2013). http://doi.org/10.1080/01411594.2012.748909
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Electron channelling based crystallography”. Van Aert S, Geuens P, van Dyck D, Kisielowski C, Jinschek JR, Ultramicroscopy 107, 551 (2007). http://doi.org/10.1016/j.ultramic.2006.04.031
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