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Highly Emissive Divalent-Ion-Doped Colloidal CsPb1–xMxBr3Perovskite Nanocrystals through Cation Exchange”. van der Stam W, Geuchies JJ, Altantzis T, van den Bos KHW, Meeldijk JD, Van Aert S, Bals S, Vanmaekelbergh D, de Mello Donega C, Journal of the American Chemical Society 139, 4087 (2017). http://doi.org/10.1021/jacs.6b13079
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Shape Control of Colloidal Cu2-x S Polyhedral Nanocrystals by Tuning the Nucleation Rates”. van der Stam W, Gradmann S, Altantzis T, Ke X, Baldus M, Bals S, de Mello Donega C, Chemistry of materials 28, 6705 (2016). http://doi.org/10.1021/acs.chemmater.6b03098
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Young Anthony van Dyck revisited : a multidisciplinary approach to a portrait once attributed to Peter Paul Rubens”. Van der Stighelen K, Janssens K, van der Snickt G, Alfeld M, Van Beneden B, Demarsin B, Proesmans M, Marchal G, Dik J, Art matters : international journal for technical art history 6, 21 (2014)
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Formation of a conducting LaAlO3/SrTiO3 interface studied by low-energy electron reflection during growth”. van der Torren AJH, Liao Z, Xu C, Gauquelin N, Yin C, Aarts J, van der Molen SJ, Physical Review Materials 1, 075001 (2017). http://doi.org/10.1103/PhysRevMaterials.1.075001
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Synthesis &ndash, properties correlation and the unexpected role of the titania support on the Grignard surface modification”. Van Dijck JG, Mampuys P, Ching HYV, Krishnan D, Baert K, Hauffman T, Verbeeck J, Van Doorslaer S, Maes BUW, Dorbec M, Buekenhoudt A, Meynen V, Applied Surface Science 527, 146851 (2020). http://doi.org/10.1016/J.APSUSC.2020.146851
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Cluster issue on plasma modelling”. van Dijk J, Kroesen GMW, Bogaerts A London (2009).
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Plasma modelling and numerical simulation”. van Dijk J, Kroesen GMW, Bogaerts A, Journal of physics: D: applied physics 42, 190301 (2009). http://doi.org/10.1088/0022-3727/42/19/190301
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Skyrmion elongation, duplication, and rotation by spin-transfer torque under spatially varying spin current”. van Duijn F, Osca J, Sorée B, Physical Review B 104, 094426 (2021). http://doi.org/10.1103/PHYSREVB.104.094426
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Van Duppen B (2016) Plasmonics in graphene and related materials. Antwerpen
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Comment on “Chiral tunneling in trilayer graphene&rdquo, [Appl. Phys. Lett. 100, 163102 (2012)]”. Van Duppen B, Peeters FM, Applied physics letters 101, 226101 (2012). http://doi.org/10.1063/1.4767221
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Four-band tunneling in bilayer graphene”. Van Duppen B, Peeters FM, Physical review : B : condensed matter and materials physics 87, 205427 (2013). http://doi.org/10.1103/PhysRevB.87.205427
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Klein paradox for a pn junction in multilayer graphene”. Van Duppen B, Peeters FM, Europhysics letters 102, 27001 (2013). http://doi.org/10.1209/0295-5075/102/27001
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Thermodynamic properties of the electron gas in multilayer graphene in the presence of a perpendicular magnetic field”. Van Duppen B, Peeters FM, Physical review : B : condensed matter and materials physics 88, 245429 (2013). http://doi.org/10.1103/PhysRevB.88.245429
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Multiband tunneling in trilayer graphene”. Van Duppen B, Sena SHR, Peeters FM, Physical review : B : condensed matter and materials physics 87, 195439 (2013). http://doi.org/10.1103/PhysRevB.87.195439
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Current-induced birefringent absorption and non-reciprocal plasmons in graphene”. Van Duppen B, Tomadin A, Grigorenko AN, Polini M, 2D materials 3, 015011 (2016). http://doi.org/10.1088/2053-1583/3/1/015011
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Spin and valley polarization of plasmons in silicene due to external fields”. Van Duppen B, Vasilopoulos P, Peeters FM, Physical review : B : condensed matter and materials physics 90, 035142 (2014). http://doi.org/10.1103/PhysRevB.90.035142
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Statistical method for thickness measurement of amorphous objects”. van Dyck D, Croitoru MD, Applied physics letters 90, 241911 (2007). http://doi.org/10.1063/1.2749184
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Do you believe that atoms stay in place when you observe them in HREM?”.van Dyck D, Lobato I, Chen F-R, Kisielowski C, Micron 68, 158 (2015). http://doi.org/10.1016/j.micron.2014.09.003
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Atomic resolution electron tomography: a dream?”.van Dyck D, Van Aert S, Croitoru M, International journal of materials research 97, 872 (2006). http://doi.org/10.3139/146.101314
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Obstacles on the road towards atomic resolution tomography”. van Dyck D, Van Aert S, Croitoru MD, Microscoy and microanalysis 11, 238 (2005)
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Physical limits on atomic resolution”. van Dyck D, Van Aert S, den Dekker AJ, Microscopy and microanalysis 10, 153 (2004). http://doi.org/10.1017/S143192760404036X
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Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?”.van Dyck D, Van Aert S, den Dekker AJ, van den Bos A, Ultramicroscopy 98, 27 (2003). http://doi.org/10.1016/S0304-3991(03)00023-8
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Spectrometric determination of silicon in food and biological samples: an interlaboratory trial”. van Dyck K, Robberecht H, van Cauwenbergh R, Deelstra H, Arnaud J, Willemyns L, Benijts F, Centeno JA, Taylor H, Soares ME, Bastos ML, Ferreira MA, d'Haese PC, Lamberts LV, Hoenig M, Knapp G, Lugowski SJ, Moens L, Riondato J, Van Grieken R, Claes M, Verheyen R, Clement L, Uytterhoeven M, Journal of analytical atomic spectrometry 15, 735 (2000). http://doi.org/10.1039/B000572J
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Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal”. Van Dyck P, Markowicz A, Van Grieken R, X-ray spectrometry 9, 70 (1980). http://doi.org/10.1002/XRS.1300090209
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Influence of sample thickness, excitation energy and geometry on particle size effects in XRF”. Van Dyck P, Markowicz A, Van Grieken R, X-ray spectrometry 14, 183 (1985). http://doi.org/10.1002/XRS.1300140409
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Automated quantitative electron-microprobe analysis of particulate material”. Van Dyck P, Storms H, Van Grieken R, Journal de physique 45, 781 (1984). http://doi.org/10.1051/JPHYSCOL:19842179
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Monte Carlo simulation of backscattered peaks in secondary target energy-dispersive X-ray spectra”. Van Dyck P, Török S, Van Grieken R, X-ray spectrometry 15, 231 (1986). http://doi.org/10.1002/XRS.1300150403
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Automated energy-dispersive X-ray fluorescence analysis for diverse environmental samples”. Van Dyck P, Van Grieken R page 315 (1982).
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Automated matrix-correction of line ratios in energy-dispersive x-ray fluorescence spectrum deconvolution”. Van Dyck P, Van Grieken R, X-ray spectrometry 12, 111 (1983). http://doi.org/10.1002/XRS.1300120306
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Enhancement effect in X-ray fluorescence analysis of environmental samples of medium thickness”. Van Dyck PM, Török SB, Van Grieken RE, Analytical chemistry 58, 1761 (1986). http://doi.org/10.1021/AC00121A036
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