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| Author | van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. | ||||
| Title | Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? | Type | A1 Journal article | ||
| Year | 2003 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 98 | Issue | Pages | 27-42 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000186831500003 | Publication Date | 2003-04-25 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 26 | Open Access | |
| Notes | Approved  |
Most recent IF: 2.843; 2003 IF: 1.665 | |||
| Call Number | UA @ lucian @ c:irua:47516 | Serial | 1749 | ||
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| Author | Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. | ||||
| Title | Optimal experimental design of STEM measurement of atom column positions | Type | A1 Journal article | ||
| Year | 2002 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 90 | Issue | Pages | 273-289 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000174770900004 | Publication Date | 2002-07-25 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 35 | Open Access | |
| Notes | Approved |
Most recent IF: 2.843; 2002 IF: 1.772 | |||
| Call Number | UA @ lucian @ c:irua:47517 | Serial | 2483 | ||
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| Author | den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. | ||||
| Title | Does a monochromator improve the precision in quantitative HRTEM? | Type | A1 Journal article | ||
| Year | 2001 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 89 | Issue | Pages | 275-290 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000172667000004 | Publication Date | 2002-07-25 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 22 | Open Access | |
| Notes | Approved |
Most recent IF: 2.843; 2001 IF: 1.890 | |||
| Call Number | UA @ lucian @ c:irua:47518 | Serial | 746 | ||
| Permanent link to this record | |||||
| Author | Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. | ||||
| Title | Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging | Type | A1 Journal article | ||
| Year | 1997 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 69 | Issue | Pages | 219-240 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | A1997YG59500001 | Publication Date | 0000-00-00 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 11 | Open Access | |
| Notes | Approved |
Most recent IF: 2.843; 1997 IF: 1.600 | |||
| Call Number | UA @ lucian @ c:irua:21416 | Serial | 455 | ||
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| Author | Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. | ||||
| Title | How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? | Type | A1 Journal article | ||
| Year | 2017 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 181 | Issue | 181 | Pages | 134-143 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | In this paper, we investigate how precise atoms of a small nanocluster can ultimately be located in three dimensions (3D) from a tilt series of images acquired using annular dark field (ADF) scanning transmission electron microscopy (STEM). Therefore, we derive an expression for the statistical precision with which the 3D atomic position coordinates can be estimated in a quantitative analysis. Evaluating this statistical precision as a function of the microscope settings also allows us to derive the optimal experimental design. In this manner, the optimal angular tilt range, required electron dose, optimal detector angles, and number of projection images can be determined. | ||||
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| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000411170800016 | Publication Date | 2016-12-15 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 3 | Open Access | OpenAccess |
| Notes | The authors acknowledge financial support from the European Union under the Seventh Framework Program under a contract for an Integrated Infrastructure Initiative. Reference No. 312483-ESTEEM2. The authors acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through project fundings (G.0374.13N, G.0369.15N, G.0368.15N, and WO.010.16N) and a post-doctoral grant to A. De Backer, and from the DFG under contract No. RO-2057/4-2. | Approved |
Most recent IF: 2.843 | ||
| Call Number | EMAT @ emat @ c:irua:144432 | Serial | 4618 | ||
| Permanent link to this record | |||||
| Author | Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. | ||||
| Title | High-resolution electron microscopy and electron tomography: resolution versus precision | Type | A1 Journal article | ||
| Year | 2002 | Publication | Journal of structural biology | Abbreviated Journal | J Struct Biol |
| Volume | 138 | Issue | Pages | 21-33 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | New York | Editor | ||
| Language | Wos | 000177978800003 | Publication Date | 2002-09-17 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1047-8477; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.767 | Times cited | 33 | Open Access | |
| Notes | Approved |
Most recent IF: 2.767; 2002 IF: 4.194 | |||
| Call Number | UA @ lucian @ c:irua:47520 | Serial | 1446 | ||
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| Author | Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. | ||||
| Title | High-resolution electron microscopy : from imaging toward measuring | Type | A1 Journal article | ||
| Year | 2002 | Publication | IEEE transactions on instrumentation and measurement | Abbreviated Journal | Ieee T Instrum Meas |
| Volume | 51 | Issue | 4 | Pages | 611-615 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | New York, N.Y. | Editor | ||
| Language | Wos | 000178992000010 | Publication Date | 2003-01-03 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0018-9456; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.456 | Times cited | 13 | Open Access | |
| Notes | Approved |
Most recent IF: 2.456; 2002 IF: 0.592 | |||
| Call Number | UA @ lucian @ c:irua:47521 | Serial | 1450 | ||
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| Author | Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. | ||||
| Title | Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution | Type | A1 Journal article | ||
| Year | 2022 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 233 | Issue | Pages | 113425 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | We report a study of scattering dynamics in crystals employing momentum-resolved scanning transmission electron microscopy under varying illumination conditions. As we perform successive changes of the probe focus, multiple real-space signals are obtained in dependence of the shape of the incident electron wave. With support from extensive simulations, each signal is shown to be characterised by an optimum focus for which the contrast is maximum and which differs among different signals. For instance, a systematic focus mismatch is found between images formed by high-angle scattering, being sensitive to thickness and chemical composition, and the first moment in diffraction space, being sensitive to electric fields. It follows that a single recording at one specific probe focus is usually insufficient to characterise materials comprehensively. Most importantly, we demonstrate in experiment and simulation that the second moment ( |
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| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000734396800009 | Publication Date | 2021-11-13 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.2 | Times cited | Open Access | OpenAccess | |
| Notes | We thank Dr. Florian Winkler for valuable discussions and experimental work at the early stages of this study. This work was supported by the Initiative and Network Fund of the Helmholtz Association (Germany) under contracts VH-NG-1317 and ZT-I-0025. This project furthermore received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation program (grant agreement No. 770887). | Approved |
Most recent IF: 2.2 | ||
| Call Number | EMAT @ emat @c:irua:184833 | Serial | 6898 | ||
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| Author | Van Tendeloo, G.; Bals, S.; Van Aert, S.; Verbeeck, J.; van Dyck, D. | ||||
| Title | Advanced electron microscopy for advanced materials | Type | A1 Journal article | ||
| Year | 2012 | Publication | Advanced materials | Abbreviated Journal | Adv Mater |
| Volume | 24 | Issue | 42 | Pages | 5655-5675 |
| Keywords | A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | The idea of this Review is to introduce newly developed possibilities of advanced electron microscopy to the materials science community. Over the last decade, electron microscopy has evolved into a full analytical tool, able to provide atomic scale information on the position, nature, and even the valency atoms. This information is classically obtained in two dimensions (2D), but can now also be obtained in 3D. We show examples of applications in the field of nanoparticles and interfaces. | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Weinheim | Editor | ||
| Language | Wos | 000310602200001 | Publication Date | 2012-08-21 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0935-9648; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 19.791 | Times cited | 107 | Open Access | |
| Notes | This work was supported by funding from the European Research Council under the 7th Framework Program (FP7), ERC grant No 246791 – COUNTATOMS. J.V. Acknowledges funding from the European Research Council under the 7th Framework Program (FP7), ERC Starting Grant 278510 VORTEX. The authors gratefully acknowledge funding from the Research Foundation Flanders (FWO, Belgium). The Qu-Ant-EM microscope was partly funded by the Hercules Fund from the Flemish Government. We thank Rafal Dunin-Borkowski for providing Figure 5d. The authors would like to thank the colleagues who have contributed to this work over the years, including K.J. Batenburg, R. Erni, B. Goris, F. Leroux, H. Lichte, A. Lubk, B. Partoens, M. D. Rossell, P. Schattschneider, B. Schoeters, D. Schryvers, H. Tan, H. Tian, S. Turner, M. van Huis. ECASJO_; | Approved |
Most recent IF: 19.791; 2012 IF: 14.829 | ||
| Call Number | UA @ lucian @ c:irua:100470UA @ admin @ c:irua:100470 | Serial | 70 | ||
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| Author | van Dyck, D.; Lobato, I.; Chen, F.-R.; Kisielowski, C. | ||||
| Title | Do you believe that atoms stay in place when you observe them in HREM? | Type | A1 Journal article | ||
| Year | 2015 | Publication | Micron | Abbreviated Journal | Micron |
| Volume | 68 | Issue | 68 | Pages | 158-163 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | Recent advancements in aberration-corrected electron microscopy allow for an evaluation of unexpectedly large atom displacements beyond a resolution limit of similar to 0.5 angstrom, which are found to be dose-rate dependent in high resolution images. In this paper we outline a consistent description of the electron scattering process, which explains these unexpected phenomena. Our approach links thermal diffuse scattering to electron beam-induced object excitation and relaxation processes, which strongly contribute to the image formation process. The effect can provide an explanation for the well-known contrast mismatch (“Stobbs factor”) between image calculations and experiments. (C) 2014 Elsevier Ltd. All rights reserved. | ||||
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| Publisher | Place of Publication | Oxford | Editor | ||
| Language | Wos | 000348016500023 | Publication Date | 2014-09-16 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.98 | Times cited | 11 | Open Access | |
| Notes | Approved |
Most recent IF: 1.98; 2015 IF: 1.988 | |||
| Call Number | c:irua:123802 | Serial | 745 | ||
| Permanent link to this record | |||||
| Author | Xu, Q.; Zandbergen, H.W.; van Dyck, D. | ||||
| Title | Imaging from atomic structure to electronic structure | Type | A1 Journal article | ||
| Year | 2012 | Publication | Micron | Abbreviated Journal | Micron |
| Volume | 43 | Issue | 4 | Pages | 524-531 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | This paper discusses the possibility of retrieving the electron distribution (with highlighted valence electron distribution information) of materials from recorded HREM images. This process can be achieved by solving two inverse problems: reconstruction of the exit wave and reconstruction of the electron distribution from exit waves. The first inverse problem can be solved using a focal series reconstruction method. We show that the second inverse problem can be solved by combining a series of exit waves recorded at different thickness conditions. This process is designed based on an improved understanding of the dynamical scattering process. It also explains the fundamental difficulty of obtaining the valence electron distribution information and the basis of our solution. | ||||
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| Publisher | Place of Publication | Oxford | Editor | ||
| Language | Wos | 000301702400005 | Publication Date | 2011-11-05 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record | |
| Impact Factor | 1.98 | Times cited | Open Access | ||
| Notes | Fwo | Approved |
Most recent IF: 1.98; 2012 IF: 1.876 | ||
| Call Number | UA @ lucian @ c:irua:93634 | Serial | 1553 | ||
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| Author | Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. | ||||
| Title | Model-based electron microscopy : from images toward precise numbers for unknown structure parameters | Type | A1 Journal article | ||
| Year | 2012 | Publication | Micron | Abbreviated Journal | Micron |
| Volume | 43 | Issue | 4 | Pages | 509-515 |
| Keywords | A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | Statistical parameter estimation theory is proposed as a method to quantify electron microscopy images. It aims at obtaining precise and accurate values for the unknown structure parameters including, for example, atomic column positions and types. In this theory, observations are purely considered as data planes, from which structure parameters have to be determined using a parametric model describing the images. The method enables us to measure positions of atomic columns with a precision of the order of a few picometers even though the resolution of the electron microscope is one or two orders of magnitude larger. Moreover, small differences in averaged atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark field scanning transmission electron microscopy images. Finally, it is shown how to optimize the experimental design so as to attain the highest precision. As an example, the optimization of the probe size for nanoparticle radius measurements is considered. It is also shown how to quantitatively balance signal-to-noise ratio and resolution by adjusting the probe size. | ||||
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| Publisher | Place of Publication | Oxford | Editor | ||
| Language | Wos | 000301702400003 | Publication Date | 2011-11-03 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.98 | Times cited | 7 | Open Access | |
| Notes | Fwo | Approved |
Most recent IF: 1.98; 2012 IF: 1.876 | ||
| Call Number | UA @ lucian @ c:irua:94114 | Serial | 2099 | ||
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| Author | Van Aert, S.; den Dekker, A.J.; van Dyck, D. | ||||
| Title | How to optimize the experimental design of quantitative atomic resolution TEM experiments? | Type | A1 Journal article | ||
| Year | 2004 | Publication | Micron | Abbreviated Journal | Micron |
| Volume | 35 | Issue | Pages | 425-429 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000221721000005 | Publication Date | 2004-03-06 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.98 | Times cited | 14 | Open Access | |
| Notes | Approved |
Most recent IF: 1.98; 2004 IF: 1.464 | |||
| Call Number | UA @ lucian @ c:irua:47514 | Serial | 1495 | ||
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| Author | van den Broek, W.; Van Aert, S.; van Dyck, D. | ||||
| Title | Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency | Type | A1 Journal article | ||
| Year | 2012 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 18 | Issue | 2 | Pages | 336-342 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | The charge-coupled devices used in electron microscopy are coated with a scintillating crystal that gives rise to a severe modulation transfer function (MTF). Exact knowledge of the MTF is imperative for a good correspondence between image simulation and experiment. We present a practical method to measure the MTF above the Nyquist frequency from the beam blocker's shadow image. The image processing has been fully automated and the program is made public. The method is successfully tested on three cameras with various beam blocker shapes. | ||||
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| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | 000302084700011 | Publication Date | 2012-02-14 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.891 | Times cited | 15 | Open Access | |
| Notes | Fwo | Approved |
Most recent IF: 1.891; 2012 IF: 2.495 | ||
| Call Number | UA @ lucian @ c:irua:96557 | Serial | 1297 | ||
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| Author | Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. | ||||
| Title | Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy | Type | A1 Journal article | ||
| Year | 2009 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 15 | Issue | S:2 | Pages | 464-465 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | 000208119100230 | Publication Date | 2009-07-27 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.891 | Times cited | 1 | Open Access | |
| Notes | Approved |
Most recent IF: 1.891; 2009 IF: 3.035 | |||
| Call Number | UA @ lucian @ c:irua:96555UA @ admin @ c:irua:96555 | Serial | 178 | ||
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| Author | van Dyck, D.; Van Aert, S.; den Dekker, A.J. | ||||
| Title | Physical limits on atomic resolution | Type | A1 Journal article | ||
| Year | 2004 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 10 | Issue | Pages | 153-157 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | 000188882100022 | Publication Date | 2004-08-11 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.891 | Times cited | 14 | Open Access | |
| Notes | Approved |
Most recent IF: 1.891; 2004 IF: 2.389 | |||
| Call Number | UA @ lucian @ c:irua:47515 | Serial | 2616 | ||
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| Author | Pourbabak, S.; Wang, X.; Van Dyck, D.; Verlinden, B.; Schryvers, D. | ||||
| Title | Ni cluster formation in low temperature annealed Ni50.6Ti49.4 | Type | A1 Journal article | ||
| Year | 2017 | Publication | Functional materials letters | Abbreviated Journal | Funct Mater Lett |
| Volume | 10 | Issue | 10 | Pages | 1740005 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | Various low temperature treatments of Ni50.6Ti49.4 have shown an unexpected effect on the martensitic start temperature. Periodic diffuse intensity distributions in reciprocal space indicate the formation of short pure Ni strings along the <111> directions in the B2 ordered lattice, precursing the formation of Ni4Ti3 precipitates formed at higher annealing temperatures. | ||||
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| Language | Wos | 000395164100006 | Publication Date | 2017-01-10 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1793-6047 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.234 | Times cited | 4 | Open Access | Not_Open_Access |
| Notes | The authors like to thank the Flemish Science Foundation FWO for financial support under project G.0366.15N “Influence of nano- and microstructural features and defects in fine-grained Ni-Ti on the thermal and mechanical reversibility of the martensitic transformation and the shape memory and superelastic behavior”. We are also very grateful to Prof. Dr. Jan Van Humbeeck for initiating this work, for his continuous support and inspiring discussions. | Approved |
Most recent IF: 1.234 | ||
| Call Number | EMAT @ emat @ c:irua:142545 | Serial | 4619 | ||
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| Author | van Dyck, D.; Van Aert, S.; Croitoru, M. | ||||
| Title | Atomic resolution electron tomography: a dream? | Type | A1 Journal article | ||
| Year | 2006 | Publication | International journal of materials research | Abbreviated Journal | Int J Mater Res |
| Volume | 97 | Issue | 7 | Pages | 872-879 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab | ||||
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| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000239916700003 | Publication Date | 2013-12-09 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1862-5282;2195-8556; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 0.681 | Times cited | 6 | Open Access | |
| Notes | Approved |
Most recent IF: 0.681; 2006 IF: NA | |||
| Call Number | UA @ lucian @ c:irua:60965 | Serial | 176 | ||
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